{"id":"https://openalex.org/W4393117985","doi":"https://doi.org/10.1007/s10836-024-06108-8","title":"A DfT Strategy for Guaranteeing ReRAM\u2019s Quality after Manufacturing","display_name":"A DfT Strategy for Guaranteeing ReRAM\u2019s Quality after Manufacturing","publication_year":2024,"publication_date":"2024-03-23","ids":{"openalex":"https://openalex.org/W4393117985","doi":"https://doi.org/10.1007/s10836-024-06108-8"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-024-06108-8","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-024-06108-8","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-024-06108-8.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://link.springer.com/content/pdf/10.1007/s10836-024-06108-8.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082898315","display_name":"T. Copetti","orcid":"https://orcid.org/0000-0001-7591-6484"},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"T. S. Copetti","raw_affiliation_strings":["IDS, RWTH Aachen University, Aachen, Germany"],"raw_orcid":"https://orcid.org/0000-0001-7591-6484","affiliations":[{"raw_affiliation_string":"IDS, RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014825211","display_name":"Moritz Fieback","orcid":"https://orcid.org/0000-0002-9782-393X"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"M. Fieback","raw_affiliation_strings":["Computer Engineering Laboratory, TU Delft, Delft, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Laboratory, TU Delft, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023628905","display_name":"Tobias Gemmeke","orcid":"https://orcid.org/0000-0003-1583-3411"},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"T. Gemmeke","raw_affiliation_strings":["IDS, RWTH Aachen University, Aachen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IDS, RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005739146","display_name":"Said Hamdioui","orcid":"https://orcid.org/0000-0002-8961-0387"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"S. Hamdioui","raw_affiliation_strings":["Computer Engineering Laboratory, TU Delft, Delft, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Laboratory, TU Delft, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050123960","display_name":"L. M. Bolzani Poehls","orcid":"https://orcid.org/0000-0002-6043-1713"},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"L. M. Bolzani Poehls","raw_affiliation_strings":["IDS, RWTH Aachen University, Aachen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IDS, RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5082898315"],"corresponding_institution_ids":["https://openalex.org/I887968799"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":{"value":2390,"currency":"EUR","value_usd":2990},"fwci":1.6023,"has_fulltext":true,"cited_by_count":8,"citation_normalized_percentile":{"value":0.82819073,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"40","issue":"2","first_page":"245","last_page":"257"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.7589674592018127},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5461044311523438},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4169406294822693},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20473229885101318},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.199604332447052},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12060844898223877}],"concepts":[{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.7589674592018127},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5461044311523438},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4169406294822693},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20473229885101318},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.199604332447052},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12060844898223877},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10836-024-06108-8","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-024-06108-8","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-024-06108-8.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:tudelft.nl:uuid:f515445b-f3a8-491e-9cf1-8cd3425455a8","is_oa":true,"landing_page_url":"http://resolver.tudelft.nl/uuid:f515445b-f3a8-491e-9cf1-8cd3425455a8","pdf_url":null,"source":{"id":"https://openalex.org/S4306400906","display_name":"Research Repository (Delft University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I98358874","host_organization_name":"Delft University of Technology","host_organization_lineage":["https://openalex.org/I98358874"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"journal article"}],"best_oa_location":{"id":"doi:10.1007/s10836-024-06108-8","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-024-06108-8","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-024-06108-8.