{"id":"https://openalex.org/W3159720542","doi":"https://doi.org/10.1007/s10836-021-05942-4","title":"Tolerating Soft Errors with Horizontal-Vertical-Diagonal-N-Queen (HVDNQ) Parity","display_name":"Tolerating Soft Errors with Horizontal-Vertical-Diagonal-N-Queen (HVDNQ) Parity","publication_year":2021,"publication_date":"2021-04-01","ids":{"openalex":"https://openalex.org/W3159720542","doi":"https://doi.org/10.1007/s10836-021-05942-4","mag":"3159720542"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-021-05942-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-021-05942-4","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090662317","display_name":"Muhammad Sheikh Sadi","orcid":"https://orcid.org/0000-0003-3390-6450"},"institutions":[{"id":"https://openalex.org/I1307585291","display_name":"Khulna University of Engineering and Technology","ror":"https://ror.org/04y58d606","country_code":"BD","type":"education","lineage":["https://openalex.org/I1307585291"]}],"countries":["BD"],"is_corresponding":true,"raw_author_name":"Muhammad Sheikh Sadi","raw_affiliation_strings":["Khulna University of Engineering & Technology, Khulna, Bangladesh"],"raw_orcid":"https://orcid.org/0000-0003-3390-6450","affiliations":[{"raw_affiliation_string":"Khulna University of Engineering & Technology, Khulna, Bangladesh","institution_ids":["https://openalex.org/I1307585291"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072124784","display_name":"Sumaiya Sumaiya","orcid":"https://orcid.org/0000-0001-8749-0265"},"institutions":[{"id":"https://openalex.org/I1307585291","display_name":"Khulna University of Engineering and Technology","ror":"https://ror.org/04y58d606","country_code":"BD","type":"education","lineage":["https://openalex.org/I1307585291"]}],"countries":["BD"],"is_corresponding":false,"raw_author_name":"Sumaiya Sumaiya","raw_affiliation_strings":["Khulna University of Engineering & Technology, Khulna, Bangladesh"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Khulna University of Engineering & Technology, Khulna, Bangladesh","institution_ids":["https://openalex.org/I1307585291"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005461717","display_name":"Mouly Dewan","orcid":null},"institutions":[{"id":"https://openalex.org/I1307585291","display_name":"Khulna University of Engineering and Technology","ror":"https://ror.org/04y58d606","country_code":"BD","type":"education","lineage":["https://openalex.org/I1307585291"]}],"countries":["BD"],"is_corresponding":false,"raw_author_name":"Mouly Dewan","raw_affiliation_strings":["Khulna University of Engineering & Technology, Khulna, Bangladesh"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Khulna University of Engineering & Technology, Khulna, Bangladesh","institution_ids":["https://openalex.org/I1307585291"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050547432","display_name":"Atikur Rahman","orcid":"https://orcid.org/0000-0003-3291-7836"},"institutions":[{"id":"https://openalex.org/I1307585291","display_name":"Khulna University of Engineering and Technology","ror":"https://ror.org/04y58d606","country_code":"BD","type":"education","lineage":["https://openalex.org/I1307585291"]}],"countries":["BD"],"is_corresponding":false,"raw_author_name":"Atikur Rahman","raw_affiliation_strings":["Khulna University of Engineering & Technology, Khulna, Bangladesh"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Khulna University of Engineering & Technology, Khulna, Bangladesh","institution_ids":["https://openalex.org/I1307585291"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5090662317"],"corresponding_institution_ids":["https://openalex.org/I1307585291"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.2033,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.49677393,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"37","issue":"2","first_page":"243","last_page":"254"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parity","display_name":"Parity (physics)","score":0.851243257522583},{"id":"https://openalex.org/keywords/diagonal","display_name":"Diagonal","score":0.8420623540878296},{"id":"https://openalex.org/keywords/equilateral-triangle","display_name":"Equilateral triangle","score":0.8239525556564331},{"id":"https://openalex.org/keywords/parity-bit","display_name":"Parity bit","score":0.5401912927627563},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.45988237857818604},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.45738595724105835},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.4283093214035034},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.39948514103889465},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.3577881455421448},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.321338951587677},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3150638937950134},{"id":"https://openalex.org/keywords/particle-physics","display_name":"Particle physics","score":0.1486312448978424}],"concepts":[{"id":"https://openalex.org/C2777151079","wikidata":"https://www.wikidata.org/wiki/Q141160","display_name":"Parity (physics)","level":2,"score":0.851243257522583},{"id":"https://openalex.org/C130367717","wikidata":"https://www.wikidata.org/wiki/Q189791","display_name":"Diagonal","level":2,"score":0.8420623540878296},{"id":"https://openalex.org/C146786541","wikidata":"https://www.wikidata.org/wiki/Q157002","display_name":"Equilateral triangle","level":2,"score":0.8239525556564331},{"id":"https://openalex.org/C131521367","wikidata":"https://www.wikidata.org/wiki/Q625502","display_name":"Parity bit","level":2,"score":0.5401912927627563},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.45988237857818604},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.45738595724105835},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.4283093214035034},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.39948514103889465},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.3577881455421448},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.321338951587677},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3150638937950134},{"id":"https://openalex.org/C109214941","wikidata":"https://www.wikidata.org/wiki/Q18334","display_name":"Particle physics","level":1,"score":0.1486312448978424}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-021-05942-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-021-05942-4","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.41999998688697815}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W593172729","https://openalex.org/W1607204816","https://openalex.org/W1987624332","https://openalex.org/W2044235831","https://openalex.org/W2059109558","https://openalex.org/W2093095207","https://openalex.org/W2103415152","https://openalex.org/W2119142538","https://openalex.org/W2121942050","https://openalex.org/W2123596317","https://openalex.org/W2127644226","https://openalex.org/W2129498572","https://openalex.org/W2138075790","https://openalex.org/W2139951091","https://openalex.org/W2156189337","https://openalex.org/W2572500612","https://openalex.org/W2889272389","https://openalex.org/W2903410716","https://openalex.org/W3002901217","https://openalex.org/W3016606214","https://openalex.org/W3025260258","https://openalex.org/W3033154324","https://openalex.org/W4230392938"],"related_works":["https://openalex.org/W4247694028","https://openalex.org/W2306469233","https://openalex.org/W2065356549","https://openalex.org/W2118844295","https://openalex.org/W2181665053","https://openalex.org/W2087943997","https://openalex.org/W2184233008","https://openalex.org/W4285816383","https://openalex.org/W2377071794","https://openalex.org/W2027271094"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
