{"id":"https://openalex.org/W2021624271","doi":"https://doi.org/10.1007/s10845-013-0866-3","title":"Intelligent maintenance prediction system for LED wafer testing machine","display_name":"Intelligent maintenance prediction system for LED wafer testing machine","publication_year":2014,"publication_date":"2014-01-09","ids":{"openalex":"https://openalex.org/W2021624271","doi":"https://doi.org/10.1007/s10845-013-0866-3","mag":"2021624271"},"language":"en","primary_location":{"id":"doi:10.1007/s10845-013-0866-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-013-0866-3","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067880192","display_name":"Chien\u2010Chang Hsu","orcid":"https://orcid.org/0000-0002-1714-9122"},"institutions":[{"id":"https://openalex.org/I114150738","display_name":"Fu Jen Catholic University","ror":"https://ror.org/04je98850","country_code":"TW","type":"education","lineage":["https://openalex.org/I114150738"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Chien-Chang Hsu","raw_affiliation_strings":["Department of Computer Science and Information Engineering, Fu-Jen Catholic University, 510 Chung Cheng Rd., Hsinchuang Dist., New Taipei City , 242, Taiwan, ROC","Department of Computer Science and Information Engineering, Fu-Jen Catholic University, New Taipei City , Taiwan, ROC 242#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Information Engineering, Fu-Jen Catholic University, 510 Chung Cheng Rd., Hsinchuang Dist., New Taipei City , 242, Taiwan, ROC","institution_ids":["https://openalex.org/I114150738"]},{"raw_affiliation_string":"Department of Computer Science and Information Engineering, Fu-Jen Catholic University, New Taipei City , Taiwan, ROC 242#TAB#","institution_ids":["https://openalex.org/I114150738"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009121278","display_name":"Minsheng Chen","orcid":"https://orcid.org/0000-0002-8271-268X"},"institutions":[{"id":"https://openalex.org/I114150738","display_name":"Fu Jen Catholic University","ror":"https://ror.org/04je98850","country_code":"TW","type":"education","lineage":["https://openalex.org/I114150738"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Min-Sheng Chen","raw_affiliation_strings":["Department of Computer Science and Information Engineering, Fu-Jen Catholic University, 510 Chung Cheng Rd., Hsinchuang Dist., New Taipei City , 242, Taiwan, ROC","Department of Computer Science and Information Engineering, Fu-Jen Catholic University, New Taipei City , Taiwan, ROC 242#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Information Engineering, Fu-Jen Catholic University, 510 Chung Cheng Rd., Hsinchuang Dist., New Taipei City , 242, Taiwan, ROC","institution_ids":["https://openalex.org/I114150738"]},{"raw_affiliation_string":"Department of Computer Science and Information Engineering, Fu-Jen Catholic University, New Taipei City , Taiwan, ROC 242#TAB#","institution_ids":["https://openalex.org/I114150738"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5067880192"],"corresponding_institution_ids":["https://openalex.org/I114150738"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":2.2876,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.88726638,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"27","issue":"2","first_page":"335","last_page":"342"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.932699978351593,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9233999848365784,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6928879618644714},{"id":"https://openalex.org/keywords/predictive-maintenance","display_name":"Predictive maintenance","score":0.6584792733192444},{"id":"https://openalex.org/keywords/factory","display_name":"Factory (object-oriented programming)","score":0.6102845072746277},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.5308669209480286},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5247414708137512},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4931721091270447},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.471698522567749},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.44378662109375},{"id":"https://openalex.org/keywords/burn-in","display_name":"Burn-in","score":0.4423918128013611},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.3814362585544586},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.374248743057251},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.3447915315628052},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.23201602697372437},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08275488018989563}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6928879618644714},{"id":"https://openalex.org/C70452415","wikidata":"https://www.wikidata.org/wiki/Q3182448","display_name":"Predictive maintenance","level":2,"score":0.6584792733192444},{"id":"https://openalex.org/C40149104","wikidata":"https://www.wikidata.org/wiki/Q5620977","display_name":"Factory (object-oriented programming)","level":2,"score":0.6102845072746277},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.5308669209480286},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5247414708137512},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4931721091270447},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.471698522567749},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.44378662109375},{"id":"https://openalex.org/C179707776","wikidata":"https://www.wikidata.org/wiki/Q662895","display_name":"Burn-in","level":2,"score":0.4423918128013611},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.3814362585544586},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.374248743057251},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.3447915315628052},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.23201602697372437},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08275488018989563},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10845-013-0866-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-013-0866-3","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},{"id":"pmh:oai:RePEc:spr:joinma:v:27:y:2016:i:2:d:10.1007_s10845-013-0866-3","is_oa":false,"landing_page_url":"http://link.springer.com/10.1007/s10845-013-0866-3","pdf_url":null,"source":{"id":"https://openalex.org/S4306401271","display_name":"RePEc: Research Papers in Economics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I77793887","host_organization_name":"Federal Reserve Bank of St. Louis","host_organization_lineage":["https://openalex.org/I77793887"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":48,"referenced_works":["https://openalex.org/W1965872453","https://openalex.org/W1966289617","https://openalex.org/W1968975376","https://openalex.org/W1978965153","https://openalex.org/W1979695829","https://openalex.org/W1982675045","https://openalex.org/W1983571569","https://openalex.org/W1983614391","https://openalex.org/W1983895434","https://openalex.org/W1991694717","https://openalex.org/W1995330442","https://openalex.org/W2001085793","https://openalex.org/W2001755180","https://openalex.org/W2005659508","https://openalex.org/W2020776245","https://openalex.org/W2030013724","https://openalex.org/W2044374157","https://openalex.org/W2048299710","https://openalex.org/W2048808031","https://openalex.org/W2054109714","https://openalex.org/W2054662219","https://openalex.org/W2060508069","https://openalex.org/W2068568515","https://openalex.org/W2073028428","https://openalex.org/W2074480933","https://openalex.org/W2079519709","https://openalex.org/W2085667230","https://openalex.org/W2087780106","https://openalex.org/W2090231758","https://openalex.org/W2096947102","https://openalex.org/W2104381478","https://openalex.org/W2110285174","https://openalex.org/W2118225531","https://openalex.org/W2126230436","https://openalex.org/W2127846157","https://openalex.org/W2129753264","https://openalex.org/W2137785567","https://openalex.org/W2139177900","https://openalex.org/W2151244843","https://openalex.org/W2154390722","https://openalex.org/W2155009728","https://openalex.org/W2160062771","https://openalex.org/W2171151720","https://openalex.org/W2305637927","https://openalex.org/W2605661802","https://openalex.org/W3205395722","https://openalex.org/W4249919990","https://openalex.org/W6678745826"],"related_works":["https://openalex.org/W1986287575","https://openalex.org/W4251918988","https://openalex.org/W2353008372","https://openalex.org/W2171912619","https://openalex.org/W2150551164","https://openalex.org/W4238355107","https://openalex.org/W1998662473","https://openalex.org/W583571217","https://openalex.org/W2754952496","https://openalex.org/W2141261139"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}