{"id":"https://openalex.org/W4360982613","doi":"https://doi.org/10.1007/s10836-023-06058-7","title":"On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits","display_name":"On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits","publication_year":2023,"publication_date":"2023-03-27","ids":{"openalex":"https://openalex.org/W4360982613","doi":"https://doi.org/10.1007/s10836-023-06058-7"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-023-06058-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-023-06058-7","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-04080259/document","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076321673","display_name":"Hassan El Badawi","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"H. El Badawi","raw_affiliation_strings":["NXP Semiconductors, 2 Esplanade Anton Phillips, 14000, Caen, France","University of Montpellier, CNRS, LIRMM, 161 rue Ada, 34095, Montpellier Cedex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, 2 Esplanade Anton Phillips, 14000, Caen, France","institution_ids":[]},{"raw_affiliation_string":"University of Montpellier, CNRS, LIRMM, 161 rue Ada, 34095, Montpellier Cedex, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040698879","display_name":"F. Aza\u0131\u0308s","orcid":"https://orcid.org/0000-0001-6458-5018"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"F. Azais","raw_affiliation_strings":["University of Montpellier, CNRS, LIRMM, 161 rue Ada, 34095, Montpellier Cedex, France"],"raw_orcid":"https://orcid.org/0000-0001-6458-5018","affiliations":[{"raw_affiliation_string":"University of Montpellier, CNRS, LIRMM, 161 rue Ada, 34095, Montpellier Cedex, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008580581","display_name":"Serge Bernard","orcid":"https://orcid.org/0000-0003-1772-0592"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"S. Bernard","raw_affiliation_strings":["University of Montpellier, CNRS, LIRMM, 161 rue Ada, 34095, Montpellier Cedex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Montpellier, CNRS, LIRMM, 161 rue Ada, 34095, Montpellier Cedex, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105465086","display_name":"Mariane Comte","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"M. Comte","raw_affiliation_strings":["University of Montpellier, CNRS, LIRMM, 161 rue Ada, 34095, Montpellier Cedex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Montpellier, CNRS, LIRMM, 161 rue Ada, 34095, Montpellier Cedex, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074570300","display_name":"Vincent Kerz\u00e9rho","orcid":"https://orcid.org/0000-0002-4387-0976"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"V. Kerzerho","raw_affiliation_strings":["University of Montpellier, CNRS, LIRMM, 161 rue Ada, 34095, Montpellier Cedex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Montpellier, CNRS, LIRMM, 161 rue Ada, 34095, Montpellier Cedex, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101772674","display_name":"F. Lef\u00e8vre","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"F. Lefevre","raw_affiliation_strings":["NXP Semiconductors, 2 Esplanade Anton Phillips, 14000, Caen, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, 2 Esplanade Anton Phillips, 14000, Caen, France","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5076321673"],"corresponding_institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210101743"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.02529331,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"39","issue":"2","first_page":"155","last_page":"170"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9884999990463257,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.6818902492523193},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6761036515235901},{"id":"https://openalex.org/keywords/transmitter","display_name":"Transmitter","score":0.6760522723197937},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6090505719184875},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.5804985761642456},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.5747027397155762},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5397343039512634},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.5269114375114441},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.508300244808197},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4594285488128662},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.45224910974502563},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.40334880352020264},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3649337887763977},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3325677812099457},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.16859745979309082}],"concepts":[{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.6818902492523193},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6761036515235901},{"id":"https://openalex.org/C47798520","wikidata":"https://www.wikidata.org/wiki/Q190157","display_name":"Transmitter","level":3,"score":0.6760522723197937},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6090505719184875},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.5804985761642456},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.5747027397155762},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5397343039512634},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.5269114375114441},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.508300244808197},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4594285488128662},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.45224910974502563},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.40334880352020264},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3649337887763977},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3325677812099457},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.16859745979309082},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10836-023-06058-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-023-06058-7","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:HAL:lirmm-04080259v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-04080259","pdf_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-04080259/document","source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Electronic Testing: : Theory and Applications, 2023, 39, pp.155-170. ⟨10.1007/s10836-023-06058-7⟩","raw_type":"Journal articles"}],"best_oa_location":{"id":"pmh:oai:HAL:lirmm-04080259v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-04080259","pdf_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-04080259/document","source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Electronic Testing: : Theory and Applications, 2023, 39, pp.155-170. ⟨10.1007/s10836-023-06058-7⟩","raw_type":"Journal articles"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.4399999976158142,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4360982613.pdf"},"referenced_works_count":18,"referenced_works":["https://openalex.org/W1554942119","https://openalex.org/W1964067494","https://openalex.org/W1999942519","https://openalex.org/W2006181671","https://openalex.org/W2081079037","https://openalex.org/W2108939487","https://openalex.org/W2116080338","https://openalex.org/W2119203614","https://openalex.org/W2148277175","https://openalex.org/W2148851402","https://openalex.org/W2171462217","https://openalex.org/W2344193394","https://openalex.org/W2347050280","https://openalex.org/W2523343773","https://openalex.org/W2810471131","https://openalex.org/W2943321724","https://openalex.org/W2954967212","https://openalex.org/W4200197442"],"related_works":["https://openalex.org/W4316095964","https://openalex.org/W2383001583","https://openalex.org/W2355663289","https://openalex.org/W2131084560","https://openalex.org/W2771395446","https://openalex.org/W2106913410","https://openalex.org/W4380372336","https://openalex.org/W2354248671","https://openalex.org/W3112038843","https://openalex.org/W2359134391"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-05-07T13:39:58.223016","created_date":"2023-03-30T00:00:00"}