{"id":"https://openalex.org/W4416610319","doi":"https://doi.org/10.1007/s10836-025-06205-2","title":"SD2CI: A Structure-driven Approach for Detecting Silent Data Corruption Instructions","display_name":"SD2CI: A Structure-driven Approach for Detecting Silent Data Corruption Instructions","publication_year":2025,"publication_date":"2025-11-25","ids":{"openalex":"https://openalex.org/W4416610319","doi":"https://doi.org/10.1007/s10836-025-06205-2"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-025-06205-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-025-06205-2","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102791721","display_name":"Na Yang","orcid":"https://orcid.org/0000-0003-4142-8321"},"institutions":[{"id":"https://openalex.org/I110109458","display_name":"Tianjin University of Commerce","ror":"https://ror.org/02b6amy98","country_code":"CN","type":"education","lineage":["https://openalex.org/I110109458"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Na Yang","raw_affiliation_strings":["School of Information Engineering, Tianjin University of Commerce, Tianjin, 300133, China"],"affiliations":[{"raw_affiliation_string":"School of Information Engineering, Tianjin University of Commerce, Tianjin, 300133, China","institution_ids":["https://openalex.org/I110109458"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034121567","display_name":"Shuhao Jiang","orcid":"https://orcid.org/0000-0002-7706-063X"},"institutions":[{"id":"https://openalex.org/I110109458","display_name":"Tianjin University of Commerce","ror":"https://ror.org/02b6amy98","country_code":"CN","type":"education","lineage":["https://openalex.org/I110109458"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuhao Jiang","raw_affiliation_strings":["School of Information Engineering, Tianjin University of Commerce, Tianjin, 300133, China"],"affiliations":[{"raw_affiliation_string":"School of Information Engineering, Tianjin University of Commerce, Tianjin, 300133, China","institution_ids":["https://openalex.org/I110109458"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100377658","display_name":"Yun Wang","orcid":"https://orcid.org/0000-0003-2302-0066"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yun Wang","raw_affiliation_strings":["School of Computer Science and Engineering, Southeast University, Nanjing, 211189, China"],"affiliations":[{"raw_affiliation_string":"School of Computer Science and Engineering, Southeast University, Nanjing, 211189, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056141466","display_name":"Qing Miao","orcid":"https://orcid.org/0000-0001-8703-3603"},"institutions":[{"id":"https://openalex.org/I2722730","display_name":"Inner Mongolia University","ror":"https://ror.org/0106qb496","country_code":"CN","type":"education","lineage":["https://openalex.org/I2722730"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qing Miao","raw_affiliation_strings":["School of Computer Science, Inner Mongolia University, Hohhot, 010021, China"],"affiliations":[{"raw_affiliation_string":"School of Computer Science, Inner Mongolia University, Hohhot, 010021, China","institution_ids":["https://openalex.org/I2722730"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5102791721"],"corresponding_institution_ids":["https://openalex.org/I110109458"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.199343,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"41","issue":"5-6","first_page":"587","last_page":"602"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11424","display_name":"Security and Verification in Computing","score":0.4812000095844269,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11424","display_name":"Security and Verification in Computing","score":0.4812000095844269,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11241","display_name":"Advanced Malware Detection Techniques","score":0.15790000557899475,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.149399995803833,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6779999732971191},{"id":"https://openalex.org/keywords/vulnerability","display_name":"Vulnerability (computing)","score":0.5619000196456909},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.5372999906539917},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4242999851703644},{"id":"https://openalex.org/keywords/data-retention","display_name":"Data retention","score":0.41269999742507935},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.412200003862381}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7904999852180481},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6779999732971191},{"id":"https://openalex.org/C95713431","wikidata":"https://www.wikidata.org/wiki/Q631425","display_name":"Vulnerability (computing)","level":2,"score":0.5619000196456909},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.5372999906539917},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4242999851703644},{"id":"https://openalex.org/C2780866740","wikidata":"https://www.wikidata.org/wiki/Q5227345","display_name":"Data retention","level":2,"score":0.41269999742507935},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.412200003862381},{"id":"https://openalex.org/C2780027415","wikidata":"https://www.wikidata.org/wiki/Q524648","display_name":"Language change","level":2,"score":0.3686000108718872},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3167000114917755},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.31619998812675476},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3061999976634979},{"id":"https://openalex.org/C193519340","wikidata":"https://www.wikidata.org/wiki/Q891179","display_name":"Data loss","level":2,"score":0.3052999973297119},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.29899999499320984},{"id":"https://openalex.org/C132525143","wikidata":"https://www.wikidata.org/wiki/Q141488","display_name":"Graph","level":2,"score":0.2793999910354614},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.27469998598098755},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.27379998564720154},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.25929999351501465},{"id":"https://openalex.org/C2776145971","wikidata":"https://www.wikidata.org/wiki/Q30673951","display_name":"Labeled data","level":2,"score":0.25850000977516174}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-025-06205-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-025-06205-2","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W2023856022","https://openalex.org/W2116097016","https://openalex.org/W2130189691","https://openalex.org/W2177905986","https://openalex.org/W2529578574","https://openalex.org/W2902078285","https://openalex.org/W3004239086","https://openalex.org/W3012032150","https://openalex.org/W3022067362","https://openalex.org/W3031001329","https://openalex.org/W3129298663","https://openalex.org/W3129459659","https://openalex.org/W3138690211","https://openalex.org/W3171842021","https://openalex.org/W3208260792","https://openalex.org/W3211099997","https://openalex.org/W4211189626","https://openalex.org/W4226027493","https://openalex.org/W4233791953","https://openalex.org/W4293079369","https://openalex.org/W4297337572","https://openalex.org/W4308083843","https://openalex.org/W4318685725","https://openalex.org/W4319297132","https://openalex.org/W4380520367","https://openalex.org/W4387321084","https://openalex.org/W4388337055"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-12-21T23:12:01.093139","created_date":"2025-11-25T00:00:00"}