{"id":"https://openalex.org/W3214856590","doi":"https://doi.org/10.1007/s10836-021-05974-w","title":"A Test Generation Method of R-2R Digital-to-Analog Converters Based on Genetic Algorithm","display_name":"A Test Generation Method of R-2R Digital-to-Analog Converters Based on Genetic Algorithm","publication_year":2021,"publication_date":"2021-11-19","ids":{"openalex":"https://openalex.org/W3214856590","doi":"https://doi.org/10.1007/s10836-021-05974-w","mag":"3214856590"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-021-05974-w","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-021-05974-w","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101522986","display_name":"Xiaoyan Yang","orcid":"https://orcid.org/0000-0003-0530-5420"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiaoyan Yang","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101879663","display_name":"Chenglin Yang","orcid":"https://orcid.org/0000-0002-0834-5164"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chenglin Yang","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China"],"raw_orcid":"https://orcid.org/0000-0002-0834-5164","affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061739424","display_name":"Houjun Wang","orcid":"https://orcid.org/0000-0001-7110-717X"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Houjun Wang","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5101522986"],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.18304461,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"37","issue":"5-6","first_page":"701","last_page":"713"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12810","display_name":"Real-time simulation and control systems","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6327177286148071},{"id":"https://openalex.org/keywords/fitness-function","display_name":"Fitness function","score":0.6200097799301147},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5897346138954163},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.546111524105072},{"id":"https://openalex.org/keywords/genetic-algorithm","display_name":"Genetic algorithm","score":0.5445876121520996},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.5186554789543152},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5185731053352356},{"id":"https://openalex.org/keywords/sort","display_name":"sort","score":0.4885009527206421},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4685472249984741},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.451975554227829},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.45095622539520264},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.44402816891670227},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.37391042709350586},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21596598625183105},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.21555498242378235},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.17185601592063904},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.12933748960494995},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.12225872278213501}],"concepts":[{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6327177286148071},{"id":"https://openalex.org/C176066374","wikidata":"https://www.wikidata.org/wiki/Q629118","display_name":"Fitness function","level":3,"score":0.6200097799301147},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5897346138954163},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.546111524105072},{"id":"https://openalex.org/C8880873","wikidata":"https://www.wikidata.org/wiki/Q187787","display_name":"Genetic algorithm","level":2,"score":0.5445876121520996},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.5186554789543152},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5185731053352356},{"id":"https://openalex.org/C88548561","wikidata":"https://www.wikidata.org/wiki/Q347599","display_name":"sort","level":2,"score":0.4885009527206421},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4685472249984741},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.451975554227829},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.45095622539520264},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.44402816891670227},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.37391042709350586},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21596598625183105},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.21555498242378235},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.17185601592063904},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.12933748960494995},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.12225872278213501},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-021-05974-w","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-021-05974-w","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.5099999904632568}],"awards":[{"id":"https://openalex.org/G3986971303","display_name":null,"funder_award_id":"U1830133","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8959211665","display_name":null,"funder_award_id":"YQ18207","funder_id":"https://openalex.org/F4320326293","funder_display_name":"Guangxi Key Laboratory of Automatic Detection Technology and Instrument Foundation"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320326293","display_name":"Guangxi Key Laboratory of Automatic Detection Technology and Instrument Foundation","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W225560312","https://openalex.org/W2004069056","https://openalex.org/W2024387243","https://openalex.org/W2051097697","https://openalex.org/W2051522428","https://openalex.org/W2094897492","https://openalex.org/W2103785698","https://openalex.org/W2129444872","https://openalex.org/W2133952565","https://openalex.org/W2138223697","https://openalex.org/W2147819306","https://openalex.org/W2148113761","https://openalex.org/W2152551290","https://openalex.org/W2155370091","https://openalex.org/W2162674845","https://openalex.org/W2169604307","https://openalex.org/W2570705108","https://openalex.org/W2607482776","https://openalex.org/W2792945660","https://openalex.org/W2887713449","https://openalex.org/W2942030754","https://openalex.org/W2984133648","https://openalex.org/W2993817920","https://openalex.org/W3017420467","https://openalex.org/W3201929238","https://openalex.org/W4243875663"],"related_works":["https://openalex.org/W2091533492","https://openalex.org/W2082561435","https://openalex.org/W1588361197","https://openalex.org/W1991935474","https://openalex.org/W4319302805","https://openalex.org/W2341817401","https://openalex.org/W2162370517","https://openalex.org/W1953724919","https://openalex.org/W2914961374","https://openalex.org/W2128426877"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}