{"id":"https://openalex.org/W4293770733","doi":"https://doi.org/10.1007/s10836-022-06020-z","title":"Automated Design Error Debugging of Digital VLSI Circuits","display_name":"Automated Design Error Debugging of Digital VLSI Circuits","publication_year":2022,"publication_date":"2022-08-01","ids":{"openalex":"https://openalex.org/W4293770733","doi":"https://doi.org/10.1007/s10836-022-06020-z"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-022-06020-z","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-022-06020-z","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-022-06020-z.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://link.springer.com/content/pdf/10.1007/s10836-022-06020-z.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075210098","display_name":"Mohammed Moness","orcid":"https://orcid.org/0000-0002-8042-0253"},"institutions":[{"id":"https://openalex.org/I89466785","display_name":"Minia University","ror":"https://ror.org/02hcv4z63","country_code":"EG","type":"education","lineage":["https://openalex.org/I89466785"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Mohammed Moness","raw_affiliation_strings":["Computers and Systems Eng. Dept, Minia University, Minia, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computers and Systems Eng. Dept, Minia University, Minia, Egypt","institution_ids":["https://openalex.org/I89466785"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038437877","display_name":"Lamya Gaber","orcid":"https://orcid.org/0000-0002-1843-702X"},"institutions":[{"id":"https://openalex.org/I89466785","display_name":"Minia University","ror":"https://ror.org/02hcv4z63","country_code":"EG","type":"education","lineage":["https://openalex.org/I89466785"]}],"countries":["EG"],"is_corresponding":true,"raw_author_name":"Lamya Gaber","raw_affiliation_strings":["Computers and Systems Eng. Dept, Minia University, Minia, Egypt"],"raw_orcid":"https://orcid.org/0000-0002-1843-702X","affiliations":[{"raw_affiliation_string":"Computers and Systems Eng. Dept, Minia University, Minia, Egypt","institution_ids":["https://openalex.org/I89466785"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003490280","display_name":"Aziza I. Hussein","orcid":"https://orcid.org/0000-0001-9610-395X"},"institutions":[{"id":"https://openalex.org/I125656591","display_name":"Effat University","ror":"https://ror.org/02cnwgt19","country_code":"SA","type":"education","lineage":["https://openalex.org/I125656591"]}],"countries":["SA"],"is_corresponding":false,"raw_author_name":"Aziza I. Hussein","raw_affiliation_strings":["Electrical and Computer Eng. Dept, Effat University, Jeddah, Saudi Arabia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Eng. Dept, Effat University, Jeddah, Saudi Arabia","institution_ids":["https://openalex.org/I125656591"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100986171","display_name":"Hanafy M. Ali","orcid":"https://orcid.org/0000-0001-8600-5029"},"institutions":[{"id":"https://openalex.org/I89466785","display_name":"Minia University","ror":"https://ror.org/02hcv4z63","country_code":"EG","type":"education","lineage":["https://openalex.org/I89466785"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Hanafy M. Ali","raw_affiliation_strings":["Computers and Systems Eng. Dept, Minia University, Minia, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computers and Systems Eng. Dept, Minia University, Minia, Egypt","institution_ids":["https://openalex.org/I89466785"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5038437877"],"corresponding_institution_ids":["https://openalex.org/I89466785"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":{"value":2990,"currency":"USD","value_usd":2990},"fwci":3.4331,"has_fulltext":true,"cited_by_count":22,"citation_normalized_percentile":{"value":0.92809365,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"38","issue":"4","first_page":"395","last_page":"417"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/autoencoder","display_name":"Autoencoder","score":0.7548661231994629},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6648432016372681},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5916513204574585},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.5118831396102905},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.48457133769989014},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.4646546244621277},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.45735353231430054},{"id":"https://openalex.org/keywords/supervised-learning","display_name":"Supervised learning","score":0.4496222734451294},{"id":"https://openalex.org/keywords/decision-tree","display_name":"Decision tree","score":0.4230794906616211},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4230566918849945},{"id":"https://openalex.org/keywords/random-forest","display_name":"Random forest","score":0.42018923163414},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3316746652126312},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.27253246307373047}],"concepts":[{"id":"https://openalex.org/C101738243","wikidata":"https://www.wikidata.org/wiki/Q786435","display_name":"Autoencoder","level":3,"score":0.7548661231994629},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6648432016372681},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5916513204574585},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.5118831396102905},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.48457133769989014},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.4646546244621277},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.45735353231430054},{"id":"https://openalex.org/C136389625","wikidata":"https://www.wikidata.org/wiki/Q334384","display_name":"Supervised learning","level":3,"score":0.4496222734451294},{"id":"https://openalex.org/C84525736","wikidata":"https://www.wikidata.org/wiki/Q831366","display_name":"Decision tree","level":2,"score":0.4230794906616211},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4230566918849945},{"id":"https://openalex.org/C169258074","wikidata":"https://www.wikidata.org/wiki/Q245748","display_name":"Random forest","level":2,"score":0.42018923163414},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3316746652126312},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.27253246307373047},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-022-06020-z","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-022-06020-z","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-022-06020-z.