{"id":"https://openalex.org/W2010701920","doi":"https://doi.org/10.1007/s10845-008-0083-7","title":"Probability based vehicle fault diagnosis: Bayesian network method","display_name":"Probability based vehicle fault diagnosis: Bayesian network method","publication_year":2008,"publication_date":"2008-01-18","ids":{"openalex":"https://openalex.org/W2010701920","doi":"https://doi.org/10.1007/s10845-008-0083-7","mag":"2010701920"},"language":"en","primary_location":{"id":"doi:10.1007/s10845-008-0083-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-008-0083-7","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101492678","display_name":"Yingping Huang","orcid":"https://orcid.org/0000-0002-5861-2304"},"institutions":[{"id":"https://openalex.org/I39555362","display_name":"University of Warwick","ror":"https://ror.org/01a77tt86","country_code":"GB","type":"education","lineage":["https://openalex.org/I39555362"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Yingping Huang","raw_affiliation_strings":["International Automotive Research Centre (IARC), Warwick Manufacturing Group, University of Warwick, Coventry, CV4 7AL, UK","University of Warwick"],"affiliations":[{"raw_affiliation_string":"International Automotive Research Centre (IARC), Warwick Manufacturing Group, University of Warwick, Coventry, CV4 7AL, UK","institution_ids":["https://openalex.org/I39555362"]},{"raw_affiliation_string":"University of Warwick","institution_ids":["https://openalex.org/I39555362"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042246270","display_name":"Ross McMurran","orcid":null},"institutions":[{"id":"https://openalex.org/I39555362","display_name":"University of Warwick","ror":"https://ror.org/01a77tt86","country_code":"GB","type":"education","lineage":["https://openalex.org/I39555362"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Ross McMurran","raw_affiliation_strings":["International Automotive Research Centre (IARC), Warwick Manufacturing Group, University of Warwick, Coventry, CV4 7AL, UK","University of Warwick"],"affiliations":[{"raw_affiliation_string":"International Automotive Research Centre (IARC), Warwick Manufacturing Group, University of Warwick, Coventry, CV4 7AL, UK","institution_ids":["https://openalex.org/I39555362"]},{"raw_affiliation_string":"University of Warwick","institution_ids":["https://openalex.org/I39555362"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009739650","display_name":"Gunwant Dhadyalla","orcid":null},"institutions":[{"id":"https://openalex.org/I39555362","display_name":"University of Warwick","ror":"https://ror.org/01a77tt86","country_code":"GB","type":"education","lineage":["https://openalex.org/I39555362"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Gunwant Dhadyalla","raw_affiliation_strings":["International Automotive Research Centre (IARC), Warwick Manufacturing Group, University of Warwick, Coventry, CV4 7AL, UK","University of Warwick"],"affiliations":[{"raw_affiliation_string":"International Automotive Research Centre (IARC), Warwick Manufacturing Group, University of Warwick, Coventry, CV4 7AL, UK","institution_ids":["https://openalex.org/I39555362"]},{"raw_affiliation_string":"University of Warwick","institution_ids":["https://openalex.org/I39555362"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033517390","display_name":"R.P. Jones","orcid":"https://orcid.org/0000-0001-9952-8400"},"institutions":[{"id":"https://openalex.org/I39555362","display_name":"University of Warwick","ror":"https://ror.org/01a77tt86","country_code":"GB","type":"education","lineage":["https://openalex.org/I39555362"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"R. Peter Jones","raw_affiliation_strings":["School of Engineering and IARC, University of Warwick, Coventry, CV4 7AL, UK","University of Warwick"],"affiliations":[{"raw_affiliation_string":"School of Engineering and IARC, University of Warwick, Coventry, CV4 7AL, UK","institution_ids":["https://openalex.org/I39555362"]},{"raw_affiliation_string":"University of Warwick","institution_ids":["https://openalex.org/I39555362"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5101492678"],"corresponding_institution_ids":["https://openalex.org/I39555362"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":4.7434,"has_fulltext":false,"cited_by_count":80,"citation_normalized_percentile":{"value":0.94454141,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"19","issue":"3","first_page":"301","last_page":"311"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11303","display_name":"Bayesian Modeling and Causal Inference","score":0.9896000027656555,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11303","display_name":"Bayesian Modeling and Causal Inference","score":0.9896000027656555,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9853000044822693,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9767000079154968,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/troubleshooting","display_name":"Troubleshooting","score":0.8596946001052856},{"id":"https://openalex.org/keywords/bayesian-network","display_name":"Bayesian network","score":0.8105875253677368},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7496278285980225},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.651374340057373},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6198522448539734},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.5804604887962341},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.5439611673355103},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.48422741889953613},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4683999717235565},{"id":"https://openalex.org/keywords/root-cause","display_name":"Root cause","score":0.4394189119338989},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.39398622512817383},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3108001947402954}],"concepts":[{"id":"https://openalex.org/C147494362","wikidata":"https://www.wikidata.org/wiki/Q2078905","display_name":"Troubleshooting","level":2,"score":0.8596946001052856},{"id":"https://openalex.org/C33724603","wikidata":"https://www.wikidata.org/wiki/Q812540","display_name":"Bayesian network","level":2,"score":0.8105875253677368},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7496278285980225},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.651374340057373},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6198522448539734},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.5804604887962341},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.5439611673355103},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.48422741889953613},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4683999717235565},{"id":"https://openalex.org/C84945661","wikidata":"https://www.wikidata.org/wiki/Q7366567","display_name":"Root cause","level":2,"score":0.4394189119338989},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.39398622512817383},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3108001947402954},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10845-008-0083-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10845-008-0083-7","pdf_url":null,"source":{"id":"https://openalex.org/S161464388","display_name":"Journal of Intelligent Manufacturing","issn_l":"0956-5515","issn":["0956-5515","1572-8145"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent Manufacturing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320316529","display_name":"Jaguar Land Rover","ror":"https://ror.org/03b66v461"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W83480120","https://openalex.org/W1975438021","https://openalex.org/W2041625240","https://openalex.org/W2075734201","https://openalex.org/W2131148034","https://openalex.org/W2137651144","https://openalex.org/W2137779110","https://openalex.org/W2152708262","https://openalex.org/W2276762371"],"related_works":["https://openalex.org/W3013479934","https://openalex.org/W4318325534","https://openalex.org/W4240398146","https://openalex.org/W2007305199","https://openalex.org/W1734881440","https://openalex.org/W4245145435","https://openalex.org/W2478816384","https://openalex.org/W2004977422","https://openalex.org/W2783457203","https://openalex.org/W2485437088"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":8},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":7},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":1}],"updated_date":"2026-04-04T08:04:53.788161","created_date":"2025-10-10T00:00:00"}