{"id":"https://openalex.org/W4403075648","doi":"https://doi.org/10.1007/s10836-024-06132-8","title":"A Defect Detection Method of Mixed Wafer Map Using Neighborhood Path Filtering Clustering Algorithm","display_name":"A Defect Detection Method of Mixed Wafer Map Using Neighborhood Path Filtering Clustering Algorithm","publication_year":2024,"publication_date":"2024-08-01","ids":{"openalex":"https://openalex.org/W4403075648","doi":"https://doi.org/10.1007/s10836-024-06132-8"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-024-06132-8","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-024-06132-8","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070758885","display_name":"Xingna Hou","orcid":"https://orcid.org/0000-0002-4299-3544"},"institutions":[{"id":"https://openalex.org/I5343935","display_name":"Guilin University of Electronic Technology","ror":"https://ror.org/05arjae42","country_code":"CN","type":"education","lineage":["https://openalex.org/I5343935"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xingna Hou","raw_affiliation_strings":["Guangxi Key Laboratory of Automatic Detecting Technology and Instruments, School of Electronic Engineering & Automation, Guilin University of Electronic Technology, Guilin, 541004, China","School of Architecture and Transportation Engineering, Guilin University of Electronic Technology, Guilin, 541004, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Guangxi Key Laboratory of Automatic Detecting Technology and Instruments, School of Electronic Engineering & Automation, Guilin University of Electronic Technology, Guilin, 541004, China","institution_ids":["https://openalex.org/I5343935"]},{"raw_affiliation_string":"School of Architecture and Transportation Engineering, Guilin University of Electronic Technology, Guilin, 541004, China","institution_ids":["https://openalex.org/I5343935"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109794214","display_name":"Guanxiang Qin","orcid":null},"institutions":[{"id":"https://openalex.org/I5343935","display_name":"Guilin University of Electronic Technology","ror":"https://ror.org/05arjae42","country_code":"CN","type":"education","lineage":["https://openalex.org/I5343935"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guanxiang Qin","raw_affiliation_strings":["Guangxi Key Laboratory of Automatic Detecting Technology and Instruments, School of Electronic Engineering & Automation, Guilin University of Electronic Technology, Guilin, 541004, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Guangxi Key Laboratory of Automatic Detecting Technology and Instruments, School of Electronic Engineering & Automation, Guilin University of Electronic Technology, Guilin, 541004, China","institution_ids":["https://openalex.org/I5343935"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050828168","display_name":"Ying Lu","orcid":"https://orcid.org/0000-0002-3446-2188"},"institutions":[{"id":"https://openalex.org/I5343935","display_name":"Guilin University of Electronic Technology","ror":"https://ror.org/05arjae42","country_code":"CN","type":"education","lineage":["https://openalex.org/I5343935"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ying Lu","raw_affiliation_strings":["Guangxi Key Laboratory of Automatic Detecting Technology and Instruments, School of Electronic Engineering & Automation, Guilin University of Electronic Technology, Guilin, 541004, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Guangxi Key Laboratory of Automatic Detecting Technology and Instruments, School of Electronic Engineering & Automation, Guilin University of Electronic Technology, Guilin, 541004, China","institution_ids":["https://openalex.org/I5343935"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039097986","display_name":"Mulan Yi","orcid":null},"institutions":[{"id":"https://openalex.org/I5343935","display_name":"Guilin University of Electronic Technology","ror":"https://ror.org/05arjae42","country_code":"CN","type":"education","lineage":["https://openalex.org/I5343935"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mulan Yi","raw_affiliation_strings":["Guangxi Key Laboratory of Automatic Detecting Technology and Instruments, School of Electronic Engineering & Automation, Guilin University of Electronic Technology, Guilin, 541004, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Guangxi Key Laboratory of Automatic Detecting Technology and Instruments, School of Electronic Engineering & Automation, Guilin University of Electronic Technology, Guilin, 541004, China","institution_ids":["https://openalex.org/I5343935"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001809515","display_name":"Shouhong Chen","orcid":"https://orcid.org/0000-0002-4910-2978"},"institutions":[{"id":"https://openalex.org/I5343935","display_name":"Guilin University of Electronic Technology","ror":"https://ror.org/05arjae42","country_code":"CN","type":"education","lineage":["https://openalex.org/I5343935"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shouhong Chen","raw_affiliation_strings":["Guangxi Key Laboratory of Automatic Detecting Technology and Instruments, School of Electronic Engineering & Automation, Guilin University of Electronic Technology, Guilin, 541004, China"],"raw_orcid":"https://orcid.org/0000-0002-4910-2978","affiliations":[{"raw_affiliation_string":"Guangxi Key Laboratory of Automatic Detecting Technology and Instruments, School of Electronic Engineering & Automation, Guilin University of Electronic Technology, Guilin, 541004, China","institution_ids":["https://openalex.org/I5343935"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5070758885"],"corresponding_institution_ids":["https://openalex.org/I5343935"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":1.3306,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.83025778,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":"40","issue":"4","first_page":"419","last_page":"433"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.7378394603729248},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.7112370133399963},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.6956377625465393},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5276440382003784},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48956093192100525},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3005773425102234},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2819499671459198},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08825978636741638}],"concepts":[{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.7378394603729248},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.7112370133399963},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.6956377625465393},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5276440382003784},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48956093192100525},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3005773425102234},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2819499671459198},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08825978636741638},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-024-06132-8","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-024-06132-8","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2301589587","display_name":null,"funder_award_id":"No. 61661013","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6542007325","display_name":null,"funder_award_id":"2018GXNSFBA281175","funder_id":"https://openalex.org/F4320313613","funder_display_name":"Natural Science Foundation of Guangxi Zhuang Autonomous Region"}],"funders":[{"id":"https://openalex.org/F4320313613","display_name":"Natural Science Foundation of Guangxi Zhuang Autonomous Region","ror":null},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1987971958","https://openalex.org/W1991691583","https://openalex.org/W2005407075","https://openalex.org/W2020286945","https://openalex.org/W2030362328","https://openalex.org/W2066956616","https://openalex.org/W2104441235","https://openalex.org/W2764262416","https://openalex.org/W2798589477","https://openalex.org/W2920311927","https://openalex.org/W2922187519","https://openalex.org/W2929370848","https://openalex.org/W2958653816","https://openalex.org/W2970409000","https://openalex.org/W2975403694","https://openalex.org/W3008902695","https://openalex.org/W3041536290","https://openalex.org/W3107850185","https://openalex.org/W3134602793","https://openalex.org/W3169045948","https://openalex.org/W3201304935","https://openalex.org/W4221101697","https://openalex.org/W4225518185","https://openalex.org/W4253343410","https://openalex.org/W4311144991","https://openalex.org/W4312899448","https://openalex.org/W4362734521","https://openalex.org/W4377139221","https://openalex.org/W4378648357"],"related_works":["https://openalex.org/W2051487156","https://openalex.org/W2073681303","https://openalex.org/W1998662473","https://openalex.org/W2075391483","https://openalex.org/W2742348144","https://openalex.org/W2038820605","https://openalex.org/W1985417357","https://openalex.org/W2955207210","https://openalex.org/W2115053376","https://openalex.org/W2367528910"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":2}],"updated_date":"2026-04-25T08:17:42.794288","created_date":"2025-10-10T00:00:00"}