{"id":"https://openalex.org/W4220857871","doi":"https://doi.org/10.1007/s10836-022-05988-y","title":"Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies","display_name":"Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies","publication_year":2022,"publication_date":"2022-02-01","ids":{"openalex":"https://openalex.org/W4220857871","doi":"https://doi.org/10.1007/s10836-022-05988-y"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-022-05988-y","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-022-05988-y","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006944227","display_name":"Yujie Zhao","orcid":"https://orcid.org/0000-0001-8119-3120"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Yujie Zhao","raw_affiliation_strings":["Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, 1-5-1 Tenjin-cho, Kiryu-shi, Gunma, 376-8515, Japan"],"raw_orcid":"https://orcid.org/0000-0001-8119-3120","affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, 1-5-1 Tenjin-cho, Kiryu-shi, Gunma, 376-8515, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057095561","display_name":"Kentaroh Katoh","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kentaroh Katoh","raw_affiliation_strings":["Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, 1-5-1 Tenjin-cho, Kiryu-shi, Gunma, 376-8515, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, 1-5-1 Tenjin-cho, Kiryu-shi, Gunma, 376-8515, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080778719","display_name":"Anna Kuwana","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Anna Kuwana","raw_affiliation_strings":["Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, 1-5-1 Tenjin-cho, Kiryu-shi, Gunma, 376-8515, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, 1-5-1 Tenjin-cho, Kiryu-shi, Gunma, 376-8515, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082129610","display_name":"Shogo Katayama","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shogo Katayama","raw_affiliation_strings":["Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, 1-5-1 Tenjin-cho, Kiryu-shi, Gunma, 376-8515, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, 1-5-1 Tenjin-cho, Kiryu-shi, Gunma, 376-8515, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010183568","display_name":"Jianglin Wei","orcid":"https://orcid.org/0000-0002-2952-7282"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Jianglin Wei","raw_affiliation_strings":["Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, 1-5-1 Tenjin-cho, Kiryu-shi, Gunma, 376-8515, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, 1-5-1 Tenjin-cho, Kiryu-shi, Gunma, 376-8515, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101691738","display_name":"Haruo Kobayashi","orcid":"https://orcid.org/0000-0002-0990-5522"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Haruo Kobayashi","raw_affiliation_strings":["Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, 1-5-1 Tenjin-cho, Kiryu-shi, Gunma, 376-8515, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, 1-5-1 Tenjin-cho, Kiryu-shi, Gunma, 376-8515, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001669942","display_name":"Takayuki Nakatani","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takayuki Nakatani","raw_affiliation_strings":["Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, 1-5-1 Tenjin-cho, Kiryu-shi, Gunma, 376-8515, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, 1-5-1 Tenjin-cho, Kiryu-shi, Gunma, 376-8515, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101930271","display_name":"Kazumi Hatayama","orcid":"https://orcid.org/0000-0001-8416-8609"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazumi Hatayama","raw_affiliation_strings":["Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, 1-5-1 Tenjin-cho, Kiryu-shi, Gunma, 376-8515, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, 1-5-1 Tenjin-cho, Kiryu-shi, Gunma, 376-8515, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006643454","display_name":"Keno Sato","orcid":null},"institutions":[{"id":"https://openalex.org/I162282272","display_name":"ROHM","ror":"https://ror.org/00vttj605","country_code":"JP","type":"company","lineage":["https://openalex.org/I162282272"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Keno Sato","raw_affiliation_strings":["ROHM Co, Ltd, 2-4-8 Shin-Yokohama, Kohokuku, Yokohama, 222-857, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ROHM Co, Ltd, 2-4-8 Shin-Yokohama, Kohokuku, Yokohama, 222-857, Japan","institution_ids":["https://openalex.org/I162282272"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038817476","display_name":"Takashi Ishida","orcid":"https://orcid.org/0000-0002-1060-0777"},"institutions":[{"id":"https://openalex.org/I162282272","display_name":"ROHM","ror":"https://ror.org/00vttj605","country_code":"JP","type":"company","lineage":["https://openalex.org/I162282272"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takashi Ishida","raw_affiliation_strings":["ROHM Co, Ltd, 2-4-8 Shin-Yokohama, Kohokuku, Yokohama, 222-857, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ROHM Co, Ltd, 2-4-8 Shin-Yokohama, Kohokuku, Yokohama, 222-857, Japan","institution_ids":["https://openalex.org/I162282272"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009609514","display_name":"Toshiyuki Okamoto","orcid":null},"institutions":[{"id":"https://openalex.org/I162282272","display_name":"ROHM","ror":"https://ror.org/00vttj605","country_code":"JP","type":"company","lineage":["https://openalex.org/I162282272"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshiyuki