{"id":"https://openalex.org/W2908845134","doi":"https://doi.org/10.1007/s10845-018-01462-9","title":"Predictive analytics methodology for smart qualification testing of electronic components","display_name":"Predictive analytics methodology for smart qualification testing of electronic components","publication_year":2019,"publication_date":"2019-01-18","ids":{"openalex":"https://openalex.org/W2908845134","doi":"https://doi.org/10.1007/s10845-018-01462-9","mag":"2908845134"},"language":"en","primary_location":{"id":"doi:10.1007/s10845-018-01462-9","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10845-018-01462-9","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10845-018-01462-9.pdf","source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://link.springer.com/content/pdf/10.1007/s10845-018-01462-9.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5020951904","display_name":"Stoyan Stoyanov","orcid":"https://orcid.org/0000-0001-6091-1226"},"institutions":[{"id":"https://openalex.org/I55060895","display_name":"University of Greenwich","ror":"https://ror.org/00bmj0a71","country_code":"GB","type":"education","lineage":["https://openalex.org/I55060895"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Stoyan Stoyanov","raw_affiliation_strings":["Computational Mechanics and Reliability Group, School of Computing and Mathematical Sciences, Faculty of Liberal Arts and Sciences, University of Greenwich, Park Row, Greenwich, London, SE10 9LS, UK"],"raw_orcid":"https://orcid.org/0000-0001-6091-1226","affiliations":[{"raw_affiliation_string":"Computational Mechanics and Reliability Group, School of Computing and Mathematical Sciences, Faculty of Liberal Arts and Sciences, University of Greenwich, Park Row, Greenwich, London, SE10 9LS, UK","institution_ids":["https://openalex.org/I55060895"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009600891","display_name":"Mominul Ahsan","orcid":"https://orcid.org/0000-0002-7300-506X"},"institutions":[{"id":"https://openalex.org/I55060895","display_name":"University of Greenwich","ror":"https://ror.org/00bmj0a71","country_code":"GB","type":"education","lineage":["https://openalex.org/I55060895"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Mominul Ahsan","raw_affiliation_strings":["Computational Mechanics and Reliability Group, School of Computing and Mathematical Sciences, Faculty of Liberal Arts and Sciences, University of Greenwich, Park Row, Greenwich, London, SE10 9LS, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computational Mechanics and Reliability Group, School of Computing and Mathematical Sciences, Faculty of Liberal Arts and Sciences, University of Greenwich, Park Row, Greenwich, London, SE10 9LS, UK","institution_ids":["https://openalex.org/I55060895"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060460052","display_name":"C. Bailey","orcid":"https://orcid.org/0000-0002-9438-3879"},"institutions":[{"id":"https://openalex.org/I55060895","display_name":"University of Greenwich","ror":"https://ror.org/00bmj0a71","country_code":"GB","type":"education","lineage":["https://openalex.org/I55060895"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Chris Bailey","raw_affiliation_strings":["Computational Mechanics and Reliability Group, School of Computing and Mathematical Sciences, Faculty of Liberal Arts and Sciences, University of Greenwich, Park Row, Greenwich, London, SE10 9LS, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computational Mechanics and Reliability Group, School of Computing and Mathematical Sciences, Faculty of Liberal Arts and Sciences, University of Greenwich, Park Row, Greenwich, London, SE10 9LS, UK","institution_ids":["https://openalex.org/I55060895"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063890022","display_name":"Tracy Wotherspoon","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tracy Wotherspoon","raw_affiliation_strings":["Microchip Technology Inc., Caldicot, Monmouthshire, NP26 5YW, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microchip Technology Inc., Caldicot, Monmouthshire, NP26 5YW, UK","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023684749","display_name":"Craig Hunt","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Craig Hunt","raw_affiliation_strings":["Microchip Technology Inc., Caldicot, Monmouthshire, NP26 5YW, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microchip Technology Inc., Caldicot, Monmouthshire, NP26 5YW, UK","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5020951904"],"corresponding_institution_ids":["https://openalex.org/I55060895"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":{"value":2390,"currency":"EUR","value_usd":2990},"fwci":3.3145,"has_fulltext":true,"cited_by_count":19,"citation_normalized_percentile":{"value":0.92839514,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"30","issue":"3","first_page":"1497","last_page":"1514"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9757999777793884,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9660000205039978,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/prognostics","display_name":"Prognostics","score":0.8588908910751343},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6666139960289001},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.6502100229263306},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.5379142761230469},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.5023186206817627},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5003616809844971},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.49096372723579407},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44553402066230774},{"id":"https://openalex.org/keywords/test-plan","display_name":"Test