{"id":"https://openalex.org/W2005006676","doi":"https://doi.org/10.1007/s10845-014-0926-3","title":"Remaining useful life prediction using prognostic methodology based on logical analysis of data and Kaplan\u2013Meier estimation","display_name":"Remaining useful life prediction using prognostic methodology based on logical analysis of data and Kaplan\u2013Meier estimation","publication_year":2014,"publication_date":"2014-07-28","ids":{"openalex":"https://openalex.org/W2005006676","doi":"https://doi.org/10.1007/s10845-014-0926-3","mag":"2005006676"},"language":"en","primary_location":{"id":"doi:10.1007/s10845-014-0926-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-014-0926-3","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015695822","display_name":"Ahmed Ragab","orcid":"https://orcid.org/0000-0002-0075-203X"},"institutions":[{"id":"https://openalex.org/I45683168","display_name":"Polytechnique Montr\u00e9al","ror":"https://ror.org/05f8d4e86","country_code":"CA","type":"education","lineage":["https://openalex.org/I45683168"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Ahmed Ragab","raw_affiliation_strings":["Industrial Engineering and Applied Mathematics Department, \u00c9cole Polytechnique de Montr\u00e9al, Montr\u00e9al, Canada","Industrial Engineering and Applied Mathematics Department, \u00c9cole Polytechnique de Montr\u00e9al, Montr\u00e9al, Canada#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Industrial Engineering and Applied Mathematics Department, \u00c9cole Polytechnique de Montr\u00e9al, Montr\u00e9al, Canada","institution_ids":["https://openalex.org/I45683168"]},{"raw_affiliation_string":"Industrial Engineering and Applied Mathematics Department, \u00c9cole Polytechnique de Montr\u00e9al, Montr\u00e9al, Canada#TAB#","institution_ids":["https://openalex.org/I45683168"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062903114","display_name":"Mohamed-Salah Ouali","orcid":"https://orcid.org/0000-0002-2152-8045"},"institutions":[{"id":"https://openalex.org/I45683168","display_name":"Polytechnique Montr\u00e9al","ror":"https://ror.org/05f8d4e86","country_code":"CA","type":"education","lineage":["https://openalex.org/I45683168"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Mohamed-Salah Ouali","raw_affiliation_strings":["Industrial Engineering and Applied Mathematics Department, \u00c9cole Polytechnique de Montr\u00e9al, Montr\u00e9al, Canada","Industrial Engineering and Applied Mathematics Department, \u00c9cole Polytechnique de Montr\u00e9al, Montr\u00e9al, Canada#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Industrial Engineering and Applied Mathematics Department, \u00c9cole Polytechnique de Montr\u00e9al, Montr\u00e9al, Canada","institution_ids":["https://openalex.org/I45683168"]},{"raw_affiliation_string":"Industrial Engineering and Applied Mathematics Department, \u00c9cole Polytechnique de Montr\u00e9al, Montr\u00e9al, Canada#TAB#","institution_ids":["https://openalex.org/I45683168"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019315257","display_name":"Soumaya Yacout","orcid":"https://orcid.org/0000-0002-0983-5114"},"institutions":[{"id":"https://openalex.org/I45683168","display_name":"Polytechnique Montr\u00e9al","ror":"https://ror.org/05f8d4e86","country_code":"CA","type":"education","lineage":["https://openalex.org/I45683168"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Soumaya Yacout","raw_affiliation_strings":["Industrial Engineering and Applied Mathematics Department, \u00c9cole Polytechnique de Montr\u00e9al, Montr\u00e9al, Canada","Industrial Engineering and Applied Mathematics Department, \u00c9cole Polytechnique de Montr\u00e9al, Montr\u00e9al, Canada#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Industrial Engineering and Applied Mathematics Department, \u00c9cole Polytechnique de Montr\u00e9al, Montr\u00e9al, Canada","institution_ids":["https://openalex.org/I45683168"]},{"raw_affiliation_string":"Industrial Engineering and Applied Mathematics Department, \u00c9cole Polytechnique de Montr\u00e9al, Montr\u00e9al, Canada#TAB#","institution_ids":["https://openalex.org/I45683168"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006202208","display_name":"Hany Osman","orcid":"https://orcid.org/0000-0001-7327-6073"},"institutions":[{"id":"https://openalex.org/I45683168","display_name":"Polytechnique Montr\u00e9al","ror":"https://ror.org/05f8d4e86","country_code":"CA","type":"education","lineage":["https://openalex.org/I45683168"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Hany Osman","raw_affiliation_strings":["Industrial Engineering and Applied Mathematics Department, \u00c9cole Polytechnique de Montr\u00e9al, Montr\u00e9al, Canada","Industrial Engineering and Applied Mathematics Department, \u00c9cole Polytechnique de Montr\u00e9al, Montr\u00e9al, Canada#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Industrial Engineering and Applied Mathematics Department, \u00c9cole Polytechnique de Montr\u00e9al, Montr\u00e9al, Canada","institution_ids":["https://openalex.org/I45683168"]},{"raw_affiliation_string":"Industrial Engineering and Applied Mathematics Department, \u00c9cole Polytechnique de Montr\u00e9al, Montr\u00e9al, Canada#TAB#","institution_ids":["https://openalex.org/I45683168"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5019315257"],"corresponding_institution_ids":["https://openalex.org/I45683168"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":7.3495,"has_fulltext":false,"cited_by_count":58,"citation_normalized_percentile":{"value":0.96373984,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"27","issue":"5","first_page":"943","last_page":"958"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9873999953269958,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/prognostics","display_name":"Prognostics","score":0.8969096541404724},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6404500603675842},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6107189655303955},{"id":"https://openalex.org/keywords/thresholding","display_name":"Thresholding","score":0.5604655146598816},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4844984710216522},{"id":"https://openalex.org/keywords/hazard","display_name":"Hazard","score":0.4826367497444153},{"id":"https://openalex.org/keywords/proportional-hazards-model","display_name":"Proportional