{"id":"https://openalex.org/W2046481533","doi":"https://doi.org/10.1007/s10845-012-0725-7","title":"Automatic inspection system of LED chip using two-stages back-propagation neural network","display_name":"Automatic inspection system of LED chip using two-stages back-propagation neural network","publication_year":2013,"publication_date":"2013-01-03","ids":{"openalex":"https://openalex.org/W2046481533","doi":"https://doi.org/10.1007/s10845-012-0725-7","mag":"2046481533"},"language":"en","primary_location":{"id":"doi:10.1007/s10845-012-0725-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-012-0725-7","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050698993","display_name":"Chung\u2010Feng Jeffrey Kuo","orcid":"https://orcid.org/0000-0002-9025-8755"},"institutions":[{"id":"https://openalex.org/I154864474","display_name":"National Taiwan University of Science and Technology","ror":"https://ror.org/00q09pe49","country_code":"TW","type":"education","lineage":["https://openalex.org/I154864474"]},{"id":"https://openalex.org/I4210112150","display_name":"Institute of Automation","ror":"https://ror.org/022c3hy66","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210112150"]}],"countries":["CN","TW"],"is_corresponding":true,"raw_author_name":"Chung-Feng Jeffrey Kuo","raw_affiliation_strings":["Graduate Institute of Automation and Control, National Taiwan University of Science and Technology, Taipei, 106, Taiwan, Republic of China","Graduate Institute of Automation and Control, National Taiwan University of Science and Technology, Taipei, Taiwan, Republic of China 106#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate Institute of Automation and Control, National Taiwan University of Science and Technology, Taipei, 106, Taiwan, Republic of China","institution_ids":["https://openalex.org/I154864474","https://openalex.org/I4210112150"]},{"raw_affiliation_string":"Graduate Institute of Automation and Control, National Taiwan University of Science and Technology, Taipei, Taiwan, Republic of China 106#TAB#","institution_ids":["https://openalex.org/I154864474"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037800273","display_name":"Chien-Tung Max Hsu","orcid":null},"institutions":[{"id":"https://openalex.org/I154864474","display_name":"National Taiwan University of Science and Technology","ror":"https://ror.org/00q09pe49","country_code":"TW","type":"education","lineage":["https://openalex.org/I154864474"]},{"id":"https://openalex.org/I4210112150","display_name":"Institute of Automation","ror":"https://ror.org/022c3hy66","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210112150"]}],"countries":["CN","TW"],"is_corresponding":false,"raw_author_name":"Chien-Tung Max Hsu","raw_affiliation_strings":["Graduate Institute of Automation and Control, National Taiwan University of Science and Technology, Taipei, 106, Taiwan, Republic of China","Graduate Institute of Automation and Control, National Taiwan University of Science and Technology, Taipei, Taiwan, Republic of China 106#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate Institute of Automation and Control, National Taiwan University of Science and Technology, Taipei, 106, Taiwan, Republic of China","institution_ids":["https://openalex.org/I154864474","https://openalex.org/I4210112150"]},{"raw_affiliation_string":"Graduate Institute of Automation and Control, National Taiwan University of Science and Technology, Taipei, Taiwan, Republic of China 106#TAB#","institution_ids":["https://openalex.org/I154864474"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015258653","display_name":"Zongxian Liu","orcid":"https://orcid.org/0000-0002-3420-789X"},"institutions":[{"id":"https://openalex.org/I154864474","display_name":"National Taiwan University of Science and Technology","ror":"https://ror.org/00q09pe49","country_code":"TW","type":"education","lineage":["https://openalex.org/I154864474"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Zong-Xian Liu","raw_affiliation_strings":["Department of Materials Science & Engineering, National Taiwan University of Science and Technology, Taipei, 106, Taiwan, Republic of China","Department of Materials Science & Engineering, National Taiwan University of Science and Technology, Taipei, Taiwan, Republic of China 106#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science & Engineering, National Taiwan University of Science and Technology, Taipei, 106, Taiwan, Republic of China","institution_ids":["https://openalex.org/I154864474"]},{"raw_affiliation_string":"Department of Materials Science & Engineering, National Taiwan University of Science and Technology, Taipei, Taiwan, Republic of China 106#TAB#","institution_ids":["https://openalex.org/I154864474"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5020458697","display_name":"Han\u2010Cheng Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I154864474","display_name":"National Taiwan University of Science and Technology","ror":"https://ror.org/00q09pe49","country_code":"TW","type":"education","lineage":["https://openalex.org/I154864474"]},{"id":"https://openalex.org/I4210112150","display_name":"Institute of