plan","score":0.4337655007839203},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.42574000358581543},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.13692113757133484}],"concepts":[{"id":"https://openalex.org/C129364497","wikidata":"https://www.wikidata.org/wiki/Q3042561","display_name":"Prognostics","level":2,"score":0.8588908910751343},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6666139960289001},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.6502100229263306},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.5379142761230469},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.5023186206817627},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5003616809844971},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.49096372723579407},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44553402066230774},{"id":"https://openalex.org/C12148698","wikidata":"https://www.wikidata.org/wiki/Q364651","display_name":"Test plan","level":3,"score":0.4337655007839203},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.42574000358581543},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.13692113757133484},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0},{"id":"https://openalex.org/C2776746162","wikidata":"https://www.wikidata.org/wiki/Q4508","display_name":"Navy","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.1007/s10845-018-01462-9","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10845-018-01462-9","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10845-018-01462-9.pdf","source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},{"id":"pmh:oai:e-space.mmu.ac.uk:624867","is_oa":false,"landing_page_url":"https://e-space.mmu.ac.uk/view/authors/ca37df1567caca2d58185af05ac3b983.html>,","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"PeerReviewed"},{"id":"pmh:oai:gala.gre.ac.uk:22809","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4306401244","display_name":"Greenwich Academic Literature Archive (University of Greenwich)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I55060895","host_organization_name":"University of Greenwich","host_organization_lineage":["https://openalex.org/I55060895"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"Article"},{"id":"pmh:oai:RePEc:spr:joinma:v:30:y:2019:i:3:d:10.1007_s10845-018-01462-9","is_oa":false,"landing_page_url":"http://link.springer.com/10.1007/s10845-018-01462-9","pdf_url":null,"source":{"id":"https://openalex.org/S4306401271","display_name":"RePEc: Research Papers in Economics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I77793887","host_organization_name":"Federal Reserve Bank of St. Louis","host_organization_lineage":["https://openalex.org/I77793887"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"},{"id":"pmh:oai:figshare.com:article/32506983","is_oa":true,"landing_page_url":"https://figshare.com/articles/journal_contribution/Predictive_analytics_methodology_for_smart_qualification_testing_of_electronic_components/32506983","pdf_url":null,"source":{"id":"https://openalex.org/S4377196282","display_name":"Figshare","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210132348","host_organization_name":"Figshare (United Kingdom)","host_organization_lineage":["https://openalex.org/I4210132348"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Journal contribution"}],"best_oa_location":{"id":"doi:10.1007/s10845-018-01462-9","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10845-018-01462-9","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10845-018-01462-9.pdf","source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.6499999761581421,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320311712","display_name":"University of Greenwich","ror":"https://ror.org/00bmj0a71"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2908845134.pdf","grobid_xml":"https://content.openalex.org/works/W2908845134.grobid-xml"},"referenced_works_count":34,"referenced_works":["https://openalex.org/W1480376833","https://openalex.org/W1526678144","https://openalex.org/W1542438852","https://openalex.org/W1563088657","https://openalex.org/W1943383135","https://openalex.org/W1965009340","https://openalex.org/W1966218581","https://openalex.org/W1991691583","https://openalex.org/W2003352944","https://openalex.org/W2021834189","https://openalex.org/W2037104952","https://openalex.org/W2055372195","https://openalex.org/W2055653070","https://openalex.org/W2069262928","https://openalex.org/W2071909685","https://openalex.org/W2075790718","https://openalex.org/W2089002200","https://openalex.org/W2114446003","https://openalex.org/W2115694019","https://openalex.org/W2133973797","https