{"id":"https://openalex.org/W4414486456","doi":"https://doi.org/10.1007/s10836-025-06193-3","title":"Modelling, Simulation, and FPGA Implementation of an Augmented Memory Built-in Self-Test Based Design for Bit-Oriented Memory","display_name":"Modelling, Simulation, and FPGA Implementation of an Augmented Memory Built-in Self-Test Based Design for Bit-Oriented Memory","publication_year":2025,"publication_date":"2025-08-01","ids":{"openalex":"https://openalex.org/W4414486456","doi":"https://doi.org/10.1007/s10836-025-06193-3"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-025-06193-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-025-06193-3","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067301170","display_name":"Aditya Kumar Singh Pundir","orcid":"https://orcid.org/0000-0002-6762-9263"},"institutions":[{"id":"https://openalex.org/I4210166313","display_name":"Rajasthan Dental College and Hospital","ror":"https://ror.org/05jwrfc26","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210166313"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Aditya Kumar Singh Pundir","raw_affiliation_strings":["Department of ECE, Arya College of Engineering & I. T, Jaipur, Rajasthan, India"],"raw_orcid":"https://orcid.org/0000-0002-6762-9263","affiliations":[{"raw_affiliation_string":"Department of ECE, Arya College of Engineering & I. T, Jaipur, Rajasthan, India","institution_ids":["https://openalex.org/I4210166313"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000018475","display_name":"Pallavi Singh","orcid":"https://orcid.org/0000-0002-6404-2782"},"institutions":[{"id":"https://openalex.org/I4210126659","display_name":"Poornima University","ror":"https://ror.org/03gnqp653","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210126659"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Pallavi Singh","raw_affiliation_strings":["Faculty of Public Health, Poornima University, Jaipur, Rajasthan, India"],"raw_orcid":"https://orcid.org/0000-0002-6404-2782","affiliations":[{"raw_affiliation_string":"Faculty of Public Health, Poornima University, Jaipur, Rajasthan, India","institution_ids":["https://openalex.org/I4210126659"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069954129","display_name":"Ramesh Kumar","orcid":"https://orcid.org/0000-0001-9822-8246"},"institutions":[{"id":"https://openalex.org/I74319210","display_name":"Chitkara University","ror":"https://ror.org/057d6z539","country_code":"IN","type":"education","lineage":["https://openalex.org/I74319210"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Ramesh Kumar","raw_affiliation_strings":["Chitkara University Institute of Engineering and Technology, Chitkara University, Rajpura, Punjab, India"],"raw_orcid":"https://orcid.org/0000-0001-9822-8246","affiliations":[{"raw_affiliation_string":"Chitkara University Institute of Engineering and Technology, Chitkara University, Rajpura, Punjab, India","institution_ids":["https://openalex.org/I74319210"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078406894","display_name":"Manish Kumar Singla","orcid":"https://orcid.org/0000-0003-1028-2729"},"institutions":[{"id":"https://openalex.org/I85461943","display_name":"Saveetha University","ror":"https://ror.org/0034me914","country_code":"IN","type":"education","lineage":["https://openalex.org/I85461943"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Manish Kumar Singla","raw_affiliation_strings":["Department of Biosciences, Saveetha School of Engineering, Saveetha Institute of Medical and Technical Sciences, Chennai, 602 105, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Biosciences, Saveetha School of Engineering, Saveetha Institute of Medical and Technical Sciences, Chennai, 602 105, India","institution_ids":["https://openalex.org/I85461943"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5069954129"],"corresponding_institution_ids":["https://openalex.org/I74319210"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.27156812,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"41","issue":"4","first_page":"503","last_page":"523"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5656999945640564},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5458999872207642},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.428600013256073},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.41940000653266907},{"id":"https://openalex.org/keywords/dynamic-random-access-memory","display_name":"Dynamic random-access memory","score":0.37549999356269836},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.35089999437332153},{"id":"https://openalex.org/keywords/memory-refresh","display_name":"Memory