{"id":"https://openalex.org/W4367301588","doi":"https://doi.org/10.1007/s10836-023-06054-x","title":"Hardware Trojan Detection Method Based on Dual Discriminator Assisted Conditional Generation Adversarial Network","display_name":"Hardware Trojan Detection Method Based on Dual Discriminator Assisted Conditional Generation Adversarial Network","publication_year":2023,"publication_date":"2023-04-01","ids":{"openalex":"https://openalex.org/W4367301588","doi":"https://doi.org/10.1007/s10836-023-06054-x"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-023-06054-x","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-023-06054-x","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-023-06054-x.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://link.springer.com/content/pdf/10.1007/s10836-023-06054-x.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074674627","display_name":"Wenjing Tang","orcid":"https://orcid.org/0000-0001-9789-0908"},"institutions":[{"id":"https://openalex.org/I132369690","display_name":"Tianjin University of Science and Technology","ror":"https://ror.org/018rbtf37","country_code":"CN","type":"education","lineage":["https://openalex.org/I132369690"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Wenjing Tang","raw_affiliation_strings":["Artificial Intelligence Academy, Tianjin University of Science and Technology, TianJin, 300457, China"],"raw_orcid":"https://orcid.org/0000-0001-9789-0908","affiliations":[{"raw_affiliation_string":"Artificial Intelligence Academy, Tianjin University of Science and Technology, TianJin, 300457, China","institution_ids":["https://openalex.org/I132369690"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085364708","display_name":"Jing Su","orcid":"https://orcid.org/0000-0002-7704-1025"},"institutions":[{"id":"https://openalex.org/I132369690","display_name":"Tianjin University of Science and Technology","ror":"https://ror.org/018rbtf37","country_code":"CN","type":"education","lineage":["https://openalex.org/I132369690"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Su","raw_affiliation_strings":["Artificial Intelligence Academy, Tianjin University of Science and Technology, TianJin, 300457, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Artificial Intelligence Academy, Tianjin University of Science and Technology, TianJin, 300457, China","institution_ids":["https://openalex.org/I132369690"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024758498","display_name":"Yuchan Gao","orcid":"https://orcid.org/0000-0002-1504-8416"},"institutions":[{"id":"https://openalex.org/I132369690","display_name":"Tianjin University of Science and Technology","ror":"https://ror.org/018rbtf37","country_code":"CN","type":"education","lineage":["https://openalex.org/I132369690"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuchan Gao","raw_affiliation_strings":["Artificial Intelligence Academy, Tianjin University of Science and Technology, TianJin, 300457, China"],"raw_orcid":"https://orcid.org/0000-0002-1504-8416","affiliations":[{"raw_affiliation_string":"Artificial Intelligence Academy, Tianjin University of Science and Technology, TianJin, 300457, China","institution_ids":["https://openalex.org/I132369690"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5074674627"],"corresponding_institution_ids":["https://openalex.org/I132369690"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":{"value":2390,"currency":"EUR","value_usd":2990},"fwci":2.6932,"has_fulltext":true,"cited_by_count":9,"citation_normalized_percentile":{"value":0.89622066,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":98},"biblio":{"volume":"39","issue":"2","first_page":"129","last_page":"140"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hardware-trojan","display_name":"Hardware Trojan","score":0.8690844774246216},{"id":"https://openalex.org/keywords/trojan","display_name":"Trojan","score":0.8611547350883484},{"id":"https://openalex.org/keywords/discriminator","display_name":"Discriminator","score":0.8204819560050964},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6505058407783508},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.535908043384552},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.5334473252296448},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.443963885307312},{"id":"https://openalex.org/keywords/fuze","display_name":"Fuze","score":0.43752214312553406},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.15176069736480713},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.10703721642494202}],"concepts":[{"id":"https://openalex.org/C2780873074","wikidata":"https://www.wikidata.org/wiki/Q5656397","display_name":"Hardware Trojan","level":3,"score":0.8690844774246216},{"id":"https://openalex.org/C174333608","wikidata":"https://www.wikidata.org/wiki/Q19635","display_name":"Trojan","level":2,"score":0.8611547350883484},{"id":"https://openalex.org/C2779803651","wikidata":"https://www.wikidata.org/wiki/Q5282088","display_name":"Discriminator","level":3,"score":0.8204819560050964},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6505058407783508},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.535908043384552},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.5334473252296448},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.443963885307312},{"id":"https://openalex.org/C2780338983","wikidata":"https://www.wikidata.org/wiki/Q3778724","display_name":"Fuze","level":2,"score":0.43752214312553406},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.15176069736480713},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.10703721642494202},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-023-06054-x","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-023-06054-x","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-023-06054-x.