{"id":"https://openalex.org/W4301498347","doi":"https://doi.org/10.1007/s10845-009-0333-3","title":"Extending the notion of quality from physical metrology to information and sustainability","display_name":"Extending the notion of quality from physical metrology to information and sustainability","publication_year":2009,"publication_date":"2009-10-27","ids":{"openalex":"https://openalex.org/W4301498347","doi":"https://doi.org/10.1007/s10845-009-0333-3"},"language":"en","primary_location":{"id":"doi:10.1007/s10845-009-0333-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-009-0333-3","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030488136","display_name":"Gaurav Ameta","orcid":"https://orcid.org/0000-0002-7463-2583"},"institutions":[{"id":"https://openalex.org/I72951846","display_name":"Washington State University","ror":"https://ror.org/05dk0ce17","country_code":"US","type":"education","lineage":["https://openalex.org/I72951846"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gaurav Ameta","raw_affiliation_strings":["School of Mechanical and Materials Engineering, Washington State University, Pullman, WA, 99164-2920, USA"],"affiliations":[{"raw_affiliation_string":"School of Mechanical and Materials Engineering, Washington State University, Pullman, WA, 99164-2920, USA","institution_ids":["https://openalex.org/I72951846"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060590453","display_name":"Sudarsan Rachuri","orcid":"https://orcid.org/0000-0003-3851-6451"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Sudarsan Rachuri","raw_affiliation_strings":["Design and Process Group, Manufacturing Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA"],"affiliations":[{"raw_affiliation_string":"Design and Process Group, Manufacturing Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026861542","display_name":"Xenia Fiorentini","orcid":null},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xenia Fiorentini","raw_affiliation_strings":["Design and Process Group, Manufacturing Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA"],"affiliations":[{"raw_affiliation_string":"Design and Process Group, Manufacturing Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103850980","display_name":"Mahesh Mani","orcid":null},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mahesh Mani","raw_affiliation_strings":["Design and Process Group, Manufacturing Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA"],"affiliations":[{"raw_affiliation_string":"Design and Process Group, Manufacturing Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111429218","display_name":"Steven J. Fenves","orcid":null},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Steven J. Fenves","raw_affiliation_strings":["Design and Process Group, Manufacturing Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA"],"affiliations":[{"raw_affiliation_string":"Design and Process Group, Manufacturing Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079367969","display_name":"Kevin W. Lyons","orcid":null},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kevin W. Lyons","raw_affiliation_strings":["Design and Process Group, Manufacturing Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA"],"affiliations":[{"raw_affiliation_string":"Design and Process Group, Manufacturing Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077880633","display_name":"Ram D. Sriram","orcid":"https://orcid.org/0000-0001-8602-4748"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ram D. Sriram","raw_affiliation_strings":["Design and Process Group, Manufacturing Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA"],"affiliations":[{"raw_affiliation_string":"Design and Process Group, Manufacturing Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA","institution_ids":["https://openalex.org/I1321296531"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5060590453"],"corresponding_institution_ids":["https://openalex.org/I1321296531"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.6079,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.75190399,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"22","issue":"5","first_page":"737","last_page":"750"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12238","display_name":"Green IT and Sustainability","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12238","display_name":"Green IT and Sustainability","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11719","display_name":"Data Quality and Management","score":0.9897000193595886,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13297","display_name":"History and advancements in chemistry","score":0.9617000222206116,"subfield":{"id":"https://openalex.org/subfields/1606","display_name":"Physical and Theoretical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sustainability","display_name":"Sustainability","score":0.751799464225769},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.6203341484069824},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.5679590702056885},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5162108540534973},{"id":"https://openalex.org/keywords/terminology","display_name":"Terminology","score":0.5101314187049866},{"id":"https://openalex.org/keywords/traceability","display_name":"Traceability","score":0.5052340626716614},{"id":"https://openalex.org/keywords/harmonization","display_name":"Harmonization","score":0.4820340871810913},{"id":"https://openalex.org/keywords/triple-bottom-line","display_name":"Triple