{"id":"https://openalex.org/W4400742396","doi":"https://doi.org/10.1007/s10836-024-06127-5","title":"ADC Dynamic Parameter Testing Scheme Under Relaxed Conditions","display_name":"ADC Dynamic Parameter Testing Scheme Under Relaxed Conditions","publication_year":2024,"publication_date":"2024-07-17","ids":{"openalex":"https://openalex.org/W4400742396","doi":"https://doi.org/10.1007/s10836-024-06127-5"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-024-06127-5","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-024-06127-5","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070997672","display_name":"Jun Yuan","orcid":null},"institutions":[{"id":"https://openalex.org/I10535382","display_name":"Chongqing University of Posts and Telecommunications","ror":"https://ror.org/03dgaqz26","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jun Yuan","raw_affiliation_strings":["College of Optoelectronics Engineering, Chongqing University of Posts and Telecommunications, Chongqing, 404100, China"],"raw_orcid":"https://orcid.org/0009-0009-2646-2581","affiliations":[{"raw_affiliation_string":"College of Optoelectronics Engineering, Chongqing University of Posts and Telecommunications, Chongqing, 404100, China","institution_ids":["https://openalex.org/I10535382"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100409565","display_name":"Yuyang Zhang","orcid":"https://orcid.org/0000-0001-9207-4039"},"institutions":[{"id":"https://openalex.org/I10535382","display_name":"Chongqing University of Posts and Telecommunications","ror":"https://ror.org/03dgaqz26","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuyang Zhang","raw_affiliation_strings":["College of Optoelectronics Engineering, Chongqing University of Posts and Telecommunications, Chongqing, 404100, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Optoelectronics Engineering, Chongqing University of Posts and Telecommunications, Chongqing, 404100, China","institution_ids":["https://openalex.org/I10535382"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112265020","display_name":"Liangrui Zhang","orcid":"https://orcid.org/0009-0003-8311-7924"},"institutions":[{"id":"https://openalex.org/I10535382","display_name":"Chongqing University of Posts and Telecommunications","ror":"https://ror.org/03dgaqz26","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liangrui Zhang","raw_affiliation_strings":["College of Optoelectronics Engineering, Chongqing University of Posts and Telecommunications, Chongqing, 404100, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Optoelectronics Engineering, Chongqing University of Posts and Telecommunications, Chongqing, 404100, China","institution_ids":["https://openalex.org/I10535382"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111260425","display_name":"Shuaiqi Hou","orcid":null},"institutions":[{"id":"https://openalex.org/I10535382","display_name":"Chongqing University of Posts and Telecommunications","ror":"https://ror.org/03dgaqz26","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuaiqi Hou","raw_affiliation_strings":["College of Optoelectronics Engineering, Chongqing University of Posts and Telecommunications, Chongqing, 404100, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Optoelectronics Engineering, Chongqing University of Posts and Telecommunications, Chongqing, 404100, China","institution_ids":["https://openalex.org/I10535382"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100565185","display_name":"Yu-Kun Han","orcid":null},"institutions":[{"id":"https://openalex.org/I10535382","display_name":"Chongqing University of Posts and Telecommunications","ror":"https://ror.org/03dgaqz26","country_code":"CN","type":"education","lineage":["https://openalex.org/I10535382"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yukun Han","raw_affiliation_strings":["College of Optoelectronics Engineering, Chongqing University of Posts and Telecommunications, Chongqing, 404100, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Optoelectronics Engineering, Chongqing University of Posts and Telecommunications, Chongqing, 404100, China","institution_ids":["https://openalex.org/I10535382"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5070997672"],"corresponding_institution_ids":["https://openalex.org/I10535382"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.6009,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.66900159,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":"40","issue":"4","first_page":"457","last_page":"468"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.6359550952911377},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41348016262054443},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.36012616753578186},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3211139440536499},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.29612940549850464},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24230334162712097},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.14814743399620056},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.0780627429485321}],"concepts":[{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.6359550952911377},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41348016262054443},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.36012616753578186},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3211139440536499},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.29612940549850464},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24230334162712097},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.14814743399620056},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0780627429485321},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-024-06127-5","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-024-06127-5","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1853635421","https://openalex.org/W1965831799","https://openalex.org/W1969647076","https://openalex.org/W2019457736","https://openalex.org/W2023077840","https://openalex.org/W2033694061","https://openalex.org/W2079865126","https://openalex.org/W2079866614","https://openalex.org/W2090917858","https://openalex.org/W2094815546","https://openalex.org/W2125253273","https://openalex.org/W2143950560","https://openalex.org/W2578010358","https://openalex.org/W2578654221","https://openalex.org/W3195551371","https://openalex.org/W4205746864","https://openalex.org/W4229804415","https://openalex.org/W4284671415","https://openalex.org/W4307280156"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052","https://openalex.org/W2382290278","https://openalex.org/W4395014643"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}