{"id":"https://openalex.org/W2033885131","doi":"https://doi.org/10.1007/s10845-010-0440-1","title":"A non-linear quality improvement model using SVR for manufacturing TFT-LCDs","display_name":"A non-linear quality improvement model using SVR for manufacturing TFT-LCDs","publication_year":2010,"publication_date":"2010-08-04","ids":{"openalex":"https://openalex.org/W2033885131","doi":"https://doi.org/10.1007/s10845-010-0440-1","mag":"2033885131"},"language":"en","primary_location":{"id":"doi:10.1007/s10845-010-0440-1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-010-0440-1","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028150954","display_name":"Der\u2010Chiang Li","orcid":"https://orcid.org/0000-0002-0887-1308"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Der-Chiang Li","raw_affiliation_strings":["Department of Industrial and Information Management, National Cheng Kung University, 1 University Road, Tainan, 70101, Taiwan","Department of Industrial and Information Management, National Cheng Kung University, Tainan, Taiwan 70101;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Industrial and Information Management, National Cheng Kung University, 1 University Road, Tainan, 70101, Taiwan","institution_ids":["https://openalex.org/I91807558"]},{"raw_affiliation_string":"Department of Industrial and Information Management, National Cheng Kung University, Tainan, Taiwan 70101;","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043652311","display_name":"Wen\u2010Chih Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Wen-Chih Chen","raw_affiliation_strings":["Department of Industrial and Information Management, National Cheng Kung University, 1 University Road, Tainan, 70101, Taiwan","Department of Industrial and Information Management, National Cheng Kung University, Tainan, Taiwan 70101;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Industrial and Information Management, National Cheng Kung University, 1 University Road, Tainan, 70101, Taiwan","institution_ids":["https://openalex.org/I91807558"]},{"raw_affiliation_string":"Department of Industrial and Information Management, National Cheng Kung University, Tainan, Taiwan 70101;","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066974453","display_name":"Chiao-Wen Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chiao-Wen Liu","raw_affiliation_strings":["Department of Industrial and Information Management, National Cheng Kung University, 1 University Road, Tainan, 70101, Taiwan","Department of Industrial and Information Management, National Cheng Kung University, Tainan, Taiwan 70101;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Industrial and Information Management, National Cheng Kung University, 1 University Road, Tainan, 70101, Taiwan","institution_ids":["https://openalex.org/I91807558"]},{"raw_affiliation_string":"Department of Industrial and Information Management, National Cheng Kung University, Tainan, Taiwan 70101;","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070813317","display_name":"Yao-San Lin","orcid":"https://orcid.org/0000-0002-5922-5971"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yao-San Lin","raw_affiliation_strings":["Department of Industrial and Information Management, National Cheng Kung University, 1 University Road, Tainan, 70101, Taiwan","Department of Industrial and Information Management, National Cheng Kung University, Tainan, Taiwan 70101;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Industrial and Information Management, National Cheng Kung University, 1 University Road, Tainan, 70101, Taiwan","institution_ids":["https://openalex.org/I91807558"]},{"raw_affiliation_string":"Department of Industrial and Information Management, National Cheng Kung University, Tainan, Taiwan 70101;","institution_ids":["https://openalex.org/I91807558"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5028150954"],"corresponding_institution_ids":["https://openalex.org/I91807558"],"apc_list":{"value":3290,"currency":"USD","value_usd":3290},"apc_paid":null,"fwci":6.7953,"has_fulltext":false,"cited_by_count":33,"citation_normalized_percentile":{"value":0.95757136,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"23","issue":"3","first_page":"835","last_page":"844"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11666","display_name":"Color Science and Applications","score":0.9876000285148621,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9695000052452087,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/thin-film-transistor","display_name":"Thin-film transistor","score":0.817795991897583},{"id":"https://openalex.org/keywords/vernier-scale","display_name":"Vernier scale","score":0.8061974048614502},{"id":"https://openalex.org/keywords/liquid-crystal-display","display_name":"Liquid-crystal display","score":0.6733219623565674},{"id":"https://openalex.org/keywords/color-gel","display_name":"Color gel","score":0.6509638428688049},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5539358258247375},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.45522889494895935},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.4537641108036041},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4201195240020752},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.35545146465301514},{"id":"https://openalex.org/keywords/engineering-drawing","display_name":"Engineering drawing","score":0.32242637872695923},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.30091047286987305},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.1334173083305359}],"concepts":[{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.817795991897583},{"id":"https://openalex.org/C69710193","wikidata":"https://www.wikidata.org/wiki/Q14946576","display_name":"Vernier scale","level":2,"score":0.8061974048614502},{"id":"https://openalex.org/C128019096","wikidata":"https://www.wikidata.org/wiki/Q83341","display_name":"Liquid-crystal display","level":2,"score":0.6733219623565674},{"id":"https://openalex.org/C142771000","wikidata":"https://www.wikidata.org/wiki/Q1435398","display_name":"Color gel","level":4,"score":0.6509638428688049},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5539358258247375},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.45522889494895935},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.4537641108036041},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4201195240020752},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.35545146465301514},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.32242637872695923},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.30091047286987305},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.1334173083305359},{"id":"https://openalex.org/C58640448","wikidata":"https://www.wikidata.org/wiki/Q42515","display_name":"Cartography","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10845-010-0440-1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-010-0440-1","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1565377632","https://openalex.org/W1570448133","https://openalex.org/W1938740620","https://openalex.org/W1964357740","https://openalex.org/W1969163824","https://openalex.org/W2025496917","https://openalex.org/W2026856149","https://openalex.org/W2036045975","https://openalex.org/W2041406732","https://openalex.org/W2057622142","https://openalex.org/W2062684894","https://openalex.org/W2089534012","https://openalex.org/W2119821739","https://openalex.org/W2124776405","https://openalex.org/W2142197202","https://openalex.org/W2165100383","https://openalex.org/W2167025280","https://openalex.org/W2285257517","https://openalex.org/W2317866228","https://openalex.org/W2966207845","https://openalex.org/W4205774955","https://openalex.org/W4233104424"],"related_works":["https://openalex.org/W2005487901","https://openalex.org/W2570863866","https://openalex.org/W1995584621","https://openalex.org/W2483067703","https://openalex.org/W2388650063","https://openalex.org/W2044693646","https://openalex.org/W2150798969","https://openalex.org/W2064038946","https://openalex.org/W2539204405","https://openalex.org/W2033885131"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}