{"id":"https://openalex.org/W4361209820","doi":"https://doi.org/10.1007/s10836-023-06059-6","title":"Light Emission Tracking and Measurements for Analog Circuits Fault Diagnosis in Automotive Applications","display_name":"Light Emission Tracking and Measurements for Analog Circuits Fault Diagnosis in Automotive Applications","publication_year":2023,"publication_date":"2023-03-28","ids":{"openalex":"https://openalex.org/W4361209820","doi":"https://doi.org/10.1007/s10836-023-06059-6"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-023-06059-6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-023-06059-6","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal.science/hal-04104038","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027845735","display_name":"Tommaso Melis","orcid":"https://orcid.org/0000-0002-4380-6958"},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Tommaso Melis","raw_affiliation_strings":["STMicroelectronics Grenoble, Grenoble, France","ST-GRENOBLE - STMicroelectronics [Grenoble] (12 r Jules Horowitz 38000 Grenoble - France)"],"raw_orcid":"https://orcid.org/0000-0002-4380-6958","affiliations":[{"raw_affiliation_string":"STMicroelectronics Grenoble, Grenoble, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"ST-GRENOBLE - STMicroelectronics [Grenoble] (12 r Jules Horowitz 38000 Grenoble - France)","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041963235","display_name":"Emmanuel Simeu","orcid":"https://orcid.org/0000-0001-7649-3225"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Emmanuel Simeu","raw_affiliation_strings":["CNRS, Grenoble Institute of Engineering Univ. Grenoble Alpes, Univ. Grenoble Alpes, TIMA , Grenoble, France","TIMA-RMS - Reliable RF and Mixed-signal Systems (Laboratoire TIMA, 46, avenue F\u00e9lix Viallet - 38031 GRENOBLE Cedex - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNRS, Grenoble Institute of Engineering Univ. Grenoble Alpes, Univ. Grenoble Alpes, TIMA , Grenoble, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I899635006"]},{"raw_affiliation_string":"TIMA-RMS - Reliable RF and Mixed-signal Systems (Laboratoire TIMA, 46, avenue F\u00e9lix Viallet - 38031 GRENOBLE Cedex - France)","institution_ids":["https://openalex.org/I4210087012"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074769604","display_name":"Etienne Auvray","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Etienne Auvray","raw_affiliation_strings":["Fastnet Technologies, Grenoble, France","Fastnet-technologies (359 rue du Fayard - 38850 CHARAVINES - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fastnet Technologies, Grenoble, France","institution_ids":[]},{"raw_affiliation_string":"Fastnet-technologies (359 rue du Fayard - 38850 CHARAVINES - France)","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070393492","display_name":"Luc Saury","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Luc Saury","raw_affiliation_strings":["STMicroelectronics Grenoble, Grenoble, France","ST-GRENOBLE - STMicroelectronics [Grenoble] (12 r Jules Horowitz 38000 Grenoble - France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics Grenoble, Grenoble, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"ST-GRENOBLE - STMicroelectronics [Grenoble] (12 r Jules Horowitz 38000 Grenoble - France)","institution_ids":["https://openalex.org/I4210104693"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5027845735"],"corresponding_institution_ids":["https://openalex.org/I4210104693"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.6322,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.66528601,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":"39","issue":"2","first_page":"171","last_page":"187"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6691153049468994},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.6400008797645569},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.6310442686080933},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5823695063591003},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.5022327899932861},{"id":"https://openalex.org/keywords/tracking","display_name":"Tracking (education)","score":0.49906253814697266},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4913536608219147},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4911048412322998},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.47567668557167053},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46318650245666504},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4344158470630646},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.42537957429885864},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3931504189968109},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3645577132701874}],"concepts":[{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6691153049468994},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.6400008797645569},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.6310442686080933},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5823695063591003},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.5022327899932861},{"id":"https://openalex.org/C2775936607","wikidata":"https://www.wikidata.org/wiki/Q466845","display_name":"Tracking (education)","level":2,"score":0.49906253814697266},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4913536608219147},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4911048412322998},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47567668557167053},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46318650245666504},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4344158470630646},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.42537957429885864},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3931504189968109},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3645577132701874},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C19417346","wikidata":"https://www.wikidata.org/wiki/Q7922","display_name":"Pedagogy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10836-023-06059-6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-023-06059-6","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-04104038v1","is_oa":true,"landing_page_url":"https://hal.science/hal-04104038","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc","license_id":"https://openalex.org/licenses/cc-by-nc","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Electronic Testing: : Theory and Applications, 2023, ⟨10.1007/s10836-023-06059-6⟩","raw_type":"Journal articles"}],"best_oa_location":{"id":"pmh:oai:HAL:hal-04104038v1","is_oa":true,"landing_page_url":"https://hal.science/hal-04104038","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc","license_id":"https://openalex.org/licenses/cc-by-nc","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Electronic Testing: : Theory and Applications, 2023, ⟨10.1007/s10836-023-06059-6⟩","raw_type":"Journal articles"},"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.6000000238418579,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W2021756047","https://openalex.org/W2066058136","https://openalex.org/W2070735288","https://openalex.org/W2083930772","https://openalex.org/W2108213084","https://openalex.org/W2138476745","https://openalex.org/W2142226448","https://openalex.org/W2156131017","https://openalex.org/W2475725815","https://openalex.org/W2533503170","https://openalex.org/W2743749706","https://openalex.org/W2759984182","https://openalex.org/W2789290713","https://openalex.org/W2967540737","https://openalex.org/W2993683877","https://openalex.org/W3007644171","https://openalex.org/W3041386436","https://openalex.org/W3045547591","https://openalex.org/W3048170192","https://openalex.org/W3095446101","https://openalex.org/W3115209132","https://openalex.org/W3115897990","https://openalex.org/W3123671483","https://openalex.org/W3159036604","https://openalex.org/W4200233482"],"related_works":["https://openalex.org/W4382644535","https://openalex.org/W2522768275","https://openalex.org/W2352938035","https://openalex.org/W2342962602","https://openalex.org/W2384619159","https://openalex.org/W3215142653","https://openalex.org/W2359769514","https://openalex.org/W1487051936","https://openalex.org/W2375192119","https://openalex.org/W4318953393"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":4}],"updated_date":"2026-05-07T13:39:58.223016","created_date":"2025-10-10T00:00:00"}