{"id":"https://openalex.org/W4415691327","doi":"https://doi.org/10.1007/s10836-025-06202-5","title":"Enhanced Monte Carlo-Based Uncertainty Quantification in Electronic Circuits","display_name":"Enhanced Monte Carlo-Based Uncertainty Quantification in Electronic Circuits","publication_year":2025,"publication_date":"2025-10-30","ids":{"openalex":"https://openalex.org/W4415691327","doi":"https://doi.org/10.1007/s10836-025-06202-5"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-025-06202-5","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-025-06202-5","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-025-06202-5.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://link.springer.com/content/pdf/10.1007/s10836-025-06202-5.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059316122","display_name":"M.I. Dieste-Velasco","orcid":"https://orcid.org/0000-0002-2077-2097"},"institutions":[{"id":"https://openalex.org/I46176106","display_name":"Universidad de Burgos","ror":"https://ror.org/049da5t36","country_code":"ES","type":"education","lineage":["https://openalex.org/I46176106"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"Mar\u00eda Isabel Dieste-Velasco","raw_affiliation_strings":["Electromechanical Engineering Department, University of Burgos, Avda. de Cantabria s/n, Burgos, Spain"],"raw_orcid":"https://orcid.org/0000-0002-2077-2097","affiliations":[{"raw_affiliation_string":"Electromechanical Engineering Department, University of Burgos, Avda. de Cantabria s/n, Burgos, Spain","institution_ids":["https://openalex.org/I46176106"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5059316122"],"corresponding_institution_ids":["https://openalex.org/I46176106"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":{"value":2390,"currency":"EUR","value_usd":2990},"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.29887821,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"41","issue":"5-6","first_page":"615","last_page":"629"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.11469999700784683,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.11469999700784683,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.09969999641180038,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11697","display_name":"Numerical Methods and Algorithms","score":0.08810000121593475,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.7208999991416931},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.6672999858856201},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5733000040054321},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.5059999823570251},{"id":"https://openalex.org/keywords/uncertainty-quantification","display_name":"Uncertainty quantification","score":0.5004000067710876},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.47189998626708984},{"id":"https://openalex.org/keywords/probability-distribution","display_name":"Probability distribution","score":0.46299999952316284},{"id":"https://openalex.org/keywords/uncertainty-analysis","display_name":"Uncertainty analysis","score":0.4325999915599823}],"concepts":[{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.7208999991416931},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.6672999858856201},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5733000040054321},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5307999849319458},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.5059999823570251},{"id":"https://openalex.org/C32230216","wikidata":"https://www.wikidata.org/wiki/Q7882499","display_name":"Uncertainty quantification","level":2,"score":0.5004000067710876},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.47189998626708984},{"id":"https://openalex.org/C149441793","wikidata":"https://www.wikidata.org/wiki/Q200726","display_name":"Probability distribution","level":2,"score":0.46299999952316284},{"id":"https://openalex.org/C177803969","wikidata":"https://www.wikidata.org/wiki/Q29205","display_name":"Uncertainty analysis","level":2,"score":0.4325999915599823},{"id":"https://openalex.org/C176147448","wikidata":"https://www.wikidata.org/wiki/Q1889114","display_name":"Sensitivity analysis","level":3,"score":0.4074999988079071},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.3783000111579895},{"id":"https://openalex.org/C202615002","wikidata":"https://www.wikidata.org/wiki/Q783507","display_name":"Differentiable function","level":2,"score":0.3677999973297119},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3580000102519989},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.3366999924182892},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33090001344680786},{"id":"https://openalex.org/C2776157432","wikidata":"https://www.wikidata.org/wiki/Q1375683","display_name":"Normality","level":2,"score":0.32850000262260437},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.3248000144958496},{"id":"https://openalex.org/C197055811","wikidata":"https://www.wikidata.org/wiki/Q207522","display_name":"Probability