{"id":"https://openalex.org/W4384026312","doi":"https://doi.org/10.1007/s10836-026-06227-4","title":"Error Resilient Transformers: A Novel Soft Error Vulnerability Guided Approach to Error Checking and Suppression","display_name":"Error Resilient Transformers: A Novel Soft Error Vulnerability Guided Approach to Error Checking and Suppression","publication_year":2023,"publication_date":"2023-05-22","ids":{"openalex":"https://openalex.org/W4384026312","doi":"https://doi.org/10.1007/s10836-026-06227-4"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-026-06227-4","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-026-06227-4","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-026-06227-4.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://link.springer.com/content/pdf/10.1007/s10836-026-06227-4.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010528468","display_name":"Kwondo Ma","orcid":"https://orcid.org/0009-0007-6510-1143"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]},{"id":"https://openalex.org/I3131980609","display_name":"Korean Academy of Science and Technology","ror":"https://ror.org/01j49yd81","country_code":"KR","type":"education","lineage":["https://openalex.org/I3131980609"]}],"countries":["KR","US"],"is_corresponding":true,"raw_author_name":"Kwondo Ma","raw_affiliation_strings":["Rebellions Inc., Seongnam-si, Republic of Korea","Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rebellions Inc., Seongnam-si, Republic of Korea","institution_ids":["https://openalex.org/I3131980609"]},{"raw_affiliation_string":"Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028115522","display_name":"Chandramouli Amarnath","orcid":"https://orcid.org/0000-0001-9938-2157"},"institutions":[{"id":"https://openalex.org/I1291425158","display_name":"Google (United States)","ror":"https://ror.org/00njsd438","country_code":"US","type":"company","lineage":["https://openalex.org/I1291425158","https://openalex.org/I4210128969"]},{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chandramouli Amarnath","raw_affiliation_strings":["Google, Mountain View, CA, USA","Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Google, Mountain View, CA, USA","institution_ids":["https://openalex.org/I1291425158"]},{"raw_affiliation_string":"Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Jackson Isenberg","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jackson Isenberg","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,30332","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069579193","display_name":"Abhijit Chatterjee","orcid":"https://orcid.org/0000-0003-1553-4470"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Abhijit Chatterjee","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5010528468"],"corresponding_institution_ids":["https://openalex.org/I130701444","https://openalex.org/I3131980609"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":{"value":2990,"currency":"USD","value_usd":2990},"fwci":1.6645,"has_fulltext":true,"cited_by_count":13,"citation_normalized_percentile":{"value":0.86711136,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"42","issue":"2","first_page":"1","last_page":"248"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11689","display_name":"Adversarial Robustness in Machine Learning","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11689","display_name":"Adversarial Robustness in Machine Learning","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7736525535583496},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.7178746461868286},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.6864215731620789},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.5510318279266357},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.5161975026130676},{"id":"https://openalex.org/keywords/word-error-rate","display_name":"Word error rate","score":0.42749008536338806},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.40987852215766907},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.35834604501724243},{"id":"https://openalex.org/keywords/speech-recognition","display_name":"Speech recognition","score":0.2661969065666199},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.26341116428375244},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2608952224254608},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.18014666438102722},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.15200236439704895},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1049642562866211}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7736525535583496},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.7178746461868286},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.6864215731620789},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.5510318279266357},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5161975026130676},{"id":"https://openalex.org/C40969351","wikidata":"https://www.wikidata.org/wiki/Q3516228","display_name":"Word error