{"id":"https://openalex.org/W2033838206","doi":"https://doi.org/10.1007/s10845-012-0665-2","title":"Statistical process monitoring approach for high-density point clouds","display_name":"Statistical process monitoring approach for high-density point clouds","publication_year":2012,"publication_date":"2012-06-16","ids":{"openalex":"https://openalex.org/W2033838206","doi":"https://doi.org/10.1007/s10845-012-0665-2","mag":"2033838206"},"language":"en","primary_location":{"id":"doi:10.1007/s10845-012-0665-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-012-0665-2","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001590550","display_name":"Lee J. Wells","orcid":"https://orcid.org/0000-0002-0509-4769"},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Lee J. Wells","raw_affiliation_strings":["Virginia Tech, Blacksburg, VA, 24061, USA","Virginia Tech,Blacksburg,USA,24061"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Virginia Tech, Blacksburg, VA, 24061, USA","institution_ids":["https://openalex.org/I859038795"]},{"raw_affiliation_string":"Virginia Tech,Blacksburg,USA,24061","institution_ids":["https://openalex.org/I859038795"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024863972","display_name":"Fadel M. Megahed","orcid":"https://orcid.org/0000-0003-2194-5110"},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fadel M. Megahed","raw_affiliation_strings":["Virginia Tech, Blacksburg, VA, 24061, USA","Virginia Tech,Blacksburg,USA,24061"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Virginia Tech, Blacksburg, VA, 24061, USA","institution_ids":["https://openalex.org/I859038795"]},{"raw_affiliation_string":"Virginia Tech,Blacksburg,USA,24061","institution_ids":["https://openalex.org/I859038795"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084622199","display_name":"Cory B. Niziolek","orcid":null},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Cory B. Niziolek","raw_affiliation_strings":["Virginia Tech, Blacksburg, VA, 24061, USA","Virginia Tech,Blacksburg,USA,24061"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Virginia Tech, Blacksburg, VA, 24061, USA","institution_ids":["https://openalex.org/I859038795"]},{"raw_affiliation_string":"Virginia Tech,Blacksburg,USA,24061","institution_ids":["https://openalex.org/I859038795"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016675957","display_name":"Jaime A. Camelio","orcid":"https://orcid.org/0000-0002-8365-1102"},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jaime A. Camelio","raw_affiliation_strings":["Virginia Tech, Blacksburg, VA, 24061, USA","Virginia Tech,Blacksburg,USA,24061"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Virginia Tech, Blacksburg, VA, 24061, USA","institution_ids":["https://openalex.org/I859038795"]},{"raw_affiliation_string":"Virginia Tech,Blacksburg,USA,24061","institution_ids":["https://openalex.org/I859038795"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5055123256","display_name":"William H. Woodall","orcid":"https://orcid.org/0000-0002-9962-0001"},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"William H. Woodall","raw_affiliation_strings":["Virginia Tech, Blacksburg, VA, 24061, USA","Virginia Tech,Blacksburg,USA,24061"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Virginia Tech, Blacksburg, VA, 24061, USA","institution_ids":["https://openalex.org/I859038795"]},{"raw_affiliation_string":"Virginia Tech,Blacksburg,USA,24061","institution_ids":["https://openalex.org/I859038795"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5001590550"],"corresponding_institution_ids":["https://openalex.org/I859038795"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":3.8884,"has_fulltext":false,"cited_by_count":57,"citation_normalized_percentile":{"value":0.94338391,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"24","issue":"6","first_page":"1267","last_page":"1279"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11871","display_name":"Advanced Statistical Methods and Models","score":0.9836000204086304,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9743000268936157,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/point-cloud","display_name":"Point cloud","score":0.8659859895706177},{"id":"https://openalex.org/keywords/statistical-process-control","display_name":"Statistical process control","score":0.6943145990371704},{"id":"https://openalex.org/keywords/laser-scanning","display_name":"Laser scanning","score":0.6524920463562012},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6043683290481567},{"id":"https://openalex.org/keywords/scanner","display_name":"Scanner","score":0.538800060749054},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.531658411026001},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5287149548530579},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.5126725435256958},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.4657377302646637},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.458903968334198},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3736419081687927},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.21844834089279175},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.1583975851535797}],"concepts":[{"id":"https://openalex.org/C131979681","wikidata":"https://www.wikidata.org/wiki/Q1899648","display_name":"Point cloud","level":2,"score":0.8659859895706177},{"id":"https://openalex.org/C113644684","wikidata":"https://www.wikidata.org/wiki/Q1356717","display_name":"Statistical process control","level":3,"score":0.6943145990371704},{"id":"https://openalex.org/C141349535","wikidata":"https://www.wikidata.org/wiki/Q1361664","display_name":"Laser scanning","level":3,"score":0.6524920463562012},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6043683290481567},{"id":"https://openalex.org/C2779751349","wikidata":"https://www.wikidata.org/wiki/Q1474480","display_name":"Scanner","level":2,"score":0.538800060749054},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.531658411026001},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5287149548530579},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.5126725435256958},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.4657377302646637},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.458903968334198},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3736419081687927},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.21844834089279175},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.1583975851535797},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10845-012-0665-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-012-0665-2","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8100000023841858,"display_name":"Climate action","id":"https://metadata.un.org/sdg/13"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320337391","display_name":"Division of Civil, Mechanical and Manufacturing Innovation","ror":"https://ror.org/028yd4c30"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W988335224","https://openalex.org/W1511738908","https://openalex.org/W1580673759","https://openalex.org/W1664431191","https://openalex.org/W1969014399","https://openalex.org/W1969501546","https://openalex.org/W1971532062","https://openalex.org/W1988300964","https://openalex.org/W1990115979","https://openalex.org/W1997323863","https://openalex.org/W1999545598","https://openalex.org/W2005495936","https://openalex.org/W2016596388","https://openalex.org/W2022261649","https://openalex.org/W2023383528","https://openalex.org/W2034881071","https://openalex.org/W2044279350","https://openalex.org/W2051373834","https://openalex.org/W2052077753","https://openalex.org/W2055542757","https://openalex.org/W2064573617","https://openalex.org/W2071909685","https://openalex.org/W2092487605","https://openalex.org/W2094108672","https://openalex.org/W2109217896","https://openalex.org/W2111205070","https://openalex.org/W2131969788","https://openalex.org/W2139356790","https://openalex.org/W2154851027","https://openalex.org/W2157202423","https://openalex.org/W2167988582","https://openalex.org/W2233287913","https://openalex.org/W2315600187","https://openalex.org/W2617254988","https://openalex.org/W3022255685","https://openalex.org/W4302420972"],"related_works":["https://openalex.org/W2088131065","https://openalex.org/W2005998065","https://openalex.org/W897367340","https://openalex.org/W4323518558","https://openalex.org/W2001220299","https://openalex.org/W2286704396","https://openalex.org/W3196715007","https://openalex.org/W2366440988","https://openalex.org/W2358582870","https://openalex.org/W4293059742"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":11},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":6},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":5},{"year":2013,"cited_by_count":3}],"updated_date":"2026-06-16T07:32:37.131356","created_date":"2025-10-10T00:00:00"}