{"id":"https://openalex.org/W4411218867","doi":"https://doi.org/10.1007/s10836-025-06172-8","title":"Small Delay Fault Testing with Multiple Voltages under Variations: Defect vs. Fault Coverage","display_name":"Small Delay Fault Testing with Multiple Voltages under Variations: Defect vs. Fault Coverage","publication_year":2025,"publication_date":"2025-04-01","ids":{"openalex":"https://openalex.org/W4411218867","doi":"https://doi.org/10.1007/s10836-025-06172-8"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-025-06172-8","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-025-06172-8","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-025-06172-8.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://link.springer.com/content/pdf/10.1007/s10836-025-06172-8.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003101843","display_name":"Hanieh Jafarzadeh","orcid":null},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Hanieh Jafarzadeh","raw_affiliation_strings":["University of Stuttgart, Pfaffenwaldring 47, 70569, Stuttgart, Germany"],"raw_orcid":"https://orcid.org/0009-0007-4214-1126","affiliations":[{"raw_affiliation_string":"University of Stuttgart, Pfaffenwaldring 47, 70569, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083905801","display_name":"Florian Klemme","orcid":"https://orcid.org/0000-0002-0148-0523"},"institutions":[{"id":"https://openalex.org/I1325886976","display_name":"Siemens (Germany)","ror":"https://ror.org/059mq0909","country_code":"DE","type":"company","lineage":["https://openalex.org/I1325886976"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Florian Klemme","raw_affiliation_strings":["Siemens EDA, Tempowerking 1B, 21079, Hamburg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens EDA, Tempowerking 1B, 21079, Hamburg, Germany","institution_ids":["https://openalex.org/I1325886976"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Hussam Amrouch","orcid":null},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]},{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hussam Amrouch","raw_affiliation_strings":["Technical University of Munich, TUM School of Computation, Information and Technology; Chair of AI Processor Design; Munich Institute of Robotics and Machine Intelligence, Munich, Germany","University of Stuttgart, Pfaffenwaldring 47, 70569, Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technical University of Munich, TUM School of Computation, Information and Technology; Chair of AI Processor Design; Munich Institute of Robotics and Machine Intelligence, Munich, Germany","institution_ids":["https://openalex.org/I62916508"]},{"raw_affiliation_string":"University of Stuttgart, Pfaffenwaldring 47, 70569, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051549317","display_name":"Sybille Hellebrand","orcid":"https://orcid.org/0000-0002-3717-3939"},"institutions":[{"id":"https://openalex.org/I206945453","display_name":"Paderborn University","ror":"https://ror.org/058kzsd48","country_code":"DE","type":"education","lineage":["https://openalex.org/I206945453"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Sybille Hellebrand","raw_affiliation_strings":["Paderborn University, Warburger Str. 100, 33098, Paderborn, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Paderborn University, Warburger Str. 100, 33098, Paderborn, Germany","institution_ids":["https://openalex.org/I206945453"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008775226","display_name":"Hans-Joachim Wunderlich","orcid":"https://orcid.org/0000-0003-4536-8290"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hans-Joachim Wunderlich","raw_affiliation_strings":["University of Stuttgart, Pfaffenwaldring 47, 70569, Stuttgart, Germany"],"raw_orcid":"https://orcid.org/0000-0003-4536-8290","affiliations":[{"raw_affiliation_string":"University of Stuttgart, Pfaffenwaldring 47, 70569, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5003101843"],"corresponding_institution_ids":["https://openalex.org/I100066346"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":{"value":2390,"currency":"EUR","value_usd":2990},"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.11938303,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"41","issue":"2","first_page":"209","last_page":"219"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6948831081390381},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5318792462348938},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5189916491508484},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4922739565372467},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3625827431678772},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26947444677352905},{"id":"https://openalex.org/keywords/seismology","display_name":"Seismology","score":0.2660726308822632},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.23017552495002747},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.21933457255363464},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.07054069638252258}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6948831081390381},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5318792462348938},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5189916491508484},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4922739565372467},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3625827431678772},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26947444677352905},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.2660726308822632},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23017552495002747},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.21933457255363464},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.07054069638252258}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10836-025-06172-8","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-025-06172-8","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-025-06172-8.