{"id":"https://openalex.org/W4410702679","doi":"https://doi.org/10.1007/s10836-025-06169-3","title":"Survey of Verification of RISC-V Processors","display_name":"Survey of Verification of RISC-V Processors","publication_year":2025,"publication_date":"2025-04-01","ids":{"openalex":"https://openalex.org/W4410702679","doi":"https://doi.org/10.1007/s10836-025-06169-3"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-025-06169-3","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-025-06169-3","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-025-06169-3.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://link.springer.com/content/pdf/10.1007/s10836-025-06169-3.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5117665904","display_name":"Chloe Tain","orcid":null},"institutions":[{"id":"https://openalex.org/I84218800","display_name":"University of California, Davis","ror":"https://ror.org/05rrcem69","country_code":"US","type":"education","lineage":["https://openalex.org/I84218800"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Chloe Tain","raw_affiliation_strings":["ECE Department, University of California, Davis, CA, 95616, USA"],"affiliations":[{"raw_affiliation_string":"ECE Department, University of California, Davis, CA, 95616, USA","institution_ids":["https://openalex.org/I84218800"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100910263","display_name":"Savita Patil","orcid":"https://orcid.org/0000-0003-0248-5526"},"institutions":[{"id":"https://openalex.org/I84218800","display_name":"University of California, Davis","ror":"https://ror.org/05rrcem69","country_code":"US","type":"education","lineage":["https://openalex.org/I84218800"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Savita Patil","raw_affiliation_strings":["ECE Department, University of California, Davis, CA, 95616, USA"],"affiliations":[{"raw_affiliation_string":"ECE Department, University of California, Davis, CA, 95616, USA","institution_ids":["https://openalex.org/I84218800"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5057526944","display_name":"Hussain Al-Asaad","orcid":null},"institutions":[{"id":"https://openalex.org/I84218800","display_name":"University of California, Davis","ror":"https://ror.org/05rrcem69","country_code":"US","type":"education","lineage":["https://openalex.org/I84218800"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hussain Al-Asaad","raw_affiliation_strings":["ECE Department, University of California, Davis, CA, 95616, USA"],"affiliations":[{"raw_affiliation_string":"ECE Department, University of California, Davis, CA, 95616, USA","institution_ids":["https://openalex.org/I84218800"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5117665904"],"corresponding_institution_ids":["https://openalex.org/I84218800"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":{"value":2390,"currency":"EUR","value_usd":2990},"fwci":5.0589,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.94257866,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":"41","issue":"2","first_page":"111","last_page":"138"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5412165522575378},{"id":"https://openalex.org/keywords/reduced-instruction-set-computing","display_name":"Reduced instruction set computing","score":0.44106751680374146},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3983765244483948},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.3878304958343506},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3236815333366394},{"id":"https://openalex.org/keywords/instruction-set","display_name":"Instruction set","score":0.1219402551651001}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5412165522575378},{"id":"https://openalex.org/C126298526","wikidata":"https://www.wikidata.org/wiki/Q189376","display_name":"Reduced instruction set computing","level":3,"score":0.44106751680374146},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3983765244483948},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.3878304958343506},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3236815333366394},{"id":"https://openalex.org/C202491316","wikidata":"https://www.wikidata.org/wiki/Q272683","display_name":"Instruction set","level":2,"score":0.1219402551651001}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-025-06169-3","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-025-06169-3","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-025-06169-3.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1007/s10836-025-06169-3","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-025-06169-3","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-025-06169-3.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4410702679.pdf","grobid_xml":"https://content.openalex.org/works/W4410702679.grobid-xml"},"referenced_works_count":30,"referenced_works":["https://openalex.org/W1988942890","https://openalex.org/W1999890019","https://openalex.org/W2074582213","https://openalex.org/W2094753344","https://openalex.org/W2096455207","https://openalex.org/W2122710652","https://openalex.org/W2133596506","https://openalex.org/W2161314693","https://openalex.org/W2519931684","https://openalex.org/W2965603659","https://openalex.org/W2982238852","https://openalex.org/W3016106397","https://openalex.org/W3089765345","https://openalex.org/W3095947311","https://openalex.org/W3106640704","https://openalex.org/W3113595755","https://openalex.org/W3159032828","https://openalex.org/W3159661380","https://openalex.org/W4205212523","https://openalex.org/W4237840813","https://openalex.org/W4285338830","https://openalex.org/W4313492219","https://openalex.org/W4372266824","https://openalex.org/W4377969851","https://openalex.org/W4384026338","https://openalex.org/W4385412005","https://openalex.org/W4389476186","https://openalex.org/W4401568242","https://openalex.org/W4410711935","https://openalex.org/W6908861774"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W1993387723"],"abstract_inverted_index":{"Abstract":[0],"This":[1,27,43],"paper":[2,44],"is":[3,37,100,150],"a":[4,50],"survey":[5],"of":[6,117,137],"the":[7,46,127],"various":[8,55,143],"verification":[9,30,57,59,67,90,108,120],"methods":[10,91,109],"available":[11,56,144],"for":[12,48,93],"RISC":[13,97],"based":[14,98],"processors.":[15],"The":[16,103],"RISC-V":[17,105,148],"processors":[18,99,149],"are":[19,83,132],"open":[20],"standard":[21],"that":[22],"can":[23],"have":[24],"user-based":[25],"extensions.":[26],"makes":[28],"their":[29,153],"complex":[31],"and":[32,61,81,89,96,122,130,139,145,159],"prone":[33],"to":[34,72,79],"errors.":[35],"There":[36],"ongoing":[38],"research":[39,141],"in":[40,110],"this":[41],"area.":[42],"illustrates":[45],"criteria":[47],"deciding":[49],"Verification":[51,71,77],"Plan":[52,78],"while":[53],"considering":[54],"methods,":[58],"time,":[60],"software":[62,129],"costs.":[63],"Several":[64],"hardware":[65,106],"design":[66,107],"approaches":[68],"from":[69],"Formal":[70],"Simulation":[73],"based,":[74],"Fully":[75],"Automated":[76],"Security":[80],"Trojans":[82],"discussed.":[84],"A":[85],"Comparison":[86],"between":[87],"features":[88],"employed":[92],"Intel,":[94],"ARM":[95],"also":[101],"done.":[102],"current":[104,140],"use":[111,116],"like":[112],"self-checking":[113],"tests,":[114],"testbench":[115],"standards,":[118],"virtual":[119],"peripherals":[121],"many":[123],"more":[124],"along":[125],"with":[126,152],"required":[128],"tools":[131],"described.":[133],"In":[134],"depth":[135],"analysis":[136],"previous":[138],"on":[142],"newly":[146],"developed":[147],"chronicled":[151],"code":[154],"coverage,":[155,157],"functional":[156],"limitations":[158],"bug":[160],"detection":[161],"details.":[162]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2026-03-10T16:38:18.471706","created_date":"2025-10-10T00:00:00"}