{"id":"https://openalex.org/W3047760593","doi":"https://doi.org/10.1007/s10845-020-01639-1","title":"A run-to-run controller for a chemical mechanical planarization process using least squares generative adversarial networks","display_name":"A run-to-run controller for a chemical mechanical planarization process using least squares generative adversarial networks","publication_year":2020,"publication_date":"2020-08-07","ids":{"openalex":"https://openalex.org/W3047760593","doi":"https://doi.org/10.1007/s10845-020-01639-1","mag":"3047760593"},"language":"en","primary_location":{"id":"doi:10.1007/s10845-020-01639-1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-020-01639-1","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073511552","display_name":"Sinyoung Kim","orcid":"https://orcid.org/0000-0002-2609-8945"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sinyoung Kim","raw_affiliation_strings":["Department of Industrial Engineering, Yonsei University, Seoul, 03722, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering, Yonsei University, Seoul, 03722, Republic of Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072390875","display_name":"Jaeyeon Jang","orcid":"https://orcid.org/0000-0001-6255-2044"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaeyeon Jang","raw_affiliation_strings":["Department of Industrial Engineering, Yonsei University, Seoul, 03722, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering, Yonsei University, Seoul, 03722, Republic of Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001540138","display_name":"Chang Ouk Kim","orcid":"https://orcid.org/0000-0002-6936-5409"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Chang Ouk Kim","raw_affiliation_strings":["Department of Industrial Engineering, Yonsei University, Seoul, 03722, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0002-6936-5409","affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering, Yonsei University, Seoul, 03722, Republic of Korea","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5001540138"],"corresponding_institution_ids":["https://openalex.org/I193775966"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.8713,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.70717062,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"32","issue":"8","first_page":"2267","last_page":"2280"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10188","display_name":"Advanced machining processes and optimization","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11245","display_name":"Advanced Numerical Analysis Techniques","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/discriminator","display_name":"Discriminator","score":0.8431174755096436},{"id":"https://openalex.org/keywords/chemical-mechanical-planarization","display_name":"Chemical-mechanical planarization","score":0.8189945220947266},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6759204864501953},{"id":"https://openalex.org/keywords/controller","display_name":"Controller (irrigation)","score":0.6521689295768738},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5551314353942871},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.49769046902656555},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.46487191319465637},{"id":"https://openalex.org/keywords/semiconductor-device-fabrication","display_name":"Semiconductor device fabrication","score":0.4385959208011627},{"id":"https://openalex.org/keywords/process-control","display_name":"Process control","score":0.4297757148742676},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.39022621512413025},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.3896758258342743},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3806757628917694},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1975732445716858},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.18543916940689087},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.09513282775878906},{"id":"https://openalex.org/keywords/polishing","display_name":"Polishing","score":0.08953931927680969}],"concepts":[{"id":"https://openalex.org/C2779803651","wikidata":"https://www.wikidata.org/wiki/Q5282088","display_name":"Discriminator","level":3,"score":0.8431174755096436},{"id":"https://openalex.org/C180088628","wikidata":"https://www.wikidata.org/wiki/Q1069404","display_name":"Chemical-mechanical planarization","level":3,"score":0.8189945220947266},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6759204864501953},{"id":"https://openalex.org/C203479927","wikidata":"https://www.wikidata.org/wiki/Q5165939","display_name":"Controller (irrigation)","level":2,"score":0.6521689295768738},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5551314353942871},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.49769046902656555},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.46487191319465637},{"id":"https://openalex.org/C66018809","wikidata":"https://www.wikidata.org/wiki/Q1570432","display_name":"Semiconductor device fabrication","level":3,"score":0.4385959208011627},{"id":"https://openalex.org/C155386361","wikidata":"https://www.wikidata.org/wiki/Q1649571","display_name":"Process control","level":3,"score":0.4297757148742676},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.39022621512413025},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3896758258342743},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3806757628917694},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1975732445716858},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.18543916940689087},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.09513282775878906},{"id":"https://openalex.org/C138113353","wikidata":"https://www.wikidata.org/wiki/Q611639","display_name":"Polishing","level":2,"score":0.08953931927680969},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C6557445","wikidata":"https://www.wikidata.org/wiki/Q173113","display_name":"Agronomy","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10845-020-01639-1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-020-01639-1","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},{"id":"pmh:oai:RePEc:spr:joinma:v:32:y:2021:i:8:d:10.1007_s10845-020-01639-1","is_oa":false,"landing_page_url":"http://link.springer.com/10.1007/s10845-020-01639-1","pdf_url":null,"source":{"id":"https://openalex.org/S4306401271","display_name":"RePEc: Research Papers in Economics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I77793887","host_organization_name":"Federal Reserve Bank of St. Louis","host_organization_lineage":["https://openalex.org/I77793887"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Reduced inequalities","score":0.699999988079071,"id":"https://metadata.un.org/sdg/10"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":47,"referenced_works":["https://openalex.org/W1549818157","https://openalex.org/W1591600398","https://openalex.org/W1710476689","https://openalex.org/W1964810584","https://openalex.org/W2021909223","https://openalex.org/W2037377750","https://openalex.org/W2039528405","https://openalex.org/W2064675550","https://openalex.org/W2068574400","https://openalex.org/W2072859713","https://openalex.org/W2073433607","https://openalex.org/W2092826444","https://openalex.org/W2097998348","https://openalex.org/W2106485576","https://openalex.org/W2110623178","https://openalex.org/W2115540908","https://openalex.org/W2116426474","https://openalex.org/W2125425624","https://openalex.org/W2133416631","https://openalex.org/W2138087869","https://openalex.org/W2139430280","https://openalex.org/W2143757128","https://openalex.org/W2147679591","https://openalex.org/W2147973445","https://openalex.org/W2170909262","https://openalex.org/W2326925005","https://openalex.org/W2401537403","https://openalex.org/W2554314924","https://openalex.org/W2577946330","https://openalex.org/W2593414223","https://openalex.org/W2606754133","https://openalex.org/W2618530766","https://openalex.org/W2765318358","https://openalex.org/W2808993481","https://openalex.org/W2810518847","https://openalex.org/W2884425876","https://openalex.org/W2890610157","https://openalex.org/W2909272782","https://openalex.org/W2913854632","https://openalex.org/W2919115771","https://openalex.org/W2950182411","https://openalex.org/W2963420272","https://openalex.org/W3016981641","https://openalex.org/W3125071194","https://openalex.org/W6637568146","https://openalex.org/W6674385629","https://openalex.org/W6729767818"],"related_works":["https://openalex.org/W2953246223","https://openalex.org/W4293320219","https://openalex.org/W3110074278","https://openalex.org/W4283584549","https://openalex.org/W2618858825","https://openalex.org/W2554314924","https://openalex.org/W2998859928","https://openalex.org/W3156863413","https://openalex.org/W4381885966","https://openalex.org/W4288256692"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":5}],"updated_date":"2026-06-19T15:47:20.252518","created_date":"2025-10-10T00:00:00"}
