{"id":"https://openalex.org/W7167935435","doi":"https://doi.org/10.1007/s10836-026-06243-4","title":"Robust Adaptive DLBIST for Delay Fault Testing: Minimizing PVT Variability with Zero Temperature Coefficient (ZTC) Voltage","display_name":"Robust Adaptive DLBIST for Delay Fault Testing: Minimizing PVT Variability with Zero Temperature Coefficient (ZTC) Voltage","publication_year":2026,"publication_date":"2026-06-01","ids":{"openalex":"https://openalex.org/W7167935435","doi":"https://doi.org/10.1007/s10836-026-06243-4"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-026-06243-4","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-026-06243-4","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-026-06243-4.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://link.springer.com/content/pdf/10.1007/s10836-026-06243-4.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003101843","display_name":"Hanieh Jafarzadeh","orcid":null},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]},{"id":"https://openalex.org/I206945453","display_name":"Paderborn University","ror":"https://ror.org/058kzsd48","country_code":"DE","type":"education","lineage":["https://openalex.org/I206945453"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Hanieh Jafarzadeh","raw_affiliation_strings":["Paderborn University, Paderborn, Germany","University of Stuttgart, Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Paderborn University, Paderborn, Germany","institution_ids":["https://openalex.org/I206945453"]},{"raw_affiliation_string":"University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083905801","display_name":"Florian Klemme","orcid":"https://orcid.org/0000-0002-0148-0523"},"institutions":[{"id":"https://openalex.org/I1325886976","display_name":"Siemens (Germany)","ror":"https://ror.org/059mq0909","country_code":"DE","type":"company","lineage":["https://openalex.org/I1325886976"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Florian Klemme","raw_affiliation_strings":["Siemens EDA, Hamburg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens EDA, Hamburg, Germany","institution_ids":["https://openalex.org/I1325886976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059133190","display_name":"Hussam Amrouch","orcid":"https://orcid.org/0000-0002-5649-3102"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]},{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Hussam Amrouch","raw_affiliation_strings":["Technical University of Munich, TUM School of Computation, Information and Technology, Chair of AI Processor Design, Munich Institute of Robotics and Machine Intelligence, M\u00fcnchen, Germany","University of Stuttgart, Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technical University of Munich, TUM School of Computation, Information and Technology, Chair of AI Processor Design, Munich Institute of Robotics and Machine Intelligence, M\u00fcnchen, Germany","institution_ids":["https://openalex.org/I62916508"]},{"raw_affiliation_string":"University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051549317","display_name":"Sybille Hellebrand","orcid":"https://orcid.org/0000-0002-3717-3939"},"institutions":[{"id":"https://openalex.org/I206945453","display_name":"Paderborn University","ror":"https://ror.org/058kzsd48","country_code":"DE","type":"education","lineage":["https://openalex.org/I206945453"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Sybille Hellebrand","raw_affiliation_strings":["Paderborn University, Paderborn, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Paderborn University, Paderborn, Germany","institution_ids":["https://openalex.org/I206945453"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008775226","display_name":"Hans-Joachim Wunderlich","orcid":"https://orcid.org/0000-0003-4536-8290"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Hans-Joachim Wunderlich","raw_affiliation_strings":["University of Stuttgart, Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5003101843","https://openalex.org/A5008775226","https://openalex.org/A5051549317","https://openalex.org/A5059133190","https://openalex.org/A5083905801"],"corresponding_institution_ids":["https://openalex.org/I100066346","https://openalex.org/I1325886976","https://openalex.org/I206945453","https://openalex.org/I62916508"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":{"value":2990,"currency":"USD","value_usd":2990},"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.88557426,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"42","issue":"3","first_page":"405","last_page":"416"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9659000039100647,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9659000039100647,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.016300000250339508,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.0044999998062849045,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.7166000008583069},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.6166999936103821},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.5370000004768372},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5368000268936157},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5156000256538391},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.4205999970436096},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.3950999975204468},{"id":"https://openalex.org/keywords/temperature-coefficient","display_name":"Temperature coefficient","score":0.36739999055862427}],"concepts":[{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.7166000008583069},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.6166999936103821},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.5370000004768372},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5368000268936157},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5156000256538391},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43070000410079956},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.4205999970436096},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.3950999975204468},{"id":"https://openalex.org/C16643434","wikidata":"https://www.wikidata.org/wiki/Q898642","display_name":"Temperature