{"id":"https://openalex.org/W4224012224","doi":"https://doi.org/10.1007/s10836-022-05996-y","title":"An Accurate Estimation Algorithm for Failure Probability of Logic Circuits Using Correlation Separation","display_name":"An Accurate Estimation Algorithm for Failure Probability of Logic Circuits Using Correlation Separation","publication_year":2022,"publication_date":"2022-04-01","ids":{"openalex":"https://openalex.org/W4224012224","doi":"https://doi.org/10.1007/s10836-022-05996-y"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-022-05996-y","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-022-05996-y","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037772300","display_name":"Shuo Cai","orcid":"https://orcid.org/0000-0003-4375-3187"},"institutions":[{"id":"https://openalex.org/I56934997","display_name":"Changsha University of Science and Technology","ror":"https://ror.org/03yph8055","country_code":"CN","type":"education","lineage":["https://openalex.org/I56934997"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Shuo Cai","raw_affiliation_strings":["School of Computer and Communication Engineering, Changsha University of Science and Technology, Changsha, 410114, HN, China"],"raw_orcid":"https://orcid.org/0000-0003-4375-3187","affiliations":[{"raw_affiliation_string":"School of Computer and Communication Engineering, Changsha University of Science and Technology, Changsha, 410114, HN, China","institution_ids":["https://openalex.org/I56934997"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001263868","display_name":"Binyong He","orcid":"https://orcid.org/0000-0001-5715-7015"},"institutions":[{"id":"https://openalex.org/I56934997","display_name":"Changsha University of Science and Technology","ror":"https://ror.org/03yph8055","country_code":"CN","type":"education","lineage":["https://openalex.org/I56934997"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Binyong He","raw_affiliation_strings":["School of Computer and Communication Engineering, Changsha University of Science and Technology, Changsha, 410114, HN, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer and Communication Engineering, Changsha University of Science and Technology, Changsha, 410114, HN, China","institution_ids":["https://openalex.org/I56934997"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103099393","display_name":"Sicheng Wu","orcid":"https://orcid.org/0000-0003-0932-2113"},"institutions":[{"id":"https://openalex.org/I56934997","display_name":"Changsha University of Science and Technology","ror":"https://ror.org/03yph8055","country_code":"CN","type":"education","lineage":["https://openalex.org/I56934997"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Sicheng Wu","raw_affiliation_strings":["School of Computer and Communication Engineering, Changsha University of Science and Technology, Changsha, 410114, HN, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer and Communication Engineering, Changsha University of Science and Technology, Changsha, 410114, HN, China","institution_ids":["https://openalex.org/I56934997"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113414416","display_name":"Jin Wang","orcid":"https://orcid.org/0000-0002-8298-4378"},"institutions":[{"id":"https://openalex.org/I56934997","display_name":"Changsha University of Science and Technology","ror":"https://ror.org/03yph8055","country_code":"CN","type":"education","lineage":["https://openalex.org/I56934997"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jin Wang","raw_affiliation_strings":["School of Computer and Communication Engineering, Changsha University of Science and Technology, Changsha, 410114, HN, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer and Communication Engineering, Changsha University of Science and Technology, Changsha, 410114, HN, China","institution_ids":["https://openalex.org/I56934997"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042452580","display_name":"Weizheng Wang","orcid":"https://orcid.org/0000-0002-5879-585X"},"institutions":[{"id":"https://openalex.org/I56934997","display_name":"Changsha University of Science and Technology","ror":"https://ror.org/03yph8055","country_code":"CN","type":"education","lineage":["https://openalex.org/I56934997"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weizheng Wang","raw_affiliation_strings":["School of Computer and Communication Engineering, Changsha University of Science and Technology, Changsha, 410114, HN, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer and Communication Engineering, Changsha University of Science and Technology, Changsha, 410114, HN, China","institution_ids":["https://openalex.org/I56934997"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003996424","display_name":"Fei Yu","orcid":"https://orcid.org/0000-0002-3091-7640"},"institutions":[{"id":"https://openalex.org/I56934997","display_name":"Changsha University of Science and Technology","ror":"https://ror.org/03yph8055","country_code":"CN","type":"education","lineage":["https://openalex.org/I56934997"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fei Yu","raw_affiliation_strings":["School of Computer and Communication Engineering, Changsha University of Science and Technology, Changsha, 410114, HN, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer and Communication Engineering, Changsha University of Science and Technology, Changsha, 410114, HN, China","institution_ids":["https://openalex.org/I56934997"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5037772300"],"corresponding_institution_ids":["https://openalex.org/I56934997"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.2771,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.51636805,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"38","issue":"2","first_page":"165","last_page":"180"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.6203984022140503},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5893353223800659},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5478477478027344},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5322888493537903},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.5099433660507202},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5090591311454773},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.4935513734817505},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.49207037687301636},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4662451148033142},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.42668643593788147},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39175015687942505},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2421620488166809},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18128827214241028},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.10669422149658203},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10295495390892029},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09614086151123047}],"concepts":[{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.6203984022140503},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5893353223800659},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5478477478027344},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5322888493537903},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.5099433660507202},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5090591311454773},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.4935513734817505},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.49207037687301636},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4662451148033142},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.42668643593788147},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39175015687942505},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2421620488166809},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18128827214241028},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.10669422149658203},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10295495390892029},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09614086151123047},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-022-05996-y","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-022-05996-y","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1144767944","display_name":null,"funder_award_id":"61702052","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2295031649","display_name":null,"funder_award_id":"62172058","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5219116259","display_name":null,"funder_award_id":"2020JJ4622","funder_id":"https://openalex.org/F4320322843","funder_display_name":"Natural Science Foundation of\u00a0Hunan Province"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322843","display_name":"Natural Science Foundation of\u00a0Hunan Province","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W1592886836","https://openalex.org/W1975993564","https://openalex.org/W1998921161","https://openalex.org/W2015879345","https://openalex.org/W2021459339","https://openalex.org/W2030539660","https://openalex.org/W2054113966","https://openalex.org/W2070655964","https://openalex.org/W2071310017","https://openalex.org/W2083488767","https://openalex.org/W2084574629","https://openalex.org/W2096443114","https://openalex.org/W2098426274","https://openalex.org/W2098864349","https://openalex.org/W2099971661","https://openalex.org/W2101765144","https://openalex.org/W2125169487","https://openalex.org/W2132507670","https://openalex.org/W2137366465","https://openalex.org/W2143674663","https://openalex.org/W2144038574","https://openalex.org/W2146543277","https://openalex.org/W2148987260","https://openalex.org/W2160451204","https://openalex.org/W2162318113","https://openalex.org/W2166860938","https://openalex.org/W2180580882","https://openalex.org/W2346173388","https://openalex.org/W2744017409","https://openalex.org/W2767797438","https://openalex.org/W2770265919","https://openalex.org/W2803051631","https://openalex.org/W2894057114","https://openalex.org/W2901204029","https://openalex.org/W2921310276","https://openalex.org/W2939094974","https://openalex.org/W3046761372","https://openalex.org/W3144849580"],"related_works":["https://openalex.org/W4283025278","https://openalex.org/W2082432309","https://openalex.org/W817174743","https://openalex.org/W4254559750","https://openalex.org/W2050492524","https://openalex.org/W2998315020","https://openalex.org/W2389214306","https://openalex.org/W3215142653","https://openalex.org/W1487051936","https://openalex.org/W194748710"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2026-05-03T08:25:01.440150","created_date":"2025-10-10T00:00:00"}