{"id":"https://openalex.org/W4306250959","doi":"https://doi.org/10.1007/s10836-022-06025-8","title":"Using both Stable and Unstable SRAM Bits for the Physical Unclonable Function","display_name":"Using both Stable and Unstable SRAM Bits for the Physical Unclonable Function","publication_year":2022,"publication_date":"2022-10-01","ids":{"openalex":"https://openalex.org/W4306250959","doi":"https://doi.org/10.1007/s10836-022-06025-8"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-022-06025-8","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-022-06025-8","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007490967","display_name":"Zhi-Wei Lai","orcid":null},"institutions":[{"id":"https://openalex.org/I901624438","display_name":"Realtek (Taiwan)","ror":"https://ror.org/05x1ffr83","country_code":"TW","type":"company","lineage":["https://openalex.org/I901624438"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Zhi-Wei Lai","raw_affiliation_strings":["RealTech, Inc, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"RealTech, Inc, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I901624438"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078192257","display_name":"Po-Hua Huang","orcid":"https://orcid.org/0000-0003-3526-7971"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Po-Hua Huang","raw_affiliation_strings":["Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079657769","display_name":"Kuen-Jong Lee","orcid":"https://orcid.org/0000-0002-6690-0074"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Kuen-Jong Lee","raw_affiliation_strings":["Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5007490967"],"corresponding_institution_ids":["https://openalex.org/I901624438"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.12081751,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"38","issue":"5","first_page":"511","last_page":"525"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.984499990940094,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8915412425994873},{"id":"https://openalex.org/keywords/physical-unclonable-function","display_name":"Physical unclonable function","score":0.7708548307418823},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4909999668598175},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4725703299045563},{"id":"https://openalex.org/keywords/randomness","display_name":"Randomness","score":0.46158722043037415},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3681927025318146},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.3670896887779236},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.36016416549682617},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3188839852809906},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13374093174934387},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1308671236038208},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.07647189497947693}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8915412425994873},{"id":"https://openalex.org/C8643368","wikidata":"https://www.wikidata.org/wiki/Q4046262","display_name":"Physical unclonable function","level":3,"score":0.7708548307418823},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4909999668598175},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4725703299045563},{"id":"https://openalex.org/C125112378","wikidata":"https://www.wikidata.org/wiki/Q176640","display_name":"Randomness","level":2,"score":0.46158722043037415},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3681927025318146},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.3670896887779236},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.36016416549682617},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3188839852809906},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13374093174934387},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1308671236038208},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.07647189497947693},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-022-06025-8","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-022-06025-8","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5813336114","display_name":null,"funder_award_id":"107-2218-E-006-025","funder_id":"https://openalex.org/F4320322795","funder_display_name":"Ministry of Science and Technology, Taiwan"}],"funders":[{"id":"https://openalex.org/F4320322795","display_name":"Ministry of Science and Technology, Taiwan","ror":"https://ror.org/02kv4zf79"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W18598421","https://openalex.org/W1963105592","https://openalex.org/W1964495050","https://openalex.org/W1968261083","https://openalex.org/W1974113657","https://openalex.org/W1995871244","https://openalex.org/W2001067488","https://openalex.org/W2030523841","https://openalex.org/W2088455835","https://openalex.org/W2115255494","https://openalex.org/W2126602129","https://openalex.org/W2128111793","https://openalex.org/W2128892159","https://openalex.org/W2503423162","https://openalex.org/W2580334840","https://openalex.org/W2743953760","https://openalex.org/W2791198567","https://openalex.org/W2896567149","https://openalex.org/W2911646619","https://openalex.org/W2931380630","https://openalex.org/W2960336640","https://openalex.org/W2963713773","https://openalex.org/W2971497454","https://openalex.org/W2971643716","https://openalex.org/W3000321213","https://openalex.org/W3127410051","https://openalex.org/W3149255541","https://openalex.org/W4281862159"],"related_works":["https://openalex.org/W3034924094","https://openalex.org/W4386278306","https://openalex.org/W2981906196","https://openalex.org/W3094954546","https://openalex.org/W1513698804","https://openalex.org/W4310560702","https://openalex.org/W2029712093","https://openalex.org/W2775062502","https://openalex.org/W2302863414","https://openalex.org/W4385196433"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}