density function","level":2,"score":0.2874999940395355},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2759999930858612},{"id":"https://openalex.org/C90559484","wikidata":"https://www.wikidata.org/wiki/Q778379","display_name":"Expression (computer science)","level":2,"score":0.25529998540878296}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-025-06202-5","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-025-06202-5","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-025-06202-5.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1007/s10836-025-06202-5","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-025-06202-5","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-025-06202-5.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320319138","display_name":"Universidad de Burgos","ror":"https://ror.org/049da5t36"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4415691327.pdf","grobid_xml":"https://content.openalex.org/works/W4415691327.grobid-xml"},"referenced_works_count":32,"referenced_works":["https://openalex.org/W1517244651","https://openalex.org/W1926678456","https://openalex.org/W1981582893","https://openalex.org/W2111384844","https://openalex.org/W2173691885","https://openalex.org/W2481127148","https://openalex.org/W2516030650","https://openalex.org/W2553245882","https://openalex.org/W2736913353","https://openalex.org/W2763141173","https://openalex.org/W2828923721","https://openalex.org/W2898684431","https://openalex.org/W2988726694","https://openalex.org/W2993664904","https://openalex.org/W3000075806","https://openalex.org/W3082605502","https://openalex.org/W3123858091","https://openalex.org/W3161839739","https://openalex.org/W3200640871","https://openalex.org/W3200738822","https://openalex.org/W3204849666","https://openalex.org/W3208807278","https://openalex.org/W3208866388","https://openalex.org/W4213144374","https://openalex.org/W4285082021","https://openalex.org/W4312227387","https://openalex.org/W4385299384","https://openalex.org/W4386921679","https://openalex.org/W4387789478","https://openalex.org/W4391197160","https://openalex.org/W4391197517","https://openalex.org/W4412404875"],"related_works":[],"abstract_inverted_index":{"Abstract":[0],"The":[1,181],"determination":[2],"of":[3,7,14,44,56,70,108,119,155],"measurement":[4,145],"uncertainty":[5,51,88,94,146,166],"is":[6,26,83,95,163,184],"paramount":[8],"importance":[9],"in":[10,77,147],"defining":[11],"the":[12,41,66,75,96,103,106,116,120,127,159,173],"range":[13],"values":[15],"assigned":[16],"to":[17,49,65,86,132,143,186],"a":[18,27,53,79,138,152,190,194],"given":[19],"response":[20,121],"variable.":[21],"In":[22],"electronic":[23,72,148],"circuits,":[24],"this":[25],"challenging":[28],"task":[29],"that":[30,165],"still":[31],"needs":[32],"further":[33],"development.":[34],"Difficulties":[35],"associated":[36],"with":[37,172],"repeated":[38],"measurements":[39,57],"and":[40,74,112,150,158,193],"inherent":[42],"variability":[43],"components":[45],"make":[46],"it":[47,82],"difficult":[48],"determine":[50],"unless":[52],"large":[54],"number":[55],"are":[58],"taken,":[59],"which":[60],"increases":[61],"costs.":[62],"Furthermore,":[63],"due":[64],"strong":[67],"nonlinear":[68],"characteristics":[69],"most":[71],"circuits":[73,149],"difficulty":[76],"determining":[78],"differentiable":[80],"expression,":[81],"not":[84],"feasible":[85],"apply":[87],"propagation.":[89],"An":[90],"alternative":[91],"for":[92,105],"modeling":[93],"Monte":[97,140],"Carlo":[98],"method,":[99],"as":[100],"proposed":[101,160,174,182],"by":[102],"Guide":[104],"Expression":[107],"Measurement":[109],"Uncertainty":[110],"(GUM":[111],"GUM-S1).":[113],"However,":[114],"when":[115,176],"probability":[117],"distribution":[118],"variables":[122],"significantly":[123],"deviates":[124],"from":[125],"normal,":[126],"GUM-S1":[128],"method":[129,142,175,183],"may":[130],"lead":[131],"inaccurate":[133],"results.":[134],"This":[135],"study":[136,154],"proposes":[137],"new":[139],"Carlo-based":[141],"quantify":[144],"includes":[151],"comparative":[153],"GUM,":[156],"GUM-S1,":[157],"method.":[161],"It":[162],"shown":[164],"can":[167],"be":[168,179],"determined":[169],"more":[170],"accurately":[171],"normality":[177],"cannot":[178],"assumed.":[180],"applied":[185],"two":[187],"analog":[188],"circuits:":[189],"Sallen-Key":[191],"filter":[192],"low-signal":[195],"amplifier.":[196]},"counts_by_year":[],"updated_date":"2026-03-12T06:13:28.667946","created_date":"2025-10-30T00:00:00"}