bottom line","score":0.45783403515815735},{"id":"https://openalex.org/keywords/management-science","display_name":"Management science","score":0.44897595047950745},{"id":"https://openalex.org/keywords/information-quality","display_name":"Information quality","score":0.4360434114933014},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.4119081199169159},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.39066606760025024},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3540353775024414},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.3532874584197998},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.17847338318824768},{"id":"https://openalex.org/keywords/information-system","display_name":"Information system","score":0.17791390419006348},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.17590564489364624},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.10537359118461609},{"id":"https://openalex.org/keywords/operations-management","display_name":"Operations management","score":0.08019417524337769},{"id":"https://openalex.org/keywords/epistemology","display_name":"Epistemology","score":0.07856890559196472}],"concepts":[{"id":"https://openalex.org/C66204764","wikidata":"https://www.wikidata.org/wiki/Q219416","display_name":"Sustainability","level":2,"score":0.751799464225769},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.6203341484069824},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.5679590702056885},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5162108540534973},{"id":"https://openalex.org/C547195049","wikidata":"https://www.wikidata.org/wiki/Q1725664","display_name":"Terminology","level":2,"score":0.5101314187049866},{"id":"https://openalex.org/C153876917","wikidata":"https://www.wikidata.org/wiki/Q899704","display_name":"Traceability","level":2,"score":0.5052340626716614},{"id":"https://openalex.org/C2779962950","wikidata":"https://www.wikidata.org/wiki/Q5659376","display_name":"Harmonization","level":2,"score":0.4820340871810913},{"id":"https://openalex.org/C6165555","wikidata":"https://www.wikidata.org/wiki/Q1252862","display_name":"Triple bottom line","level":3,"score":0.45783403515815735},{"id":"https://openalex.org/C539667460","wikidata":"https://www.wikidata.org/wiki/Q2414942","display_name":"Management science","level":1,"score":0.44897595047950745},{"id":"https://openalex.org/C45983554","wikidata":"https://www.wikidata.org/wiki/Q3412851","display_name":"Information quality","level":3,"score":0.4360434114933014},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.4119081199169159},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.39066606760025024},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3540353775024414},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.3532874584197998},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.17847338318824768},{"id":"https://openalex.org/C180198813","wikidata":"https://www.wikidata.org/wiki/Q121182","display_name":"Information system","level":2,"score":0.17791390419006348},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17590564489364624},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.10537359118461609},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.08019417524337769},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.07856890559196472},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10845-009-0333-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-009-0333-3","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Responsible consumption and production","score":0.4000000059604645,"id":"https://metadata.un.org/sdg/12"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W104872893","https://openalex.org/W565276209","https://openalex.org/W630695300","https://openalex.org/W658774672","https://openalex.org/W1566451225","https://openalex.org/W1659833910","https://openalex.org/W1994668345","https://openalex.org/W1999023213","https://openalex.org/W2005345623","https://openalex.org/W2019817940","https://openalex.org/W2040615778","https://openalex.org/W2051987047","https://openalex.org/W2068566864","https://openalex.org/W2077551443","https://openalex.org/W2083995756","https://openalex.org/W2102219541","https://openalex.org/W2109488484","https://openalex.org/W2128859147","https://openalex.org/W2129447569","https://openalex.org/W2135713994","https://openalex.org/W2135780278","https://openalex.org/W2138752966","https://openalex.org/W2505813108","https://openalex.org/W2533252699","https://openalex.org/W2621842514","https://openalex.org/W4230873219","https://openalex.org/W4233299314","https://openalex.org/W4239172632"],"related_works":["https://openalex.org/W2378709054","https://openalex.org/W4380301954","https://openalex.org/W2803090313","https://openalex.org/W2376767034","https://openalex.org/W2350918606","https://openalex.org/W2052375654","https://openalex.org/W2077453531","https://openalex.org/W3209492875","https://openalex.org/W2011011149","https://openalex.org/W4381747133"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}