{"id":"https://openalex.org/W3041151876","doi":"https://doi.org/10.1007/s10845-020-01615-9","title":"Error analysis based on error transfer theory and compensation strategy for LED chip visual localization systems","display_name":"Error analysis based on error transfer theory and compensation strategy for LED chip visual localization systems","publication_year":2020,"publication_date":"2020-07-07","ids":{"openalex":"https://openalex.org/W3041151876","doi":"https://doi.org/10.1007/s10845-020-01615-9","mag":"3041151876"},"language":"en","primary_location":{"id":"doi:10.1007/s10845-020-01615-9","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-020-01615-9","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101502262","display_name":"Diyi Zhou","orcid":"https://orcid.org/0000-0002-9955-4614"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Diyi Zhou","raw_affiliation_strings":["Digital Manufacturing Equipment and Technology Key National Laboratories, Huazhong University of Science and Technology, Wuhan, 430074, Hubei, China"],"affiliations":[{"raw_affiliation_string":"Digital Manufacturing Equipment and Technology Key National Laboratories, Huazhong University of Science and Technology, Wuhan, 430074, Hubei, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110486254","display_name":"Shihua Gong","orcid":null},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shihua Gong","raw_affiliation_strings":["Digital Manufacturing Equipment and Technology Key National Laboratories, Huazhong University of Science and Technology, Wuhan, 430074, Hubei, China"],"affiliations":[{"raw_affiliation_string":"Digital Manufacturing Equipment and Technology Key National Laboratories, Huazhong University of Science and Technology, Wuhan, 430074, Hubei, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101850408","display_name":"Ziyue Wang","orcid":"https://orcid.org/0000-0002-6080-1040"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ziyue Wang","raw_affiliation_strings":["Digital Manufacturing Equipment and Technology Key National Laboratories, Huazhong University of Science and Technology, Wuhan, 430074, Hubei, China"],"affiliations":[{"raw_affiliation_string":"Digital Manufacturing Equipment and Technology Key National Laboratories, Huazhong University of Science and Technology, Wuhan, 430074, Hubei, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101722451","display_name":"Delong Li","orcid":"https://orcid.org/0009-0005-2765-9555"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Delong Li","raw_affiliation_strings":["Digital Manufacturing Equipment and Technology Key National Laboratories, Huazhong University of Science and Technology, Wuhan, 430074, Hubei, China"],"affiliations":[{"raw_affiliation_string":"Digital Manufacturing Equipment and Technology Key National Laboratories, Huazhong University of Science and Technology, Wuhan, 430074, Hubei, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5071512729","display_name":"Huaiqing Lu","orcid":null},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huaiqing Lu","raw_affiliation_strings":["Digital Manufacturing Equipment and Technology Key National Laboratories, Huazhong University of Science and Technology, Wuhan, 430074, Hubei, China"],"affiliations":[{"raw_affiliation_string":"Digital Manufacturing Equipment and Technology Key National Laboratories, Huazhong University of Science and Technology, Wuhan, 430074, Hubei, China","institution_ids":["https://openalex.org/I47720641"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5101502262"],"corresponding_institution_ids":["https://openalex.org/I47720641"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.4914,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.65790217,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"32","issue":"5","first_page":"1345","last_page":"1359"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.8123040795326233},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6427093148231506},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5356864929199219},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4498887062072754},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.4482670724391937},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.34077009558677673},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.056357622146606445}],"concepts":[{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.8123040795326233},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6427093148231506},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5356864929199219},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4498887062072754},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.4482670724391937},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.34077009558677673},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.056357622146606445},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10845-020-01615-9","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-020-01615-9","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},{"id":"pmh:oai:RePEc:spr:joinma:v:32:y:2021:i:5:d:10.1007_s10845-020-01615-9","is_oa":false,"landing_page_url":"http://link.springer.com/10.1007/s10845-020-01615-9","pdf_url":null,"source":{"id":"https://openalex.org/S4306401271","display_name":"RePEc: Research Papers in Economics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I77793887","host_organization_name":"Federal Reserve Bank of St. Louis","host_organization_lineage":["https://openalex.org/I77793887"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.4099999964237213}],"awards":[{"id":"https://openalex.org/G3210080035","display_name":null,"funder_award_id":"No. 2016YFC0105306","funder_id":"https://openalex.org/F4320336026","funder_display_name":"National Key Research and Development Program of China Stem Cell and Translational Research"}],"funders":[{"id":"https://openalex.org/F4320336026","display_name":"National Key Research and Development Program of China Stem Cell and Translational Research","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W115838139","https://openalex.org/W1909125462","https://openalex.org/W1983033812","https://openalex.org/W2015207440","https://openalex.org/W2021624271","https://openalex.org/W2036583529","https://openalex.org/W2046481533","https://openalex.org/W2050729367","https://openalex.org/W2054814429","https://openalex.org/W2064476950","https://openalex.org/W2082277001","https://openalex.org/W2167667767","https://openalex.org/W2167791778","https://openalex.org/W2324566014","https://openalex.org/W2546840693","https://openalex.org/W2556383233","https://openalex.org/W2592758588","https://openalex.org/W2605387322","https://openalex.org/W2794550100","https://openalex.org/W2795823254","https://openalex.org/W2902058903","https://openalex.org/W2918180022","https://openalex.org/W4205530313"],"related_works":["https://openalex.org/W2051487156","https://openalex.org/W2073681303","https://openalex.org/W2379084545","https://openalex.org/W2544423928","https://openalex.org/W2052122378","https://openalex.org/W2053286651","https://openalex.org/W2181743346","https://openalex.org/W2187401768","https://openalex.org/W2181413294","https://openalex.org/W2989452537"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}