{"id":"https://openalex.org/W4408238247","doi":"https://doi.org/10.1007/s10836-025-06162-w","title":"SEU Fault Injection Strategy for SRAM-based FPGA User Memory Based on Dual-Circuit Model","display_name":"SEU Fault Injection Strategy for SRAM-based FPGA User Memory Based on Dual-Circuit Model","publication_year":2025,"publication_date":"2025-02-01","ids":{"openalex":"https://openalex.org/W4408238247","doi":"https://doi.org/10.1007/s10836-025-06162-w"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-025-06162-w","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-025-06162-w","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060289682","display_name":"Yuchao Liu","orcid":"https://orcid.org/0000-0002-6225-4327"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yuchao Liu","raw_affiliation_strings":["School of Integrated Circuits, Anhui University, Hefei, 230000, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Anhui University, Hefei, 230000, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046125484","display_name":"Liang Yao","orcid":"https://orcid.org/0000-0002-4081-6499"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liang Yao","raw_affiliation_strings":["School of Integrated Circuits, Anhui University, Hefei, 230000, China"],"raw_orcid":"https://orcid.org/0000-0002-4081-6499","affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Anhui University, Hefei, 230000, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106479728","display_name":"Wenjing Zhang","orcid":"https://orcid.org/0009-0002-1569-364X"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenjing Zhang","raw_affiliation_strings":["School of Integrated Circuits, Anhui University, Hefei, 230000, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Anhui University, Hefei, 230000, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102028289","display_name":"Yuhao Wang","orcid":"https://orcid.org/0000-0002-3746-1973"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuhao Wang","raw_affiliation_strings":["School of Integrated Circuits, Anhui University, Hefei, 230000, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Anhui University, Hefei, 230000, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":null,"display_name":"XinKai Jiang","orcid":null},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"XinKai Jiang","raw_affiliation_strings":["School of Integrated Circuits, Anhui University, Hefei, 230000, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Anhui University, Hefei, 230000, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022900614","display_name":"F. Li","orcid":null},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"FuSen Li","raw_affiliation_strings":["School of Integrated Circuits, Anhui University, Hefei, 230000, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Anhui University, Hefei, 230000, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110376628","display_name":"Qiu Bo Xu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210153869","display_name":"Huaiyin Institute of Technology","ror":"https://ror.org/0555ezg60","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210153869"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiu Xu","raw_affiliation_strings":["The Faculty of Electronic Information Engineering, Huaiyin Institute of Technology, Huai\u2019an, 223003, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The Faculty of Electronic Information Engineering, Huaiyin Institute of Technology, Huai\u2019an, 223003, China","institution_ids":["https://openalex.org/I4210153869"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5060289682"],"corresponding_institution_ids":["https://openalex.org/I143868143"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":1.9593,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.85366649,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":"41","issue":"1","first_page":"75","last_page":"84"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.856620192527771},{"id":"https://openalex.org/keywords/dual","display_name":"Dual (grammatical number)","score":0.733604907989502},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.729387640953064},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5867698192596436},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5469451546669006},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.5234619975090027},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4848436117172241},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.4220430552959442},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4149891436100006},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3618152141571045},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.23025938868522644},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.047178059816360474}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.856620192527771},{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.733604907989502},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.729387640953064},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5867698192596436},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5469451546669006},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.5234619975090027},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4848436117172241},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.4220430552959442},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4149891436100006},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3618152141571045},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.23025938868522644},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.047178059816360474},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-025-06162-w","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-025-06162-w","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1094991663","display_name":null,"funder_award_id":"61574052","funder_id":"https://openalex.org/F4320315254","funder_display_name":"Innovative Research Group Project of the National Natural Science Foundation of China"},{"id":"https://openalex.org/G4464090465","display_name":null,"funder_award_id":"61674048","funder_id":"https://openalex.org/F4320315254","funder_display_name":"Innovative Research Group Project of the National Natural Science Foundation of China"},{"id":"https://openalex.org/G645093849","display_name":null,"funder_award_id":"61834006","funder_id":"https://openalex.org/F4320315254","funder_display_name":"Innovative Research Group Project of the National Natural Science Foundation of China"},{"id":"https://openalex.org/G692384645","display_name":null,"funder_award_id":"61904001","funder_id":"https://openalex.org/F4320315254","funder_display_name":"Innovative Research Group Project of the National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320315254","display_name":"Innovative Research Group Project of the National Natural Science Foundation of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1990714662","https://openalex.org/W2004701453","https://openalex.org/W2122512228","https://openalex.org/W2891370282","https://openalex.org/W2895000685","https://openalex.org/W3140688654","https://openalex.org/W3158728547","https://openalex.org/W3183195571","https://openalex.org/W3203657088","https://openalex.org/W3204601327","https://openalex.org/W4284886232","https://openalex.org/W4285282790","https://openalex.org/W4302376252","https://openalex.org/W4306293837","https://openalex.org/W4312836550","https://openalex.org/W4319297152","https://openalex.org/W4321608049","https://openalex.org/W4379116037","https://openalex.org/W4389443038"],"related_works":["https://openalex.org/W4392590355","https://openalex.org/W3151633427","https://openalex.org/W3006277082","https://openalex.org/W2610634993","https://openalex.org/W2081738003","https://openalex.org/W2097660413","https://openalex.org/W2943396510","https://openalex.org/W1967938402","https://openalex.org/W2386041993","https://openalex.org/W1608572506"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-28T23:10:05.387466","created_date":"2025-10-10T00:00:00"}