rate","level":2,"score":0.42749008536338806},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.40987852215766907},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.35834604501724243},{"id":"https://openalex.org/C28490314","wikidata":"https://www.wikidata.org/wiki/Q189436","display_name":"Speech recognition","level":1,"score":0.2661969065666199},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.26341116428375244},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2608952224254608},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.18014666438102722},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15200236439704895},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1049642562866211}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10836-026-06227-4","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-026-06227-4","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-026-06227-4.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"doi:10.1109/ets56758.2023.10174239","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ets56758.2023.10174239","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE European Test Symposium (ETS)","raw_type":"proceedings-article"}],"best_oa_location":{"id":"doi:10.1007/s10836-026-06227-4","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-026-06227-4","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-026-06227-4.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4474951375","display_name":null,"funder_award_id":"2128149","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4384026312.pdf","grobid_xml":"https://content.openalex.org/works/W4384026312.grobid-xml"},"referenced_works_count":25,"referenced_works":["https://openalex.org/W630532510","https://openalex.org/W2083613288","https://openalex.org/W2626719825","https://openalex.org/W2896457183","https://openalex.org/W2897130165","https://openalex.org/W2964108906","https://openalex.org/W2964343359","https://openalex.org/W3000371584","https://openalex.org/W3034999214","https://openalex.org/W3046764219","https://openalex.org/W3094502228","https://openalex.org/W3096609285","https://openalex.org/W3112790703","https://openalex.org/W3187862527","https://openalex.org/W3205146859","https://openalex.org/W4297337476","https://openalex.org/W4385245566","https://openalex.org/W6671166405","https://openalex.org/W6739901393","https://openalex.org/W6755207826","https://openalex.org/W6769311223","https://openalex.org/W6778485988","https://openalex.org/W6784333009","https://openalex.org/W6802490317","https://openalex.org/W7051469422"],"related_works":["https://openalex.org/W2110991008","https://openalex.org/W2000201823","https://openalex.org/W3037446006","https://openalex.org/W2149051075","https://openalex.org/W2061536619","https://openalex.org/W4287752972","https://openalex.org/W3037482713","https://openalex.org/W2141072664","https://openalex.org/W168676510","https://openalex.org/W2394408226"],"abstract_inverted_index":{"Transformer":[0,21,49,68,86,106,125],"networks":[1],"have":[2],"achieved":[3],"remarkable":[4],"success":[5],"in":[6,31,67],"Natural":[7],"Language":[8],"Processing":[9],"(NLP)":[10],"and":[11,26,76,96,117,163],"Computer":[12],"Vision":[13],"applications.":[14],"However,":[15],"the":[16,119],"underlying":[17],"large":[18],"volumes":[19],"of":[20,36,46,62,104,110,130,147,157],"computations":[22],"demand":[23],"high":[24],"reliability":[25],"resilience":[27],"to":[28,40,84,121,149],"soft":[29,58],"errors":[30,95,99],"processor":[32],"hardware.":[33],"The":[34],"objective":[35],"this":[37,72],"research":[38],"is":[39],"develop":[41],"efficient":[42],"techniques":[43],"for":[44],"design":[45],"error":[47,59,74,90,136],"resilient":[48],"architectures.":[50],"To":[51],"enable":[52],"this,":[53],"we":[54],"first":[55],"perform":[56],"a":[57,124,144],"vulnerability":[60,133],"analysis":[61],"every":[63],"fully":[64],"connected":[65],"layers":[66],"computations.":[69,107],"Based":[70],"on":[71],"study,":[73],"detection":[75],"suppression":[77,137],"modules":[78],"are":[79,100],"selectively":[80],"introduced":[81],"into":[82],"datapaths":[83],"restore":[85],"performance":[87,142],"under":[88],"anticipated":[89],"rate":[91],"conditions.":[92],"Memory":[93],"access":[94],"neuron":[97],"output":[98,112],"detected":[101],"using":[102],"checksums":[103],"linear":[105],"Correction":[108],"consists":[109],"determining":[111],"neurons":[113],"with":[114,126,151],"out-of-range":[115],"values":[116],"suppressing":[118],"same":[120],"zero.":[122],"For":[123],"nominal":[127],"BLEU":[128,145],"score":[129,146],"52.7,":[131],"such":[132],"guided":[134],"selective":[135],"can":[138],"recover":[139],"language":[140],"translation":[141],"from":[143],"0":[148],"50.774":[150],"as":[152,154],"much":[153],"0.001":[155],"probability":[156],"activation":[158],"error,":[159],"incurring":[160],"negligible":[161],"memory":[162],"computation":[164],"overheads.":[165]},"counts_by_year":[{"year":2026,"cited_by_count":5},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":2}],"updated_date":"2026-08-11T07:18:39.950985","created_date":"2025-10-10T00:00:00"}