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:doi:10.18419/opus-17601","is_oa":true,"landing_page_url":"http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-ds-176200","pdf_url":null,"source":{"id":"https://openalex.org/S4406922384","display_name":"Open MIND","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":{"id":"doi:10.1007/s10836-025-06172-8","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-025-06172-8","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-025-06172-8.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3737195407","display_name":null,"funder_award_id":"WU 245/22-1","funder_id":"https://openalex.org/F4320320879","funder_display_name":"Deutsche Forschungsgemeinschaft"}],"funders":[{"id":"https://openalex.org/F4320320879","display_name":"Deutsche Forschungsgemeinschaft","ror":"https://ror.org/018mejw64"},{"id":"https://openalex.org/F4320325850","display_name":"Universit\u00e4t Stuttgart","ror":"https://ror.org/04vnq7t77"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4411218867.pdf","grobid_xml":"https://content.openalex.org/works/W4411218867.grobid-xml"},"referenced_works_count":32,"referenced_works":["https://openalex.org/W1966797259","https://openalex.org/W2011433929","https://openalex.org/W2014484422","https://openalex.org/W2054095206","https://openalex.org/W2072580274","https://openalex.org/W2074088078","https://openalex.org/W2074439343","https://openalex.org/W2075060462","https://openalex.org/W2100827158","https://openalex.org/W2103239558","https://openalex.org/W2111154686","https://openalex.org/W2113492022","https://openalex.org/W2115908547","https://openalex.org/W2119241964","https://openalex.org/W2131581217","https://openalex.org/W2153171864","https://openalex.org/W2161054100","https://openalex.org/W2164374928","https://openalex.org/W2511040012","https://openalex.org/W2736138358","https://openalex.org/W2800676352","https://openalex.org/W2998023333","https://openalex.org/W3024722044","https://openalex.org/W3142835241","https://openalex.org/W4200318003","https://openalex.org/W4206779653","https://openalex.org/W4294310855","https://openalex.org/W4390098696","https://openalex.org/W4400034076","https://openalex.org/W4404848977","https://openalex.org/W4409536482","https://openalex.org/W6738271091"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2383699822"],"abstract_inverted_index":{"Abstract":[0],"It":[1,40],"has":[2],"been":[3],"known":[4],"and":[5,104,189],"explored":[6],"for":[7,115,121,143],"many":[8],"years":[9],"that":[10,44,86,171,178],"low":[11,165],"voltage":[12,103,151,194],"testing":[13,53,130],"amplifies":[14],"the":[15,21,31,59,95,112,157,172],"effect":[16],"of":[17,23,70,85,97,185],"a":[18,24,83],"defect,":[19],"increasing":[20],"size":[22],"Small":[25],"Delay":[26],"Fault":[27],"(SDF)":[28],"and,":[29],"in":[30,183],"best":[32],"case,":[33],"turning":[34],"SDFs":[35],"into":[36],"easily":[37],"detectable":[38],"stuck-at-faults.":[39],"is":[41,82],"often":[42],"overlooked":[43],"$$V_{\\textrm{min}}$$":[45,74,122],"<mml:math":[46,75,123],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\">":[47,76,124],"<mml:msub>":[48,77,125],"<mml:mi>V</mml:mi>":[49,78,126],"<mml:mtext>min</mml:mtext>":[50,79,127],"</mml:msub>":[51,80,128],"</mml:math>":[52,81,129],"poses":[54],"an":[55],"additional":[56],"challenge":[57],"to":[58,149],"test":[60,98,116,138,176,181,186],"pattern":[61,117,158],"generation":[62,118],"method":[63,174],"under":[64,73,87,101,161],"process":[65],"variations.":[66],"The":[67,90,146],"standard":[68],"deviation":[69],"gate":[71],"delays":[72],"multiple":[84],"nominal":[88,102,144],"voltage.":[89,145,167],"increased":[91],"variation":[92],"will":[93],"invalidate":[94],"efficiency":[96,191],"patterns":[99,147,177],"generated":[100,142,160],"significantly":[105],"reduce":[106],"fault":[107,134,190],"coverage.":[108],"This":[109],"paper":[110],"presents":[111],"first":[113],"algorithm":[114],"specifically":[119],"tuned":[120],"which":[131],"obtains":[132],"higher":[133],"coverage":[135],"by":[136],"smaller":[137],"sets":[139,182],"than":[140],"those":[141],"applicable":[148],"other":[150],"levels":[152],"can":[153],"be":[154],"derived":[155],"from":[156],"set":[159,187],"extreme":[162],"variations":[163],"at":[164],"supply":[166],"Experimental":[168],"results":[169],"demonstrate":[170],"proposed":[173],"produces":[175],"outperform":[179],"N-detection":[180],"terms":[184],"volume":[188],"across":[192],"different":[193],"levels.":[195]},"counts_by_year":[],"updated_date":"2025-11-08T23:21:52.890332","created_date":"2025-10-10T00:00:00"}