Okamoto","raw_affiliation_strings":["ROHM Co, Ltd, 2-4-8 Shin-Yokohama, Kohokuku, Yokohama, 222-857, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ROHM Co, Ltd, 2-4-8 Shin-Yokohama, Kohokuku, Yokohama, 222-857, Japan","institution_ids":["https://openalex.org/I162282272"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026364305","display_name":"Tamotsu Ichikawa","orcid":null},"institutions":[{"id":"https://openalex.org/I162282272","display_name":"ROHM","ror":"https://ror.org/00vttj605","country_code":"JP","type":"company","lineage":["https://openalex.org/I162282272"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tamotsu Ichikawa","raw_affiliation_strings":["ROHM Co, Ltd, 2-4-8 Shin-Yokohama, Kohokuku, Yokohama, 222-857, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ROHM Co, Ltd, 2-4-8 Shin-Yokohama, Kohokuku, Yokohama, 222-857, Japan","institution_ids":["https://openalex.org/I162282272"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":12,"corresponding_author_ids":["https://openalex.org/A5006944227"],"corresponding_institution_ids":["https://openalex.org/I165735259"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.4905,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.56489984,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":"38","issue":"1","first_page":"21","last_page":"38"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/histogram","display_name":"Histogram","score":0.8298344612121582},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.7525731325149536},{"id":"https://openalex.org/keywords/sine-wave","display_name":"Sine wave","score":0.5653392672538757},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.5508813261985779},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.5129989981651306},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4905504584312439},{"id":"https://openalex.org/keywords/binary-number","display_name":"Binary number","score":0.47694483399391174},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.4547254145145416},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4194732904434204},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2579220235347748},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.23472002148628235},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.18682259321212769},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13764700293540955},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.12940943241119385},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.10872137546539307},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.08993196487426758},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.0816059410572052},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07568332552909851}],"concepts":[{"id":"https://openalex.org/C53533937","wikidata":"https://www.wikidata.org/wiki/Q185020","display_name":"Histogram","level":3,"score":0.8298344612121582},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.7525731325149536},{"id":"https://openalex.org/C66907618","wikidata":"https://www.wikidata.org/wiki/Q207527","display_name":"Sine wave","level":3,"score":0.5653392672538757},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5508813261985779},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.5129989981651306},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4905504584312439},{"id":"https://openalex.org/C48372109","wikidata":"https://www.wikidata.org/wiki/Q3913","display_name":"Binary number","level":2,"score":0.47694483399391174},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.4547254145145416},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4194732904434204},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2579220235347748},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.23472002148628235},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.18682259321212769},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13764700293540955},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.12940943241119385},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.10872137546539307},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.08993196487426758},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0816059410572052},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07568332552909851},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-022-05988-y","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-022-05988-y","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1930963782","https://openalex.org/W2006786321","https://openalex.org/W2032514868","https://openalex.org/W2074971209","https://openalex.org/W2113796007","https://openalex.org/W2121273653","https://openalex.org/W2132267693","https://openalex.org/W2137740093","https://openalex.org/W2163723482","https://openalex.org/W2462720649","https://openalex.org/W2781391663","https://openalex.org/W2896152049","https://openalex.org/W2904474532","https://openalex.org/W2910213624","https://openalex.org/W2988055886","https://openalex.org/W3117298468","https://openalex.org/W3126360466","https://openalex.org/W3186033659","https://openalex.org/W3194433903","https://openalex.org/W3196108134"],"related_works":["https://openalex.org/W2029445676","https://openalex.org/W2239008325","https://openalex.org/W2149957267","https://openalex.org/W3102398180","https://openalex.org/W2004686517","https://openalex.org/W2393073187","https://openalex.org/W4220857871","https://openalex.org/W2949832739","https://openalex.org/W1609085460","https://openalex.org/W2087992884"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}