{"id":"https://openalex.org/W4409983251","doi":"https://doi.org/10.1007/s10836-025-06165-7","title":"Test Case Optimization using Machine Learning based Hybrid Meta-Heuristic Approach","display_name":"Test Case Optimization using Machine Learning based Hybrid Meta-Heuristic Approach","publication_year":2025,"publication_date":"2025-04-01","ids":{"openalex":"https://openalex.org/W4409983251","doi":"https://doi.org/10.1007/s10836-025-06165-7"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-025-06165-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-025-06165-7","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Gajender Rao","orcid":"https://orcid.org/0009-0004-8148-2087"},"institutions":[{"id":"https://openalex.org/I15896350","display_name":"Guru Jambheshwar University of Science and Technology","ror":"https://ror.org/02zpxgh81","country_code":"IN","type":"education","lineage":["https://openalex.org/I15896350"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Gajender Rao","raw_affiliation_strings":["Research Scholar, Department of Computer Science and Engineering, Guru Jambheshwar University of Science and Technology, Hisar, India"],"raw_orcid":"https://orcid.org/0009-0004-8148-2087","affiliations":[{"raw_affiliation_string":"Research Scholar, Department of Computer Science and Engineering, Guru Jambheshwar University of Science and Technology, Hisar, India","institution_ids":["https://openalex.org/I15896350"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5072687836","display_name":"Deepak Nandal","orcid":"https://orcid.org/0000-0002-9248-8757"},"institutions":[{"id":"https://openalex.org/I15896350","display_name":"Guru Jambheshwar University of Science and Technology","ror":"https://ror.org/02zpxgh81","country_code":"IN","type":"education","lineage":["https://openalex.org/I15896350"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Deepak Nandal","raw_affiliation_strings":["Department of Computer Science and Engineering, Guru Jambheshwar University of Science and Technology, Hisar, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, Guru Jambheshwar University of Science and Technology, Hisar, India","institution_ids":["https://openalex.org/I15896350"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I15896350"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":2.1259,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.84648144,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"41","issue":"2","first_page":"173","last_page":"192"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/meta-heuristic","display_name":"Meta heuristic","score":0.7566632032394409},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5908170342445374},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5823776125907898},{"id":"https://openalex.org/keywords/heuristic","display_name":"Heuristic","score":0.565542459487915},{"id":"https://openalex.org/keywords/metamodeling","display_name":"Metamodeling","score":0.5297155380249023},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4858405292034149},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.4062037169933319},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2671172022819519},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.1584213674068451}],"concepts":[{"id":"https://openalex.org/C2988037039","wikidata":"https://www.wikidata.org/wiki/Q1385229","display_name":"Meta heuristic","level":2,"score":0.7566632032394409},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5908170342445374},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5823776125907898},{"id":"https://openalex.org/C173801870","wikidata":"https://www.wikidata.org/wiki/Q201413","display_name":"Heuristic","level":2,"score":0.565542459487915},{"id":"https://openalex.org/C86610423","wikidata":"https://www.wikidata.org/wiki/Q1925081","display_name":"Metamodeling","level":2,"score":0.5297155380249023},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4858405292034149},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.4062037169933319},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2671172022819519},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.1584213674068451},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-025-06165-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-025-06165-7","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":59,"referenced_works":["https://openalex.org/W634043428","https://openalex.org/W2510199251","https://openalex.org/W2754480506","https://openalex.org/W2772156112","https://openalex.org/W2807347027","https://openalex.org/W2915721174","https://openalex.org/W2953582451","https://openalex.org/W2979574739","https://openalex.org/W2980367236","https://openalex.org/W3015939327","https://openalex.org/W3015991898","https://openalex.org/W3017188678","https://openalex.org/W3048229345","https://openalex.org/W3084701378","https://openalex.org/W3088148340","https://openalex.org/W3089347606","https://openalex.org/W3107007349","https://openalex.org/W3141890300","https://openalex.org/W3166352507","https://openalex.org/W3211702194","https://openalex.org/W4200026479","https://openalex.org/W4200035511","https://openalex.org/W4200411312","https://openalex.org/W4206057423","https://openalex.org/W4210549730","https://openalex.org/W4226181348","https://openalex.org/W4287832329","https://openalex.org/W4294672509","https://openalex.org/W4295779100","https://openalex.org/W4297126540","https://openalex.org/W4312304371","https://openalex.org/W4312907035","https://openalex.org/W4313396608","https://openalex.org/W4328028325","https://openalex.org/W4362544953","https://openalex.org/W4364360653","https://openalex.org/W4376606594","https://openalex.org/W4381335812","https://openalex.org/W4386047661","https://openalex.org/W4386462109","https://openalex.org/W4387538218","https://openalex.org/W4388947802","https://openalex.org/W4389064660","https://openalex.org/W4389194814","https://openalex.org/W4390709090","https://openalex.org/W4390783791","https://openalex.org/W4391145932","https://openalex.org/W4391211593","https://openalex.org/W4391655055","https://openalex.org/W4391851514","https://openalex.org/W4391888719","https://openalex.org/W4391892519","https://openalex.org/W4391936432","https://openalex.org/W4392253440","https://openalex.org/W4392265874","https://openalex.org/W4392452802","https://openalex.org/W4392910052","https://openalex.org/W4393035110","https://openalex.org/W4394808222"],"related_works":["https://openalex.org/W2080167534","https://openalex.org/W3146440365","https://openalex.org/W2011315860","https://openalex.org/W2130588191","https://openalex.org/W2140792736","https://openalex.org/W2280241695","https://openalex.org/W2083372954","https://openalex.org/W4239214709","https://openalex.org/W86865726","https://openalex.org/W4310120240"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}