{"id":"https://openalex.org/W4386292379","doi":"https://doi.org/10.1007/s10836-023-06077-4","title":"Efficient Test and Characterization of Space Transmit-Receive Modules Using Scalable and Multipurpose Automated Test System","display_name":"Efficient Test and Characterization of Space Transmit-Receive Modules Using Scalable and Multipurpose Automated Test System","publication_year":2023,"publication_date":"2023-08-01","ids":{"openalex":"https://openalex.org/W4386292379","doi":"https://doi.org/10.1007/s10836-023-06077-4"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-023-06077-4","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1007/s10836-023-06077-4","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032150893","display_name":"Vinod Chippalkatti","orcid":"https://orcid.org/0000-0001-8250-3725"},"institutions":[{"id":"https://openalex.org/I83737708","display_name":"REVA University","ror":"https://ror.org/03gtcxd54","country_code":"IN","type":"education","lineage":["https://openalex.org/I83737708"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Vinod S Chippalkatti","raw_affiliation_strings":["Centum Electronics Limited, Research Scholar REVA University, Bangalore, India"],"raw_orcid":"https://orcid.org/0000-0001-8250-3725","affiliations":[{"raw_affiliation_string":"Centum Electronics Limited, Research Scholar REVA University, Bangalore, India","institution_ids":["https://openalex.org/I83737708"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035932121","display_name":"Rajashekhar C. Biradar","orcid":"https://orcid.org/0000-0002-7029-6164"},"institutions":[{"id":"https://openalex.org/I83737708","display_name":"REVA University","ror":"https://ror.org/03gtcxd54","country_code":"IN","type":"education","lineage":["https://openalex.org/I83737708"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Rajashekhar C Biradar","raw_affiliation_strings":["Pro Vice Chancellor, REVA University, Bangalore, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pro Vice Chancellor, REVA University, Bangalore, India","institution_ids":["https://openalex.org/I83737708"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003356603","display_name":"Venkatesh Shenoy","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Venkatesh Shenoy","raw_affiliation_strings":["Centum Electronics Limited, Bangalore, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centum Electronics Limited, Bangalore, India","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078319770","display_name":"P. Udayakumar","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"P Udayakumar","raw_affiliation_strings":["Centum Electronics Limited, Bangalore, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Centum Electronics Limited, Bangalore, India","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5032150893"],"corresponding_institution_ids":["https://openalex.org/I83737708"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16837179,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"39","issue":"4","first_page":"501","last_page":"519"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11038","display_name":"Advanced SAR Imaging Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11038","display_name":"Advanced SAR Imaging Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10801","display_name":"Synthetic Aperture Radar (SAR) Applications and Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11946","display_name":"Antenna Design and Optimization","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.522459864616394},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5184475779533386},{"id":"https://openalex.org/keywords/integration-testing","display_name":"Integration testing","score":0.5114063620567322},{"id":"https://openalex.org/keywords/satellite","display_name":"Satellite","score":0.5033943057060242},{"id":"https://openalex.org/keywords/radar","display_name":"Radar","score":0.4841395318508148},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4675176441669464},{"id":"https://openalex.org/keywords/synthetic-aperture-radar","display_name":"Synthetic aperture radar","score":0.4665880501270294},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4659814238548279},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.43900150060653687},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.42680495977401733},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4208894371986389},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3717834949493408},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.36658865213394165},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.3554999828338623},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.14904218912124634},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.13405531644821167},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1148557960987091},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11131444573402405}],"concepts":[{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.522459864616394},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5184475779533386},{"id":"https://openalex.org/C107683887","wikidata":"https://www.wikidata.org/wiki/Q782466","display_name":"Integration testing","level":3,"score":0.5114063620567322},{"id":"https://openalex.org/C19269812","wikidata":"https://www.wikidata.org/wiki/Q26540","display_name":"Satellite","level":2,"score":0.5033943057060242},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.4841395318508148},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4675176441669464},{"id":"https://openalex.org/C87360688","wikidata":"https://www.wikidata.org/wiki/Q740686","display_name":"Synthetic aperture radar","level":2,"score":0.4665880501270294},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4659814238548279},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.43900150060653687},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.42680495977401733},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4208894371986389},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3717834949493408},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.36658865213394165},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.3554999828338623},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.14904218912124634},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.13405531644821167},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1148557960987091},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11131444573402405},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-023-06077-4","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1007/s10836-023-06077-4","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4300000071525574,"id":"https://metadata.un.org/sdg/8","display_name":"Decent work and economic growth"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W605247810","https://openalex.org/W1603934303","https://openalex.org/W1890924153","https://openalex.org/W1980028389","https://openalex.org/W1994527370","https://openalex.org/W2004915310","https://openalex.org/W2009281185","https://openalex.org/W2079299474","https://openalex.org/W2089487107","https://openalex.org/W2091543021","https://openalex.org/W2107998695","https://openalex.org/W2111446932","https://openalex.org/W2112392595","https://openalex.org/W2134916734","https://openalex.org/W2142270012","https://openalex.org/W2151311093","https://openalex.org/W2152183234","https://openalex.org/W2152443592","https://openalex.org/W2163308397","https://openalex.org/W2527708832","https://openalex.org/W2624927446","https://openalex.org/W2761438046","https://openalex.org/W2819321583","https://openalex.org/W2904237471","https://openalex.org/W3003209402","https://openalex.org/W3005922711","https://openalex.org/W3023457471","https://openalex.org/W3088923814","https://openalex.org/W3111756128","https://openalex.org/W3135364067","https://openalex.org/W3137590670","https://openalex.org/W3149087707","https://openalex.org/W4205282357","https://openalex.org/W4213333890","https://openalex.org/W4235485909","https://openalex.org/W4235850210","https://openalex.org/W4283361703"],"related_works":["https://openalex.org/W2389214306","https://openalex.org/W2965083567","https://openalex.org/W4235240664","https://openalex.org/W1838576100","https://openalex.org/W2757182831","https://openalex.org/W2095886385","https://openalex.org/W2089704382","https://openalex.org/W1983399550","https://openalex.org/W97075385","https://openalex.org/W4385626050"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-12-24T23:09:58.560324","created_date":"2025-10-10T00:00:00"}