hazards model","score":0.4529319405555725},{"id":"https://openalex.org/keywords/estimation","display_name":"Estimation","score":0.4470568895339966},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44009464979171753},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3883930444717407},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.3826281726360321},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.24799278378486633},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2035079002380371}],"concepts":[{"id":"https://openalex.org/C129364497","wikidata":"https://www.wikidata.org/wiki/Q3042561","display_name":"Prognostics","level":2,"score":0.8969096541404724},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6404500603675842},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6107189655303955},{"id":"https://openalex.org/C191178318","wikidata":"https://www.wikidata.org/wiki/Q2256906","display_name":"Thresholding","level":3,"score":0.5604655146598816},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4844984710216522},{"id":"https://openalex.org/C49261128","wikidata":"https://www.wikidata.org/wiki/Q1132455","display_name":"Hazard","level":2,"score":0.4826367497444153},{"id":"https://openalex.org/C50382708","wikidata":"https://www.wikidata.org/wiki/Q223218","display_name":"Proportional hazards model","level":2,"score":0.4529319405555725},{"id":"https://openalex.org/C96250715","wikidata":"https://www.wikidata.org/wiki/Q965330","display_name":"Estimation","level":2,"score":0.4470568895339966},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44009464979171753},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3883930444717407},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.3826281726360321},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.24799278378486633},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2035079002380371},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1007/s10845-014-0926-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-014-0926-3","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},{"id":"pmh:oai:RePEc:spr:joinma:v:27:y:2016:i:5:d:10.1007_s10845-014-0926-3","is_oa":false,"landing_page_url":"http://link.springer.com/10.1007/s10845-014-0926-3","pdf_url":null,"source":{"id":"https://openalex.org/S4306401271","display_name":"RePEc: Research Papers in Economics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I77793887","host_organization_name":"Federal Reserve Bank of St. Louis","host_organization_lineage":["https://openalex.org/I77793887"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"},{"id":"pmh:oai:publications.polymtl.ca:11705","is_oa":false,"landing_page_url":"https://publications.polymtl.ca/11705/","pdf_url":null,"source":{"id":"https://openalex.org/S4306401013","display_name":"PolyPublie (\u00c9cole Polytechnique de Montr\u00e9al)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I45683168","host_organization_name":"Polytechnique Montr\u00e9al","host_organization_lineage":["https://openalex.org/I45683168"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Article de revue"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/12","display_name":"Responsible consumption and production","score":0.5199999809265137}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":47,"referenced_works":["https://openalex.org/W108650620","https://openalex.org/W179935622","https://openalex.org/W591732527","https://openalex.org/W1480376833","https://openalex.org/W1570448133","https://openalex.org/W1584919862","https://openalex.org/W1972182967","https://openalex.org/W1974528911","https://openalex.org/W1987032634","https://openalex.org/W1993266708","https://openalex.org/W2001129496","https://openalex.org/W2001731263","https://openalex.org/W2012374927","https://openalex.org/W2019732711","https://openalex.org/W2022889972","https://openalex.org/W2025387494","https://openalex.org/W2029709134","https://openalex.org/W2034341843","https://openalex.org/W2037492531","https://openalex.org/W2043681863","https://openalex.org/W2045186954","https://openalex.org/W2048299710","https://openalex.org/W2051383181","https://openalex.org/W2061267743","https://openalex.org/W2067678449","https://openalex.org/W2067778413","https://openalex.org/W2071016485","https://openalex.org/W2084709039","https://openalex.org/W2100110464","https://openalex.org/W2107074288","https://openalex.org/W2108322875","https://openalex.org/W2120841219","https://openalex.org/W2132792344","https://openalex.org/W2136774956","https://openalex.org/W2160842550","https://openalex.org/W2334123193","https://openalex.org/W2799061466","https://openalex.org/W2902260176","https://openalex.org/W2966207845","https://openalex.org/W4239587501","https://openalex.org/W4246839970","https://openalex.org/W4249490807","https://openalex.org/W4285719527","https://openalex.org/W4301376768","https://openalex.org/W6604463325","https://openalex.org/W6736743828","https://openalex.org/W7014191107"],"related_works":["https://openalex.org/W2310476526","https://openalex.org/W3213192587","https://openalex.org/W2144291498","https://openalex.org/W2535730979","https://openalex.org/W2030958945","https://openalex.org/W2370073012","https://openalex.org/W4386567722","https://openalex.org/W2168646784","https://openalex.org/W2466930957","https://openalex.org/W153028072"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":9},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":12},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":8},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}