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1007/s10836-022-06020-z","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s10836-022-06020-z","pdf_url":"https://link.springer.com/content/pdf/10.1007/s10836-022-06020-z.pdf","source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320327648","display_name":"Minia University","ror":"https://ror.org/02hcv4z63"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4293770733.pdf","grobid_xml":"https://content.openalex.org/works/W4293770733.grobid-xml"},"referenced_works_count":24,"referenced_works":["https://openalex.org/W16016350","https://openalex.org/W1525968431","https://openalex.org/W1597576211","https://openalex.org/W1976743403","https://openalex.org/W1998345936","https://openalex.org/W2025768430","https://openalex.org/W2028695183","https://openalex.org/W2036265926","https://openalex.org/W2087418187","https://openalex.org/W2152406824","https://openalex.org/W2586122929","https://openalex.org/W2618380584","https://openalex.org/W2741064700","https://openalex.org/W2790037582","https://openalex.org/W2800408463","https://openalex.org/W2807891135","https://openalex.org/W2888957887","https://openalex.org/W3010947439","https://openalex.org/W3016468266","https://openalex.org/W3040439205","https://openalex.org/W3107849844","https://openalex.org/W3136334354","https://openalex.org/W4205140486","https://openalex.org/W4237318324"],"related_works":["https://openalex.org/W4281616679","https://openalex.org/W4308191010","https://openalex.org/W3211546796","https://openalex.org/W4223564025","https://openalex.org/W2968586400","https://openalex.org/W4285225238","https://openalex.org/W4384300587","https://openalex.org/W3217300629","https://openalex.org/W4360993980","https://openalex.org/W4318350883"],"abstract_inverted_index":{"Abstract":[0],"As":[1],"the":[2,16,58,109,117,132,148,161,231,280,323],"complexity":[3],"and":[4,98,127,213,271,296,303],"scope":[5],"of":[6,57,67,96,104,108,125,141,155,179,220,230,289,310],"VLSI":[7],"designs":[8],"continue":[9],"to":[10,22,115,137,152,160,186,199,293,300],"grow,":[11],"fault":[12,29,93,257],"detection":[13,30,94,258],"processes":[14],"in":[15,25,101,177,218,308,313,317],"pre-silicon":[17],"stage":[18],"have":[19],"become":[20],"crucial":[21],"guaranteeing":[23],"reliability":[24],"IC":[26],"design.":[27],"Most":[28],"algorithms":[31],"can":[32,69],"be":[33,70],"solved":[34],"by":[35,44,122],"transforming":[36],"them":[37],"into":[38],"a":[39,55,86,102,226,286],"satisfiability":[40],"(SAT)":[41],"problem":[42,121],"decipherable":[43],"SAT":[45,48,192],"solvers.":[46,193],"However,":[47],"solvers":[49],"consume":[50],"significant":[51],"computational":[52],"time,":[53],"as":[54,77,206,252],"result":[56],"search":[59,118],"space":[60,119],"explosion":[61,120],"problem.":[62],"This":[63],"ever-":[64],"increasing":[65],"amount":[66],"data":[68,142],"handled":[71],"via":[72],"machine":[73,202,305],"learning":[74,79,91,129,134,203,306],"techniques":[75],"known":[76],"deep":[78,90],"algorithms.":[80],"In":[81,194],"this":[82],"paper,":[83],"we":[84],"propose":[85],"new":[87],"approach":[88],"utilizing":[89],"for":[92,164,241,266,273],"(FD)":[95],"combinational":[97,242,267],"sequential":[99,245,274],"circuits":[100,268,275],"type":[103],"stuck-at-faults.":[105],"The":[106,171,223,256],"goal":[107],"proposed":[110,281,324],"semi-supervised":[111],"FD":[112,172,188,282,328],"model":[113,173,283,325],"is":[114,197],"avoid":[116],"taking":[123],"advantage":[124],"unsupervised":[126,133],"supervised":[128,149],"processes.":[130],"First,":[131],"process":[135,150,234,259],"attempts":[136],"extract":[138],"underlying":[139],"concepts":[140],"using":[143,237],"Deep":[144,238],"sparse":[145,239,248],"autoencoder.":[146],"Then,":[147],"tends":[151],"describe":[153],"rules":[154],"classification":[156],"that":[157],"are":[158],"applied":[159],"reduced":[162],"features":[163],"detecting":[165,314],"different":[166,319],"stuck-at":[167],"faults":[168,315],"within":[169],"circuits.":[170,243,321],"proposes":[174],"good":[175],"performance":[176],"terms":[178,219,309],"running":[180,287],"time":[181,288],"about":[182,290],"187":[183],"\u00d7":[184],"compared":[185,198,292,299],"other":[187,327],"algorithm":[189],"based":[190,330],"on":[191,331],"addition,":[195],"it":[196],"common":[200],"classical":[201],"models":[204],"such":[205],"Decision":[207],"Tree":[208],"(DT),":[209],"Random":[210],"Forest":[211],"(RF)":[212],"Gradient":[214],"Boosting":[215],"(GB)":[216],"classifiers,":[217,307],"validation":[221,228,254,264,311,340],"accuracy.":[222,255,341],"results":[224],"show":[225],"maximum":[227,263,339],"accuracy":[229,265,312],"feature":[232],"extraction":[233],"at":[235],"99.93%,":[236],"autoencoder":[240,249],"For":[244],"circuits,":[246],"stacked":[247],"presents":[250],"99.95%":[251],"average":[253],"delivers":[260],"around":[261,297],"99.6%":[262],"from":[269,276],"ISCAS\u201985":[270],"99.8%":[272],"ISCAS\u201989":[277],"benchmarks.":[278],"Moreover,":[279],"has":[284],"achieved":[285],"1.7x,":[291],"DT":[294],"classifier":[295,302],"1.6x,":[298],"RF":[301],"GB":[304],"occurred":[316],"eight":[318],"digital":[320],"Furthermore,":[322],"outperforms":[326],"models,":[329],"Radial":[332],"Basis":[333],"Function":[334],"Network":[335],"(RBFN),":[336],"achieving":[337],"97.8%":[338]},"counts_by_year":[{"year":2026,"cited_by_count":5},{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":2}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}