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1007/s10836-023-06054-x","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-023-06054-x","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-023-06054-x.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.699999988079071,"id":"https://metadata.un.org/sdg/10","display_name":"Reduced inequalities"}],"awards":[{"id":"https://openalex.org/G5359115714","display_name":null,"funder_award_id":"19JCYBJC15300","funder_id":"https://openalex.org/F4320323993","funder_display_name":"Natural Science Foundation of Tianjin City"},{"id":"https://openalex.org/G7876046735","display_name":null,"funder_award_id":"No. 19JCYBJC15300","funder_id":"https://openalex.org/F4320323993","funder_display_name":"Natural Science Foundation of Tianjin City"}],"funders":[{"id":"https://openalex.org/F4320323993","display_name":"Natural Science Foundation of Tianjin City","ror":null}],"has_content":{"grobid_xml":false,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4367301588.pdf"},"referenced_works_count":25,"referenced_works":["https://openalex.org/W2075187070","https://openalex.org/W2109894721","https://openalex.org/W2273745200","https://openalex.org/W2588293441","https://openalex.org/W2756182389","https://openalex.org/W2765811365","https://openalex.org/W2768690687","https://openalex.org/W2786310868","https://openalex.org/W2805199763","https://openalex.org/W2905755717","https://openalex.org/W2906523457","https://openalex.org/W2911617582","https://openalex.org/W2912425510","https://openalex.org/W2913776665","https://openalex.org/W2921353139","https://openalex.org/W2972326188","https://openalex.org/W3000011546","https://openalex.org/W3007969083","https://openalex.org/W3022606336","https://openalex.org/W3094822497","https://openalex.org/W3159333627","https://openalex.org/W3197913445","https://openalex.org/W4200154404","https://openalex.org/W4391731596","https://openalex.org/W7104005100"],"related_works":["https://openalex.org/W4385434494","https://openalex.org/W3159333627","https://openalex.org/W3004467197","https://openalex.org/W1500594134","https://openalex.org/W2091750459","https://openalex.org/W2999465529","https://openalex.org/W3084939900","https://openalex.org/W2382172865","https://openalex.org/W1526642037","https://openalex.org/W4321062229"],"abstract_inverted_index":{"Abstract":[0],"Hardware":[1],"Trojans":[2],"are":[3],"usually":[4],"implanted":[5,179],"by":[6],"making":[7],"malicious":[8],"changes":[9],"to":[10,48,147],"a":[11,90,95,117],"chip":[12,17,64,183],"circuit,":[13],"which":[14,104,213],"can":[15,115,127,210],"destroy":[16],"functions":[18],"or":[19],"expose":[20],"sensitive":[21],"information":[22,34,71,77,121,167],"once":[23],"activated.":[24],"The":[25,195,225],"hardware":[26,136,140,170,176,206,241],"Trojan":[27,137,141,171,177,207,242],"detection":[28,44,91,201,218],"method":[29,92,192],"based":[30,93,220],"on":[31,94,221],"side":[32,75,130,165],"channel":[33,76,131,166],"has":[35],"now":[36],"become":[37],"one":[38],"of":[39,51,54,61,69,72,108,119,122,151,203,237],"the":[40,49,52,55,59,62,73,80,85,106,123,143,149,152,157,174,199,204,217,230],"most":[41],"widely":[42],"used":[43],"methods.":[45],"However,":[46],"due":[47],"influence":[50],"deviation":[53],"acquisition":[56,68],"equipment":[57],"and":[58,111,114,134,138,160,169,190,232,240],"noise":[60],"actual":[63],"working":[65],"environment,":[66],"insufficient":[67],"useful":[70],"collected":[74],"occurs,":[78],"affecting":[79],"final":[81],"results.":[82],"To":[83],"address":[84],"problem,":[86],"this":[87],"paper":[88],"proposes":[89],"dual":[96],"discriminator":[97],"assisted":[98],"conditional":[99],"generation":[100],"adversarial":[101],"network":[102],"(D2ACGAN),":[103],"combines":[105],"benefits":[107],"CGAN,":[109],"ACGAN,":[110],"D2GAN":[112],"models":[113,162,219,234],"learn":[116],"variety":[118],"valid":[120],"tested":[124],"chip.":[125],"It":[126],"distinguish":[128],"between":[129],"data":[132,186,239],"with":[133],"without":[135],"classify":[139],"using":[142],"extended":[144],"data.":[145],"Furthermore,":[146],"compare":[148],"performance":[150,193],"proposed":[153],"model,":[154],"we":[155],"use":[156],"existing":[158],"CGAN":[159,231],"ACGAN":[161,233],"equally":[163],"for":[164,184],"expansion":[168],"detection.":[172],"Finally,":[173],"designed":[175],"is":[178,214],"in":[180,235],"an":[181],"encryption":[182],"generating":[185],"quality":[187],"evaluation":[188],"experiments":[189],"model":[191,209,227],"experiments.":[194],"results":[196],"show":[197],"that":[198],"average":[200],"accuracy":[202],"D2ACGAN-based":[205],"classification":[208],"reach":[211],"97.08%,":[212],"better":[215],"than":[216],"CNN,":[222],"SVM,":[223],"etc.":[224],"D2ACGAN":[226],"also":[228],"outperforms":[229],"terms":[236],"generated":[238],"classification.":[243]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":6}],"updated_date":"2025-12-24T23:09:58.560324","created_date":"2025-10-10T00:00:00"}