{"id":"https://openalex.org/W7127053722","doi":"https://doi.org/10.1007/s10836-025-06214-1","title":"SRAM PUF Preselection Method Based on Neighboring Spatial Majority Voting","display_name":"SRAM PUF Preselection Method Based on Neighboring Spatial Majority Voting","publication_year":2026,"publication_date":"2026-02-01","ids":{"openalex":"https://openalex.org/W7127053722","doi":"https://doi.org/10.1007/s10836-025-06214-1"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-025-06214-1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-025-06214-1","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5124738280","display_name":"Tianyao Shi","orcid":null},"institutions":[{"id":"https://openalex.org/I199305430","display_name":"Nantong University","ror":"https://ror.org/02afcvw97","country_code":"CN","type":"education","lineage":["https://openalex.org/I199305430"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianyao Shi","raw_affiliation_strings":["School of Artificial Intelligence and Computer Science, Nantong University, Nantong, Jiangsu, 226019, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Artificial Intelligence and Computer Science, Nantong University, Nantong, Jiangsu, 226019, China","institution_ids":["https://openalex.org/I199305430"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5124702306","display_name":"Sining Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210118629","display_name":"NARI Group (China)","ror":"https://ror.org/02egn3136","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210118629"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Sining Chen","raw_affiliation_strings":["Atekon Automation Technology Co., Ltd, Nanjing, Jiangsu, 210012, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Atekon Automation Technology Co., Ltd, Nanjing, Jiangsu, 210012, China","institution_ids":["https://openalex.org/I4210118629"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5124703356","display_name":"Haijin Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I199305430","display_name":"Nantong University","ror":"https://ror.org/02afcvw97","country_code":"CN","type":"education","lineage":["https://openalex.org/I199305430"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Haijin Chen","raw_affiliation_strings":["School of Microelectronics, Nantong University, Nantong, Jiangsu, 226019, China"],"raw_orcid":"https://orcid.org/0000-0001-5463-4701","affiliations":[{"raw_affiliation_string":"School of Microelectronics, Nantong University, Nantong, Jiangsu, 226019, China","institution_ids":["https://openalex.org/I199305430"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5124703356"],"corresponding_institution_ids":["https://openalex.org/I199305430"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15474707,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"42","issue":"1","first_page":"117","last_page":"128"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10951","display_name":"Cryptographic Implementations and Security","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8777999877929688},{"id":"https://openalex.org/keywords/randomness","display_name":"Randomness","score":0.6032999753952026},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.5440999865531921},{"id":"https://openalex.org/keywords/physical-unclonable-function","display_name":"Physical unclonable function","score":0.5353999733924866},{"id":"https://openalex.org/keywords/key-generation","display_name":"Key generation","score":0.4993000030517578},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.48890000581741333},{"id":"https://openalex.org/keywords/autocorrelation","display_name":"Autocorrelation","score":0.45559999346733093},{"id":"https://openalex.org/keywords/word-error-rate","display_name":"Word error rate","score":0.4494999945163727}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8777999877929688},{"id":"https://openalex.org/C125112378","wikidata":"https://www.wikidata.org/wiki/Q176640","display_name":"Randomness","level":2,"score":0.6032999753952026},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.5440999865531921},{"id":"https://openalex.org/C8643368","wikidata":"https://www.wikidata.org/wiki/Q4046262","display_name":"Physical unclonable function","level":3,"score":0.5353999733924866},{"id":"https://openalex.org/C163173736","wikidata":"https://www.wikidata.org/wiki/Q3308558","display_name":"Key generation","level":3,"score":0.4993000030517578},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49790000915527344},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.48890000581741333},{"id":"https://openalex.org/C5297727","wikidata":"https://www.wikidata.org/wiki/Q786970","display_name":"Autocorrelation","level":2,"score":0.45559999346733093},{"id":"https://openalex.org/C40969351","wikidata":"https://www.wikidata.org/wiki/Q3516228","display_name":"Word error rate","level":2,"score":0.4494999945163727},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.40380001068115234},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39489999413490295},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.362199991941452},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.35530000925064087},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.3499999940395355},{"id":"https://openalex.org/C111219384","wikidata":"https://www.wikidata.org/wiki/Q6954384","display_name":"NIST","level":2,"score":0.3483000099658966},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.3476000130176544},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.3411000072956085},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3312999904155731},{"id":"https://openalex.org/C18017163","wikidata":"https://www.wikidata.org/wiki/Q13560113","display_name":"Randomness tests","level":3,"score":0.32409998774528503},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.3167000114917755},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.31630000472068787},{"id":"https://openalex.org/C153668964","wikidata":"https://www.wikidata.org/wiki/Q27636","display_name":"Majority rule","level":2,"score":0.3095000088214874},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.3009999990463257},{"id":"https://openalex.org/C56296756","wikidata":"https://www.wikidata.org/wiki/Q840922","display_name":"Bit error rate","level":3,"score":0.2955999970436096},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.29350000619888306},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2928999960422516},{"id":"https://openalex.org/C2777826928","wikidata":"https://www.wikidata.org/wiki/Q3745713","display_name":"Fingerprint (computing)","level":2,"score":0.2563000023365021}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-025-06214-1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-025-06214-1","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.5761227011680603,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G1945118711","display_name":null,"funder_award_id":"BA2022001","funder_id":"https://openalex.org/F4320335973","funder_display_name":"Transformation Program of Scientific and Technological Achievements of Jiangsu Province"}],"funders":[{"id":"https://openalex.org/F4320335973","display_name":"Transformation Program of Scientific and Technological Achievements of Jiangsu Province","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1974113657","https://openalex.org/W2063309810","https://openalex.org/W2099231065","https://openalex.org/W2113322447","https://openalex.org/W2249570833","https://openalex.org/W2395872832","https://openalex.org/W2743953760","https://openalex.org/W2753654597","https://openalex.org/W2890640624","https://openalex.org/W2946162462","https://openalex.org/W2952977857","https://openalex.org/W2999571526","https://openalex.org/W3015792011","https://openalex.org/W3085849235","https://openalex.org/W3092481488","https://openalex.org/W3108373283","https://openalex.org/W3109211000","https://openalex.org/W3126348094","https://openalex.org/W3133994200","https://openalex.org/W4206281421","https://openalex.org/W4214503178","https://openalex.org/W4225852914","https://openalex.org/W4307946493","https://openalex.org/W4321617518","https://openalex.org/W4389609802","https://openalex.org/W4391326581","https://openalex.org/W4392945495","https://openalex.org/W4395469748","https://openalex.org/W4406258594"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-03-05T07:30:30.508283","created_date":"2026-02-03T00:00:00"}