://openalex.org/W2156909104","https://openalex.org/W2293490940","https://openalex.org/W2343620726","https://openalex.org/W2491237360","https://openalex.org/W2498483907","https://openalex.org/W2550035567","https://openalex.org/W2755073139","https://openalex.org/W2805890365","https://openalex.org/W4256613398","https://openalex.org/W4298304654","https://openalex.org/W6628633436","https://openalex.org/W6640188369","https://openalex.org/W6676949900","https://openalex.org/W6806001243"],"related_works":["https://openalex.org/W2086816605","https://openalex.org/W2156441773","https://openalex.org/W2150917855","https://openalex.org/W2127436184","https://openalex.org/W2059424008","https://openalex.org/W2577794367","https://openalex.org/W2365589843","https://openalex.org/W3142708897","https://openalex.org/W2734564978","https://openalex.org/W3002053962"],"abstract_inverted_index":{"In":[0],"electronics":[1,27,82,373],"manufacturing,":[2],"the":[3,26,42,57,81,89,102,112,115,127,140,147,163,173,178,187,209,217,227,244,251,254,258,284,287,310,325,331,345,349,372,392],"required":[4],"quality":[5],"of":[6,46,78,111,172,180,189,206,219,246,253,304,312,348,362,387,411],"electronic":[7,11,320],"modules":[8],"(e.g.":[9],"packaged":[10],"devices)":[12],"are":[13,291,322,369],"evaluated":[14],"through":[15],"qualification":[16,32,52,116,211,229,357,412],"testing":[17,33,79,358],"using":[18,53,193,261],"standards":[19],"and":[20,36,44,68,145,160,176,329,339,359,365,384,405],"user-defined":[21],"requirements.":[22],"The":[23,74,94,182,241,375],"challenge":[24],"for":[25,50,65,231,257,318,381],"industry":[28],"is":[29,34,92,197,249,336],"that":[30,104,167,286],"product":[31],"time-consuming":[35],"costly.":[37],"This":[38,222,334],"paper":[39,326],"focuses":[40],"on":[41,88,135,309],"development":[43,188],"demonstration":[45],"a":[47,151,203,232,401],"novel":[48,338],"approach":[49,149],"smarter":[51,402],"test":[54,130,165,316,363,389,413],"data":[55,66,96,141,166,200,215,255,279,317,377],"from":[56,202,208,263,280],"production":[58,164,315,388],"line":[59],"along":[60],"with":[61,146,278,298,301,408],"integrated":[62,376],"computational":[63,332],"techniques":[64,196],"mining/analytics":[67],"data-driven":[69,190],"forecasting":[70],"(i.e.":[71],"prognostics)":[72],"modelling.":[73],"most":[75],"common":[76],"type":[77],"in":[80,114,129,142,162,216,243,250,324,371,400],"industry\u2014sequentially":[83],"run":[84],"electrical":[85],"multi-parameter":[86],"tests":[87,103,207,264,281],"Device-under-Test":[90],"(DUT),":[91],"considered.":[93],"proposed":[95,148],"mining":[97],"(DM)":[98],"framework":[99],"can":[100,168,224],"identify":[101],"have":[105,294],"strong":[106],"correlation":[107],"to":[108,119,125,198,266,283,293,327,344,356,394],"pending":[109,120,267],"failure":[110],"device":[113],"(tests":[117],"sensitive":[118,265,282],"failure)":[121],"as":[122,124,213],"well":[123],"evaluate":[126],"similarity":[128],"measurements,":[131],"thus":[132],"generating":[133],"knowledge":[134,159,347,406],"potentially":[136],"redundant":[137],"tests.":[138,181,240,305],"Mining":[139],"this":[143],"context":[144,245],"represents":[150],"major":[152],"new":[153],"contribution":[154],"because":[155,341],"it":[156],"uncovers":[157],"embedded":[158],"information":[161,404],"enable":[169],"intelligent":[170,183],"optimisation":[171,386],"tests\u2019":[174],"sequence":[175],"reduce":[177],"number":[179,205],"manufacturing":[184],"concept":[185],"behind":[186],"prognostics":[191],"models":[192,276,299],"machine":[194,247],"learning":[195,248],"use":[199,311],"only":[201],"small":[204],"full":[210],"specification":[212],"training":[214,259],"process":[218],"model":[220,223],"construction.":[221],"then":[225],"forecast":[226],"overall":[228],"outcome":[230,285],"DUT\u2014Pass":[233],"or":[234],"Fail\u2014without":[235],"performing":[236],"all":[237],"other":[238,302],"remaining":[239],"novelty":[242],"selection":[252],"features":[256],"dataset":[260],"results":[262],"failure.":[268],"Support":[269],"Vector":[270],"Machine":[271],"(SVM)":[272],"binary":[273],"classifiers":[274],"SVM":[275],"built":[277],"module":[288,321],"will":[289],"fail":[290],"shown":[292],"superior":[295],"performance":[296],"compared":[297],"trained":[300],"datasets":[303,410],"Case":[306],"studies":[307],"based":[308],"real":[313],"industrial":[314],"an":[319],"included":[323],"demonstrate":[328],"validate":[330],"approach.":[333],"work":[335],"both":[337,382],"original":[340],"at":[342],"present,":[343],"best":[346],"authors,":[350],"such":[351],"predictive":[352],"analytics":[353],"methodology":[354],"applied":[355],"providing":[360],"benefits":[361],"time":[364],"hence":[366],"cost":[367],"reduction":[368],"non-existent":[370],"industry.":[374],"analytics-prognostics":[378],"approach,":[379],"deployable":[380],"off-line":[383],"in-line":[385],"procedures,":[390],"has":[391],"potential":[393],"transform":[395],"current":[396],"practices":[397],"by":[398],"exploiting":[399],"way":[403],"available":[407],"large":[409],"data.":[414]},"counts_by_year":[{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":1}],"updated_date":"2026-06-05T09:01:59.212387","created_date":"2025-10-10T00:00:00"}