refresh","score":0.3474999964237213},{"id":"https://openalex.org/keywords/memory-map","display_name":"Memory map","score":0.3411000072956085},{"id":"https://openalex.org/keywords/semiconductor-memory","display_name":"Semiconductor memory","score":0.3327000141143799}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7074000239372253},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5656999945640564},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5458999872207642},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.47130000591278076},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.428600013256073},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.41940000653266907},{"id":"https://openalex.org/C118702147","wikidata":"https://www.wikidata.org/wiki/Q189396","display_name":"Dynamic random-access memory","level":3,"score":0.37549999356269836},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.35089999437332153},{"id":"https://openalex.org/C87907426","wikidata":"https://www.wikidata.org/wiki/Q6815755","display_name":"Memory refresh","level":4,"score":0.3474999964237213},{"id":"https://openalex.org/C74426580","wikidata":"https://www.wikidata.org/wiki/Q719484","display_name":"Memory map","level":3,"score":0.3411000072956085},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3402999937534332},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.3327000141143799},{"id":"https://openalex.org/C12186640","wikidata":"https://www.wikidata.org/wiki/Q6815743","display_name":"Memory model","level":3,"score":0.3301999866962433},{"id":"https://openalex.org/C63511323","wikidata":"https://www.wikidata.org/wiki/Q908936","display_name":"Interleaved memory","level":4,"score":0.3273000121116638},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.326200008392334},{"id":"https://openalex.org/C92855701","wikidata":"https://www.wikidata.org/wiki/Q5830907","display_name":"Computer memory","level":3,"score":0.3174999952316284},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.31209999322891235},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.31200000643730164},{"id":"https://openalex.org/C82687282","wikidata":"https://www.wikidata.org/wiki/Q66221","display_name":"Auxiliary memory","level":2,"score":0.30660000443458557},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.305400013923645},{"id":"https://openalex.org/C53838383","wikidata":"https://www.wikidata.org/wiki/Q541148","display_name":"Conventional memory","level":5,"score":0.30469998717308044},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.29760000109672546},{"id":"https://openalex.org/C176649486","wikidata":"https://www.wikidata.org/wiki/Q2308807","display_name":"Memory management","level":3,"score":0.289000004529953},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.27959999442100525},{"id":"https://openalex.org/C57863822","wikidata":"https://www.wikidata.org/wiki/Q905488","display_name":"Flat memory model","level":4,"score":0.2702000141143799},{"id":"https://openalex.org/C193343404","wikidata":"https://www.wikidata.org/wiki/Q1928607","display_name":"Page fault","level":5,"score":0.2646999955177307},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.26440000534057617},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.25360000133514404}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-025-06193-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-025-06193-3","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W1491909393","https://openalex.org/W1577371739","https://openalex.org/W1633956032","https://openalex.org/W1936407410","https://openalex.org/W1980628982","https://openalex.org/W2013546400","https://openalex.org/W2015754562","https://openalex.org/W2032902013","https://openalex.org/W2051769100","https://openalex.org/W2078063367","https://openalex.org/W2087855246","https://openalex.org/W2114424039","https://openalex.org/W2116415649","https://openalex.org/W2131303839","https://openalex.org/W2133619111","https://openalex.org/W2140209837","https://openalex.org/W2141996322","https://openalex.org/W2144351580","https://openalex.org/W2146161329","https://openalex.org/W2146378482","https://openalex.org/W2150602514","https://openalex.org/W2151090310","https://openalex.org/W2159571837","https://openalex.org/W2161789896","https://openalex.org/W2165996580","https://openalex.org/W2166104212","https://openalex.org/W2166702167","https://openalex.org/W2522720996","https://openalex.org/W2539578130","https://openalex.org/W2792443135","https://openalex.org/W2942014702","https://openalex.org/W2957415245","https://openalex.org/W4213090883","https://openalex.org/W4251382531"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}