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7799999713897705,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G2246319827","display_name":null,"funder_award_id":"16ES1134 and 16ES1133","funder_id":"https://openalex.org/F4320321114","funder_display_name":"Bundesministerium f\u00fcr Bildung und Forschung"},{"id":"https://openalex.org/G2874908358","display_name":null,"funder_award_id":"16ES1134","funder_id":"https://openalex.org/F4320321114","funder_display_name":"Bundesministerium f\u00fcr Bildung und Forschung"},{"id":"https://openalex.org/G3633006416","display_name":null,"funder_award_id":"16ES1133K","funder_id":"https://openalex.org/F4320321114","funder_display_name":"Bundesministerium f\u00fcr Bildung und Forschung"}],"funders":[{"id":"https://openalex.org/F4320315885","display_name":"Australian Government","ror":"https://ror.org/0314h5y94"},{"id":"https://openalex.org/F4320321114","display_name":"Bundesministerium f\u00fcr Bildung und Forschung","ror":"https://ror.org/04pz7b180"},{"id":"https://openalex.org/F4320324232","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34"}],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W4393117985.pdf"},"referenced_works_count":31,"referenced_works":["https://openalex.org/W1591621430","https://openalex.org/W1997009754","https://openalex.org/W2004823737","https://openalex.org/W2036850929","https://openalex.org/W2096997321","https://openalex.org/W2125223858","https://openalex.org/W2142704184","https://openalex.org/W2162651880","https://openalex.org/W2165911664","https://openalex.org/W2171751422","https://openalex.org/W2541366912","https://openalex.org/W2543458595","https://openalex.org/W2604267591","https://openalex.org/W2613051255","https://openalex.org/W2769029411","https://openalex.org/W2794194363","https://openalex.org/W2911925285","https://openalex.org/W2914881228","https://openalex.org/W2943934438","https://openalex.org/W3007474556","https://openalex.org/W3082899001","https://openalex.org/W3177243749","https://openalex.org/W3184531420","https://openalex.org/W3211176950","https://openalex.org/W4200136005","https://openalex.org/W4220791354","https://openalex.org/W4252884382","https://openalex.org/W4312372425","https://openalex.org/W4312534851","https://openalex.org/W4381746668","https://openalex.org/W4384026301"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2545245183","https://openalex.org/W2054635671","https://openalex.org/W2017425642","https://openalex.org/W2350916061","https://openalex.org/W1970117475","https://openalex.org/W3161624601","https://openalex.org/W2611512961","https://openalex.org/W2078381924","https://openalex.org/W4206468571"],"abstract_inverted_index":{"Abstract":[0],"Memristive":[1],"devices":[2,42,66],"have":[3],"become":[4],"promising":[5],"candidates":[6],"to":[7,13,30,45,97,150,163],"complement":[8],"the":[9,60,79,87,140,145,160,164,172,178,181],"CMOS":[10,15,56],"technology,":[11,57],"due":[12],"their":[14,28],"manufacturing":[16,46],"process":[17,175],"compatibility,":[18],"zero":[19],"standby":[20],"power":[21],"consumption,":[22],"high":[23],"scalability,":[24],"as":[25,27,169,171],"well":[26,170],"capability":[29,143],"implement":[31],"high-density":[32],"memories":[33],"and":[34,152],"new":[35,107],"computing":[36],"paradigms.":[37],"Despite":[38],"these":[39,64],"advantages,":[40],"memristive":[41],"are":[43],"susceptible":[44],"defects":[47],"that":[48,85],"may":[49],"cause":[50],"faulty":[51],"behaviors":[52],"not":[53,99],"observed":[54],"in":[55],"significantly":[58],"increasing":[59],"challenge":[61],"of":[62,81,90,117,144,174,180],"testing":[63],"novel":[65],"after":[67],"manufacturing.":[68],"This":[69],"work":[70],"proposes":[71],"an":[72],"optimized":[73],"Design-for-Testability":[74],"(DfT)":[75],"strategy":[76,147],"based":[77,126],"on":[78,127,177],"introduction":[80],"a":[82,113,118,128],"DfT":[83,108,165,183],"circuitry":[84,109,124],"measures":[86],"current":[88],"consumption":[89],"Resistive":[91],"Random":[92],"Access":[93],"Memory":[94],"(ReRAM)":[95],"cells":[96],"detect":[98],"only":[100],"traditional":[101,151],"but":[102],"also":[103],"unique":[104,153],"faults.":[105,154],"The":[106,136],"was":[110],"validated":[111],"using":[112],"case":[114],"study":[115],"composed":[116],"3x3":[119],"word-based":[120],"ReRAM":[121],"with":[122,148],"peripheral":[123],"implemented":[125],"130":[129],"nm":[130],"Predictive":[131],"Technology":[132],"Model":[133],"(PTM)":[134],"library.":[135],"obtained":[137],"results":[138],"demonstrate":[139],"fault":[141],"detection":[142],"proposed":[146,182],"respect":[149],"In":[155],"addition,":[156],"this":[157],"paper":[158],"evaluates":[159],"impact":[161,173],"related":[162],"circuitry\u2019s":[166],"introduced":[167],"overheads":[168],"variation":[176],"resolution":[179],"circuitry.":[184]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":2}],"updated_date":"2026-01-22T23:29:09.771500","created_date":"2025-10-10T00:00:00"}