{"id":"https://openalex.org/W4283379312","doi":"https://doi.org/10.1007/s10836-022-06009-8","title":"Research on Analog Integrated Circuit Test Parameter Set Reduction Based on XGBoost","display_name":"Research on Analog Integrated Circuit Test Parameter Set Reduction Based on XGBoost","publication_year":2022,"publication_date":"2022-06-01","ids":{"openalex":"https://openalex.org/W4283379312","doi":"https://doi.org/10.1007/s10836-022-06009-8"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-022-06009-8","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-022-06009-8","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060141592","display_name":"Yindong Xiao","orcid":"https://orcid.org/0000-0003-1214-6077"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yindong Xiao","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009886339","display_name":"Yutong Zeng","orcid":"https://orcid.org/0000-0001-5486-3758"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yutong Zeng","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0001-5486-3758","affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100638546","display_name":"Qiong Wu","orcid":"https://orcid.org/0000-0003-3305-6652"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiong Wu","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100349847","display_name":"Ke Liu","orcid":"https://orcid.org/0000-0002-3960-1124"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ke Liu","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100382136","display_name":"Yanjun Li","orcid":"https://orcid.org/0000-0003-3971-9795"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yanjun Li","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112085711","display_name":"Chong Hu","orcid":"https://orcid.org/0009-0001-1712-2229"},"institutions":[{"id":"https://openalex.org/I5343935","display_name":"Guilin University of Electronic Technology","ror":"https://ror.org/05arjae42","country_code":"CN","type":"education","lineage":["https://openalex.org/I5343935"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chong Hu","raw_affiliation_strings":["Guangxi Key Laboratory of Automatic Testing Technology and Instruments, Guilin University of Electronic Technology, Guilin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Guangxi Key Laboratory of Automatic Testing Technology and Instruments, Guilin University of Electronic Technology, Guilin, China","institution_ids":["https://openalex.org/I5343935"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5100382136"],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.2333,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.48844293,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"38","issue":"3","first_page":"279","last_page":"288"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9898999929428101,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9883999824523926,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.6971707344055176},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.6969467997550964},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5962965488433838},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5940800905227661},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.5606102347373962},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5528362989425659},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.5277405977249146},{"id":"https://openalex.org/keywords/decision-tree","display_name":"Decision tree","score":0.514972984790802},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.5145453810691833},{"id":"https://openalex.org/keywords/dependency","display_name":"Dependency (UML)","score":0.4700414538383484},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4636790454387665},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.3611152172088623},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.330222487449646},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2978726625442505},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1695437729358673}],"concepts":[{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.6971707344055176},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.6969467997550964},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5962965488433838},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5940800905227661},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.5606102347373962},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5528362989425659},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.5277405977249146},{"id":"https://openalex.org/C84525736","wikidata":"https://www.wikidata.org/wiki/Q831366","display_name":"Decision tree","level":2,"score":0.514972984790802},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.5145453810691833},{"id":"https://openalex.org/C19768560","wikidata":"https://www.wikidata.org/wiki/Q320727","display_name":"Dependency (UML)","level":2,"score":0.4700414538383484},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4636790454387665},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.3611152172088623},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.330222487449646},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2978726625442505},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1695437729358673},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-022-06009-8","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-022-06009-8","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.5099999904632568,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G2640907945","display_name":null,"funder_award_id":"YQ201202","funder_id":"https://openalex.org/F4320326293","funder_display_name":"Guangxi Key Laboratory of Automatic Detection Technology and Instrument Foundation"},{"id":"https://openalex.org/G4155466375","display_name":"\u8f6f\u4ef6\u5b9a\u4e49\u4efb\u610f\u6ce2\u5f62\u5408\u6210\u6280\u672f\u5173\u952e\u95ee\u9898\u7814\u7a76","funder_award_id":"61871089","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320326293","display_name":"Guangxi Key Laboratory of Automatic Detection Technology and Instrument Foundation","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W2021881733","https://openalex.org/W2069803543","https://openalex.org/W2103543101","https://openalex.org/W2126949806","https://openalex.org/W2133229660","https://openalex.org/W2136522087","https://openalex.org/W2139497890","https://openalex.org/W2147916294","https://openalex.org/W2155171480","https://openalex.org/W2156227942","https://openalex.org/W2162433349","https://openalex.org/W2168349862","https://openalex.org/W2171440868","https://openalex.org/W2295598076","https://openalex.org/W2806020122","https://openalex.org/W2810471131","https://openalex.org/W2911964244","https://openalex.org/W2955518464"],"related_works":["https://openalex.org/W1588361197","https://openalex.org/W2091533492","https://openalex.org/W1991935474","https://openalex.org/W2341817401","https://openalex.org/W2170656965","https://openalex.org/W2144403156","https://openalex.org/W1994418768","https://openalex.org/W2140768479","https://openalex.org/W2544783104","https://openalex.org/W2130108605"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-06-19T15:47:20.252518","created_date":"2025-10-10T00:00:00"}