{"id":"https://openalex.org/W4385460825","doi":"https://doi.org/10.1007/s10845-023-02174-5","title":"Digital twin enhanced fault diagnosis reasoning for autoclave","display_name":"Digital twin enhanced fault diagnosis reasoning for autoclave","publication_year":2023,"publication_date":"2023-08-01","ids":{"openalex":"https://openalex.org/W4385460825","doi":"https://doi.org/10.1007/s10845-023-02174-5"},"language":"en","primary_location":{"id":"doi:10.1007/s10845-023-02174-5","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-023-02174-5","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100410462","display_name":"Yucheng Wang","orcid":"https://orcid.org/0000-0002-8679-3851"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yucheng Wang","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, 100191, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, 100191, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072705483","display_name":"Fei Tao","orcid":"https://orcid.org/0000-0002-9020-0633"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Fei Tao","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, 100191, China"],"raw_orcid":"https://orcid.org/0000-0002-9020-0633","affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, 100191, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080410646","display_name":"Ying Zuo","orcid":"https://orcid.org/0000-0002-9067-3932"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ying Zuo","raw_affiliation_strings":["Research Institute for Frontier Science, Beihang University, Beijing, 100191, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institute for Frontier Science, Beihang University, Beijing, 100191, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100437728","display_name":"Meng Zhang","orcid":"https://orcid.org/0000-0002-2253-4025"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Meng Zhang","raw_affiliation_strings":["Department of Automation, Tsinghua University, Beijing, 100084, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Automation, Tsinghua University, Beijing, 100084, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038939124","display_name":"Qinglin Qi","orcid":"https://orcid.org/0000-0002-3247-0440"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qinglin Qi","raw_affiliation_strings":["School of Mechanical Engineering and Automation, Beihang University, Beijing, 100191, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering and Automation, Beihang University, Beijing, 100191, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5072705483"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":3.7509,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.93306106,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":100},"biblio":{"volume":"35","issue":"6","first_page":"2913","last_page":"2928"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10763","display_name":"Digital Transformation in Industry","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10763","display_name":"Digital Transformation in Industry","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9925000071525574,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11741","display_name":"Flexible and Reconfigurable Manufacturing Systems","score":0.9847000241279602,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/autoclave","display_name":"Autoclave","score":0.747240424156189},{"id":"https://openalex.org/keywords/economic-shortage","display_name":"Economic shortage","score":0.6600906252861023},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5699580907821655},{"id":"https://openalex.org/keywords/graph","display_name":"Graph","score":0.5149365067481995},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.41077959537506104},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3968910574913025},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.39009392261505127},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38105762004852295},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3775852620601654},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2270834743976593},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.11415818333625793}],"concepts":[{"id":"https://openalex.org/C43088074","wikidata":"https://www.wikidata.org/wiki/Q188223","display_name":"Autoclave","level":2,"score":0.747240424156189},{"id":"https://openalex.org/C194051981","wikidata":"https://www.wikidata.org/wiki/Q1337691","display_name":"Economic shortage","level":3,"score":0.6600906252861023},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5699580907821655},{"id":"https://openalex.org/C132525143","wikidata":"https://www.wikidata.org/wiki/Q141488","display_name":"Graph","level":2,"score":0.5149365067481995},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.41077959537506104},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3968910574913025},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.39009392261505127},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38105762004852295},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3775852620601654},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2270834743976593},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.11415818333625793},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C2778137410","wikidata":"https://www.wikidata.org/wiki/Q2732820","display_name":"Government (linguistics)","level":2,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10845-023-02174-5","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-023-02174-5","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},{"id":"pmh:oai:RePEc:spr:joinma:v:35:y:2024:i:6:d:10.1007_s10845-023-02174-5","is_oa":false,"landing_page_url":"http://link.springer.com/10.1007/s10845-023-02174-5","pdf_url":null,"source":{"id":"https://openalex.org/S4306401271","display_name":"RePEc: Research Papers in Economics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I77793887","host_organization_name":"Federal Reserve Bank of St. Louis","host_organization_lineage":["https://openalex.org/I77793887"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G7883140909","display_name":null,"funder_award_id":"52105521","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7995114466","display_name":null,"funder_award_id":"52120105008","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1966971847","https://openalex.org/W2003565038","https://openalex.org/W2017082632","https://openalex.org/W2057651329","https://openalex.org/W2069951099","https://openalex.org/W2070633239","https://openalex.org/W2076253963","https://openalex.org/W2119566395","https://openalex.org/W2132029223","https://openalex.org/W2135663228","https://openalex.org/W2192741957","https://openalex.org/W2597150627","https://openalex.org/W2621825541","https://openalex.org/W2736470268","https://openalex.org/W2757110387","https://openalex.org/W2804780212","https://openalex.org/W2910597635","https://openalex.org/W2976301483","https://openalex.org/W2982689699","https://openalex.org/W3033250738","https://openalex.org/W3088763965","https://openalex.org/W3113649798","https://openalex.org/W3179740443","https://openalex.org/W4205913207"],"related_works":["https://openalex.org/W2003960065","https://openalex.org/W2949332331","https://openalex.org/W2086251837","https://openalex.org/W2914199409","https://openalex.org/W2949368882","https://openalex.org/W2950156714","https://openalex.org/W2579473328","https://openalex.org/W4236963956","https://openalex.org/W2509147714","https://openalex.org/W2383699822"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":5},{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":2}],"updated_date":"2026-06-13T06:13:01.061226","created_date":"2025-10-10T00:00:00"}