coefficient","level":2,"score":0.36739999055862427},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35519999265670776},{"id":"https://openalex.org/C536315585","wikidata":"https://www.wikidata.org/wiki/Q7698332","display_name":"Temperature control","level":2,"score":0.34700000286102295},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.34439998865127563},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3276999890804291},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.3059999942779541},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3018999993801117},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2840999960899353},{"id":"https://openalex.org/C2778520156","wikidata":"https://www.wikidata.org/wiki/Q449343","display_name":"Automotive electronics","level":3,"score":0.27889999747276306},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.27250000834465027},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.2709999978542328},{"id":"https://openalex.org/C2776350369","wikidata":"https://www.wikidata.org/wiki/Q843479","display_name":"Control logic","level":2,"score":0.2680000066757202},{"id":"https://openalex.org/C107464732","wikidata":"https://www.wikidata.org/wiki/Q235781","display_name":"Adaptive control","level":3,"score":0.26330000162124634},{"id":"https://openalex.org/C131321042","wikidata":"https://www.wikidata.org/wiki/Q656685","display_name":"Operating temperature","level":2,"score":0.25290000438690186},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.25270000100135803}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10836-026-06243-4","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-026-06243-4","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-026-06243-4.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:doi:10.18419/opus-19008","is_oa":true,"landing_page_url":"http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-ds-190270","pdf_url":null,"source":{"id":"https://openalex.org/S4406922384","display_name":"Open MIND","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":{"id":"doi:10.1007/s10836-026-06243-4","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-026-06243-4","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-026-06243-4.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.7769002318382263,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320324816","display_name":"Universit\u00e4t Paderborn","ror":"https://ror.org/058kzsd48"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W7167935435.pdf","grobid_xml":"https://content.openalex.org/works/W7167935435.grobid-xml"},"referenced_works_count":32,"referenced_works":["https://openalex.org/W1902443706","https://openalex.org/W1966797259","https://openalex.org/W1983748953","https://openalex.org/W2011433929","https://openalex.org/W2016652708","https://openalex.org/W2021038487","https://openalex.org/W2067701383","https://openalex.org/W2069493778","https://openalex.org/W2098228187","https://openalex.org/W2100827158","https://openalex.org/W2100937788","https://openalex.org/W2115908547","https://openalex.org/W2142082169","https://openalex.org/W2153126169","https://openalex.org/W2153171864","https://openalex.org/W2157946367","https://openalex.org/W2164374928","https://openalex.org/W2511040012","https://openalex.org/W2587047169","https://openalex.org/W2800676352","https://openalex.org/W2945263848","https://openalex.org/W3128050662","https://openalex.org/W3184463132","https://openalex.org/W4206779653","https://openalex.org/W4230343699","https://openalex.org/W4294719507","https://openalex.org/W4379116133","https://openalex.org/W4390098696","https://openalex.org/W4399146721","https://openalex.org/W4400034076","https://openalex.org/W4404848977","https://openalex.org/W4409536482"],"related_works":[],"abstract_inverted_index":{"Abstract":[0],"Safety-critical":[1],"automotive":[2,30],"systems":[3],"require":[4],"on-chip":[5,99,197],"testing":[6,147,161],"methods":[7],"to":[8,25,134],"ensure":[9],"high":[10],"fault":[11],"coverage":[12],"and":[13,45,80,83,127,139],"reliable":[14],"operation.":[15,94],"Periodic":[16],"Deterministic":[17],"Logic":[18],"Built-In":[19],"Self-Test":[20],"(DLBIST)":[21],"is":[22,170,174,181],"often":[23],"used":[24],"meet":[26],"these":[27],"demands.":[28],"For":[29],"applications,":[31],"DLBIST":[32,65,72,113,186],"must":[33],"operate":[34],"reliably":[35],"despite":[36],"temperature":[37,100,156,198],"variations,":[38],"including":[39],"those":[40],"caused":[41],"by":[42],"ambient":[43],"changes":[44],"self-heating":[46],"in":[47,92,194],"FinFET":[48],"transistors.":[49],"A":[50],"test":[51,118,131],"set":[52,132],"effective":[53],"for":[54,98,103,110,190],"all":[55],"temperatures":[56],"typically":[57],"requires":[58],"a":[59,70,187],"large":[60],"volume,":[61],"which":[62,74,173],"can":[63,107],"make":[64],"impractical.":[66],"This":[67,142,183],"paper":[68],"proposes":[69],"robust":[71],"scheme":[73],"applies":[75,128],"multiple":[76],"voltages":[77],"during":[78,89],"power-on":[79],"power-off":[81],"tests":[82,91],"the":[84,116,120,129,135,151,163,175,178],"optimal":[85],"or":[86],"adapted":[87],"voltage":[88,138,169,176],"periodic":[90,117,185],"system":[93],"If":[95,155],"distributed":[96],"sensors":[97,157,199],"are":[101,158,200],"available":[102],"DVFS":[104],"control,":[105],"they":[106],"be":[108],"exploited":[109],"an":[111],"adaptive":[112,143],"scheme.":[114],"During":[115],"phase,":[119],"BIST":[121],"Control":[122],"Unit":[123],"(BCU)":[124],"dynamically":[125],"selects":[126],"pre-generated":[130],"corresponding":[133],"current":[136],"operating":[137,153],"measured":[140],"temperature.":[141],"selection":[144],"ensures":[145],"that":[146],"conditions":[148],"precisely":[149],"match":[150],"real":[152],"points.":[154],"not":[159,201],"available,":[160],"at":[162],"so-called":[164],"Zero":[165],"Temperature":[166],"Coefficient":[167],"(ZTC)":[168],"one":[171],"alternative,":[172],"where":[177,196],"temperature-induced":[179],"variability":[180],"minimized.":[182],"makes":[184],"feasible":[188],"solution":[189],"in-field":[191],"self-testing,":[192],"even":[193],"cases":[195],"available.":[202]},"counts_by_year":[],"updated_date":"2026-07-27T08:26:11.824852","created_date":"2026-07-11T00:00:00"}