{"id":"https://openalex.org/W4403608145","doi":"https://doi.org/10.1007/s10836-024-06144-4","title":"Reliability Analysis for a GaAs LNA with Temperature Stress","display_name":"Reliability Analysis for a GaAs LNA with Temperature Stress","publication_year":2024,"publication_date":"2024-10-01","ids":{"openalex":"https://openalex.org/W4403608145","doi":"https://doi.org/10.1007/s10836-024-06144-4"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-024-06144-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-024-06144-4","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103000372","display_name":"Qian Lin","orcid":"https://orcid.org/0000-0002-7466-7313"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I134626604","display_name":"Jiujiang University","ror":"https://ror.org/0066vpg85","country_code":"CN","type":"education","lineage":["https://openalex.org/I134626604"]},{"id":"https://openalex.org/I116265982","display_name":"Qinghai University","ror":"https://ror.org/05h33bt13","country_code":"CN","type":"education","lineage":["https://openalex.org/I116265982"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Qian Lin","raw_affiliation_strings":["School of Electronic Science and Engineering, University of Electronic Science and Technology, Chengdu, 610000, China","School of Physics and Electronic Information Engineering, Qinghai Minzu University, Xining, 810007, China","Tong Fang Electronic Technology Company, JiuJiang, 332000, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering, University of Electronic Science and Technology, Chengdu, 610000, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"School of Physics and Electronic Information Engineering, Qinghai Minzu University, Xining, 810007, China","institution_ids":["https://openalex.org/I116265982"]},{"raw_affiliation_string":"Tong Fang Electronic Technology Company, JiuJiang, 332000, China","institution_ids":["https://openalex.org/I134626604"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068772710","display_name":"Mei\u2010Qian Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I116265982","display_name":"Qinghai University","ror":"https://ror.org/05h33bt13","country_code":"CN","type":"education","lineage":["https://openalex.org/I116265982"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mei-qian Wang","raw_affiliation_strings":["School of Physics and Electronic Information Engineering, Qinghai Minzu University, Xining, 810007, China"],"affiliations":[{"raw_affiliation_string":"School of Physics and Electronic Information Engineering, Qinghai Minzu University, Xining, 810007, China","institution_ids":["https://openalex.org/I116265982"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5103000372"],"corresponding_institution_ids":["https://openalex.org/I116265982","https://openalex.org/I134626604","https://openalex.org/I150229711"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16293742,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"40","issue":"5","first_page":"679","last_page":"687"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6965726613998413},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5917338132858276},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.5812731385231018},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4423024356365204},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3819476068019867},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3328288197517395},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3301395773887634},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30033621191978455},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.18802109360694885},{"id":"https://openalex.org/keywords/philosophy","display_name":"Philosophy","score":0.10794857144355774},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.07855907082557678},{"id":"https://openalex.org/keywords/linguistics","display_name":"Linguistics","score":0.07290422916412354}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6965726613998413},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5917338132858276},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.5812731385231018},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4423024356365204},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3819476068019867},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3328288197517395},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3301395773887634},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30033621191978455},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18802109360694885},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.10794857144355774},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.07855907082557678},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.07290422916412354},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-024-06144-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-024-06144-4","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.5699999928474426}],"awards":[{"id":"https://openalex.org/G2937307221","display_name":null,"funder_award_id":"62161046","funder_id":"https://openalex.org/F4320315254","funder_display_name":"Innovative Research Group Project of the National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320315254","display_name":"Innovative Research Group Project of the National Natural Science Foundation of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W611051045","https://openalex.org/W1566916904","https://openalex.org/W1979902459","https://openalex.org/W1987077795","https://openalex.org/W2011162985","https://openalex.org/W2045732425","https://openalex.org/W2051763811","https://openalex.org/W2525132400","https://openalex.org/W2549679969","https://openalex.org/W2895052017","https://openalex.org/W2900097626","https://openalex.org/W2910910663","https://openalex.org/W2974887698","https://openalex.org/W3118669529","https://openalex.org/W3131632681","https://openalex.org/W3137160922","https://openalex.org/W3147616483","https://openalex.org/W3156522799","https://openalex.org/W3210357306","https://openalex.org/W4285733318","https://openalex.org/W4288391501","https://openalex.org/W4290725523","https://openalex.org/W4316659907","https://openalex.org/W4388854048","https://openalex.org/W4390204198"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W3116237489","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}