Automation","ror":"https://ror.org/022c3hy66","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210112150"]}],"countries":["CN","TW"],"is_corresponding":false,"raw_author_name":"Han-Cheng Wu","raw_affiliation_strings":["Graduate Institute of Automation and Control, National Taiwan University of Science and Technology, Taipei, 106, Taiwan, Republic of China","Graduate Institute of Automation and Control, National Taiwan University of Science and Technology, Taipei, Taiwan, Republic of China 106#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate Institute of Automation and Control, National Taiwan University of Science and Technology, Taipei, 106, Taiwan, Republic of China","institution_ids":["https://openalex.org/I154864474","https://openalex.org/I4210112150"]},{"raw_affiliation_string":"Graduate Institute of Automation and Control, National Taiwan University of Science and Technology, Taipei, Taiwan, Republic of China 106#TAB#","institution_ids":["https://openalex.org/I154864474"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5050698993"],"corresponding_institution_ids":["https://openalex.org/I154864474","https://openalex.org/I4210112150"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":7.8252,"has_fulltext":false,"cited_by_count":53,"citation_normalized_percentile":{"value":0.96773159,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"25","issue":"6","first_page":"1235","last_page":"1243"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7081228494644165},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.6222999691963196},{"id":"https://openalex.org/keywords/histogram","display_name":"Histogram","score":0.5731861591339111},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.5686349868774414},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5400133728981018},{"id":"https://openalex.org/keywords/histogram-equalization","display_name":"Histogram equalization","score":0.5148043036460876},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5144034028053284},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5143438577651978},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.49218836426734924},{"id":"https://openalex.org/keywords/scratch","display_name":"Scratch","score":0.4773117005825043},{"id":"https://openalex.org/keywords/backpropagation","display_name":"Backpropagation","score":0.42210352420806885},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.1693306267261505}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7081228494644165},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.6222999691963196},{"id":"https://openalex.org/C53533937","wikidata":"https://www.wikidata.org/wiki/Q185020","display_name":"Histogram","level":3,"score":0.5731861591339111},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.5686349868774414},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5400133728981018},{"id":"https://openalex.org/C136943445","wikidata":"https://www.wikidata.org/wiki/Q1970240","display_name":"Histogram equalization","level":4,"score":0.5148043036460876},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5144034028053284},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5143438577651978},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.49218836426734924},{"id":"https://openalex.org/C2781235140","wikidata":"https://www.wikidata.org/wiki/Q275131","display_name":"Scratch","level":2,"score":0.4773117005825043},{"id":"https://openalex.org/C155032097","wikidata":"https://www.wikidata.org/wiki/Q798503","display_name":"Backpropagation","level":3,"score":0.42210352420806885},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.1693306267261505},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10845-012-0725-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-012-0725-7","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.6800000071525574,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1971784203","https://openalex.org/W1980423850","https://openalex.org/W2047909766","https://openalex.org/W2053189880","https://openalex.org/W2059055371","https://openalex.org/W2076860189","https://openalex.org/W2077265569","https://openalex.org/W2087300498","https://openalex.org/W2088861336","https://openalex.org/W2095848267","https://openalex.org/W2109274761","https://openalex.org/W2110285174","https://openalex.org/W2126680276","https://openalex.org/W2133059825","https://openalex.org/W2138586914","https://openalex.org/W2157181469","https://openalex.org/W2157399391","https://openalex.org/W2169733476","https://openalex.org/W2171018114","https://openalex.org/W2171447090","https://openalex.org/W2319660501","https://openalex.org/W2538717980","https://openalex.org/W2542078974","https://openalex.org/W2545826967","https://openalex.org/W6770641979"],"related_works":["https://openalex.org/W2057981026","https://openalex.org/W2181573213","https://openalex.org/W2398368608","https://openalex.org/W2256021896","https://openalex.org/W1990492110","https://openalex.org/W1583737874","https://openalex.org/W2122866860","https://openalex.org/W2024449420","https://openalex.org/W2903465195","https://openalex.org/W2380937280"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":13},{"year":2020,"cited_by_count":9},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":3}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}