{"id":"https://openalex.org/W3174670756","doi":"https://doi.org/10.1007/s10845-021-01800-4","title":"Enhanced detection of diverse defects by developing lighting strategies using multiple light sources based on reinforcement learning","display_name":"Enhanced detection of diverse defects by developing lighting strategies using multiple light sources based on reinforcement learning","publication_year":2021,"publication_date":"2021-06-23","ids":{"openalex":"https://openalex.org/W3174670756","doi":"https://doi.org/10.1007/s10845-021-01800-4","mag":"3174670756"},"language":"en","primary_location":{"id":"doi:10.1007/s10845-021-01800-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-021-01800-4","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057522152","display_name":"Chih-Kai Cheng","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Chih-Kai Cheng","raw_affiliation_strings":["Department of Power Mechanical Engineering, National Tsing Hua University, 30013, Hsinchu, Taiwan ROC"],"raw_orcid":"https://orcid.org/0000-0002-7718-0543","affiliations":[{"raw_affiliation_string":"Department of Power Mechanical Engineering, National Tsing Hua University, 30013, Hsinchu, Taiwan ROC","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050803233","display_name":"Hung\u2010Yin Tsai","orcid":"https://orcid.org/0000-0002-0940-7531"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Hung-Yin Tsai","raw_affiliation_strings":["Department of Power Mechanical Engineering, National Tsing Hua University, 30013, Hsinchu, Taiwan ROC"],"raw_orcid":"https://orcid.org/0000-0002-0940-7531","affiliations":[{"raw_affiliation_string":"Department of Power Mechanical Engineering, National Tsing Hua University, 30013, Hsinchu, Taiwan ROC","institution_ids":["https://openalex.org/I25846049"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5057522152"],"corresponding_institution_ids":["https://openalex.org/I25846049"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":1.5114,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.85060805,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"33","issue":"8","first_page":"2357","last_page":"2369"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9858999848365784,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6508831977844238},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5909138321876526},{"id":"https://openalex.org/keywords/reinforcement-learning","display_name":"Reinforcement learning","score":0.585715651512146},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5851809978485107},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.5795149803161621},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.5184506773948669},{"id":"https://openalex.org/keywords/light-source","display_name":"Light source","score":0.5005073547363281},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.47375068068504333},{"id":"https://openalex.org/keywords/automated-x-ray-inspection","display_name":"Automated X-ray inspection","score":0.4436027705669403},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.43668797612190247},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.37996935844421387},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3227083384990692},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.21990829706192017},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.09285366535186768}],"concepts":[{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6508831977844238},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5909138321876526},{"id":"https://openalex.org/C97541855","wikidata":"https://www.wikidata.org/wiki/Q830687","display_name":"Reinforcement learning","level":2,"score":0.585715651512146},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5851809978485107},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.5795149803161621},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.5184506773948669},{"id":"https://openalex.org/C2982854487","wikidata":"https://www.wikidata.org/wiki/Q9128","display_name":"Light source","level":2,"score":0.5005073547363281},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.47375068068504333},{"id":"https://openalex.org/C146920229","wikidata":"https://www.wikidata.org/wiki/Q2278114","display_name":"Automated X-ray inspection","level":4,"score":0.4436027705669403},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.43668797612190247},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.37996935844421387},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3227083384990692},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.21990829706192017},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.09285366535186768},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10845-021-01800-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-021-01800-4","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},{"id":"pmh:oai:RePEc:spr:joinma:v:33:y:2022:i:8:d:10.1007_s10845-021-01800-4","is_oa":false,"landing_page_url":"http://link.springer.com/10.1007/s10845-021-01800-4","pdf_url":null,"source":{"id":"https://openalex.org/S4306401271","display_name":"RePEc: Research Papers in Economics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I77793887","host_organization_name":"Federal Reserve Bank of St. Louis","host_organization_lineage":["https://openalex.org/I77793887"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5199999809265137}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1686810756","https://openalex.org/W1978077397","https://openalex.org/W1985357212","https://openalex.org/W1986587559","https://openalex.org/W2002259470","https://openalex.org/W2004313226","https://openalex.org/W2017957151","https://openalex.org/W2020824195","https://openalex.org/W2032670825","https://openalex.org/W2060379310","https://openalex.org/W2065574234","https://openalex.org/W2070953649","https://openalex.org/W2125527601","https://openalex.org/W2133059825","https://openalex.org/W2145023731","https://openalex.org/W2155669845","https://openalex.org/W2161841011","https://openalex.org/W2163545055","https://openalex.org/W2164230999","https://openalex.org/W2173248099","https://openalex.org/W2215378786","https://openalex.org/W2328269487","https://openalex.org/W2416529854","https://openalex.org/W2460795006","https://openalex.org/W2498167518","https://openalex.org/W2544434085","https://openalex.org/W2566449711","https://openalex.org/W2802484706","https://openalex.org/W4250302639"],"related_works":["https://openalex.org/W2493185854","https://openalex.org/W2090582288","https://openalex.org/W2151450253","https://openalex.org/W617381866","https://openalex.org/W2339456629","https://openalex.org/W1986703546","https://openalex.org/W3150775531","https://openalex.org/W849857824","https://openalex.org/W1965696824","https://openalex.org/W1487436318"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3}],"updated_date":"2026-05-05T08:41:31.759640","created_date":"2025-10-10T00:00:00"}