{"id":"https://openalex.org/W4402878679","doi":"https://doi.org/10.1007/s10836-024-06135-5","title":"Interleaved Counter Matrix Code in SRAM Memories for Continuous Adjacent Multiple Bit Upset Correction","display_name":"Interleaved Counter Matrix Code in SRAM Memories for Continuous Adjacent Multiple Bit Upset Correction","publication_year":2024,"publication_date":"2024-09-27","ids":{"openalex":"https://openalex.org/W4402878679","doi":"https://doi.org/10.1007/s10836-024-06135-5"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-024-06135-5","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1007/s10836-024-06135-5","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001637955","display_name":"A. Ahilan","orcid":"https://orcid.org/0000-0001-9820-7058"},"institutions":[{"id":"https://openalex.org/I118826373","display_name":"Tirunelveli Medical College","ror":"https://ror.org/01c4srk95","country_code":"IN","type":"education","lineage":["https://openalex.org/I118826373"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Ahilan A","raw_affiliation_strings":["Department of Electronics and Communication Engineering, PSN College of Engineering and Technology, Tirunelveli, Tamil Nadu, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, PSN College of Engineering and Technology, Tirunelveli, Tamil Nadu, India","institution_ids":["https://openalex.org/I118826373"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069310916","display_name":"Anusha Gorantla","orcid":"https://orcid.org/0000-0001-7292-5086"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Anusha Gorantla","raw_affiliation_strings":["Department of Electronics and Communication Engineering, Raghu Engineering College, Visakhapatnam, Andhra Pradesh, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Raghu Engineering College, Visakhapatnam, Andhra Pradesh, India","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107514393","display_name":"Gladys Kiruba","orcid":null},"institutions":[{"id":"https://openalex.org/I4210096602","display_name":"Global College","ror":"https://ror.org/00q24dt49","country_code":"CY","type":"education","lineage":["https://openalex.org/I4210096602"]}],"countries":["CY"],"is_corresponding":false,"raw_author_name":"Gladys Kiruba","raw_affiliation_strings":["Bangalore College of Engineering and Technology, Chandapura, Bangaluru, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bangalore College of Engineering and Technology, Chandapura, Bangaluru, India","institution_ids":["https://openalex.org/I4210096602"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082267754","display_name":"Asmaa A. Hamad","orcid":"https://orcid.org/0000-0003-3946-0373"},"institutions":[{"id":"https://openalex.org/I179331831","display_name":"Taif University","ror":"https://ror.org/014g1a453","country_code":"SA","type":"education","lineage":["https://openalex.org/I179331831"]}],"countries":["SA"],"is_corresponding":false,"raw_author_name":"Asmaa A. Hamad","raw_affiliation_strings":["Department of Biology, College of Science, Taif University, P.O. Box 11099, Taif, 21944, Saudi Arabia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Biology, College of Science, Taif University, P.O. Box 11099, Taif, 21944, Saudi Arabia","institution_ids":["https://openalex.org/I179331831"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101570966","display_name":"Mohamed M. Hassan","orcid":"https://orcid.org/0000-0001-6307-462X"},"institutions":[{"id":"https://openalex.org/I179331831","display_name":"Taif University","ror":"https://ror.org/014g1a453","country_code":"SA","type":"education","lineage":["https://openalex.org/I179331831"]}],"countries":["SA"],"is_corresponding":false,"raw_author_name":"Mohamed M. Hassan","raw_affiliation_strings":["Department of Biology, College of Science, Taif University, P.O. Box 11099, Taif, 21944, Saudi Arabia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Biology, College of Science, Taif University, P.O. Box 11099, Taif, 21944, Saudi Arabia","institution_ids":["https://openalex.org/I179331831"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108093084","display_name":"N. Venkatram","orcid":null},"institutions":[{"id":"https://openalex.org/I875944469","display_name":"Koneru Lakshmaiah Education Foundation","ror":"https://ror.org/02k949197","country_code":"IN","type":"education","lineage":["https://openalex.org/I875944469"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Venkatram N.","raw_affiliation_strings":["Department of Electronics and Communication Engineering, Koneru Lakshmaiah Education Foundation, Green Fileds, Vaddeswaram, 522302, Andhra Pradesh, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Koneru Lakshmaiah Education Foundation, Green Fileds, Vaddeswaram, 522302, Andhra Pradesh, India","institution_ids":["https://openalex.org/I875944469"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089710051","display_name":"T. V. Sindhu","orcid":null},"institutions":[{"id":"https://openalex.org/I133769559","display_name":"Government Medical College","ror":"https://ror.org/016je1253","country_code":"IN","type":"education","lineage":["https://openalex.org/I133769559"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Sindhu T. V.","raw_affiliation_strings":["Departmenmt of Electronics and Communication Engineering, IES College of Engineering, Thrissur, Kerala, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Departmenmt of Electronics and Communication Engineering, IES College of Engineering, Thrissur, Kerala, India","institution_ids":["https://openalex.org/I133769559"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5001637955"],"corresponding_institution_ids":["https://openalex.org/I118826373"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15686031,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.7799761891365051},{"id":"https://openalex.org/keywords/bit","display_name":"Bit (key)","score":0.7331538200378418},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7286470532417297},{"id":"https://openalex.org/keywords/code","display_name":"Code (set theory)","score":0.5982466340065002},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.5610339641571045},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5173284411430359},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.4791916608810425},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.46486955881118774},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.38139617443084717},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3415769338607788},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.22582301497459412},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.1009712815284729},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.05824166536331177}],"concepts":[{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.7799761891365051},{"id":"https://openalex.org/C117011727","wikidata":"https://www.wikidata.org/wiki/Q1278488","display_name":"Bit (key)","level":2,"score":0.7331538200378418},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7286470532417297},{"id":"https://openalex.org/C2776760102","wikidata":"https://www.wikidata.org/wiki/Q5139990","display_name":"Code (set theory)","level":3,"score":0.5982466340065002},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.5610339641571045},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5173284411430359},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.4791916608810425},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.46486955881118774},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.38139617443084717},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3415769338607788},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.22582301497459412},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.1009712815284729},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.05824166536331177},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-024-06135-5","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1007/s10836-024-06135-5","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1494191847","https://openalex.org/W1644183923","https://openalex.org/W1980073965","https://openalex.org/W2011824410","https://openalex.org/W2093138466","https://openalex.org/W2103415152","https://openalex.org/W2137874240","https://openalex.org/W2291356006","https://openalex.org/W2303552178","https://openalex.org/W2547471450","https://openalex.org/W2767653459","https://openalex.org/W2805796447","https://openalex.org/W2980495448","https://openalex.org/W2980549095","https://openalex.org/W3002901217","https://openalex.org/W3008510117","https://openalex.org/W3020935962","https://openalex.org/W3155878339","https://openalex.org/W3188001099","https://openalex.org/W4213375449","https://openalex.org/W4307714145","https://openalex.org/W4376138125","https://openalex.org/W4397026444"],"related_works":["https://openalex.org/W2102538861","https://openalex.org/W2765704306","https://openalex.org/W2123934961","https://openalex.org/W1540420234","https://openalex.org/W2161646799","https://openalex.org/W2359969304","https://openalex.org/W3208260600","https://openalex.org/W2065552285","https://openalex.org/W2051386096","https://openalex.org/W2738785111"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-05-05T08:41:31.759640","created_date":"2025-10-10T00:00:00"}