{"id":"https://openalex.org/W3157381594","doi":"https://doi.org/10.1007/s10836-021-05941-5","title":"Radiation Tolerant SRAM Cell Design in 65nm Technology","display_name":"Radiation Tolerant SRAM Cell Design in 65nm Technology","publication_year":2021,"publication_date":"2021-04-01","ids":{"openalex":"https://openalex.org/W3157381594","doi":"https://doi.org/10.1007/s10836-021-05941-5","mag":"3157381594"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-021-05941-5","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-021-05941-5","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022057802","display_name":"JianAn Wang -","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"JianAn Wang","raw_affiliation_strings":["14, Huayuan Road, Nanan District, Chongqing City, China"],"affiliations":[{"raw_affiliation_string":"14, Huayuan Road, Nanan District, Chongqing City, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008226322","display_name":"Xue Wu","orcid":"https://orcid.org/0000-0003-2913-3627"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Xue Wu","raw_affiliation_strings":["14, Huayuan Road, Nanan District, Chongqing City, China"],"affiliations":[{"raw_affiliation_string":"14, Huayuan Road, Nanan District, Chongqing City, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064112723","display_name":"Haonan Tian","orcid":"https://orcid.org/0000-0001-6960-6930"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Haonan Tian","raw_affiliation_strings":["57 Campus Drive, Saskatoon, SK, Canada"],"affiliations":[{"raw_affiliation_string":"57 Campus Drive, Saskatoon, SK, Canada","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100734103","display_name":"Lixiang Li","orcid":"https://orcid.org/0000-0001-9949-8731"},"institutions":[{"id":"https://openalex.org/I129902397","display_name":"Dalhousie University","ror":"https://ror.org/01e6qks80","country_code":"CA","type":"education","lineage":["https://openalex.org/I129902397"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Lixiang Li","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Dalhousie University, 1360 Barrington Street, Halifax, NS, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Dalhousie University, 1360 Barrington Street, Halifax, NS, Canada","institution_ids":["https://openalex.org/I129902397"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102839170","display_name":"Shuting Shi","orcid":"https://orcid.org/0000-0001-8377-1625"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Shuting Shi","raw_affiliation_strings":["57 Campus Drive, Saskatoon, SK, Canada"],"affiliations":[{"raw_affiliation_string":"57 Campus Drive, Saskatoon, SK, Canada","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100379239","display_name":"Li Chen","orcid":"https://orcid.org/0000-0002-3769-1488"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Li Chen","raw_affiliation_strings":["57 Campus Drive, Saskatoon, SK, Canada"],"affiliations":[{"raw_affiliation_string":"57 Campus Drive, Saskatoon, SK, Canada","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5022057802"],"corresponding_institution_ids":[],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.2022,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.49240596,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"37","issue":"2","first_page":"255","last_page":"262"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dice","display_name":"Dice","score":0.8845430016517639},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7394168972969055},{"id":"https://openalex.org/keywords/schematic","display_name":"Schematic","score":0.6134360432624817},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6064240336418152},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5791867971420288},{"id":"https://openalex.org/keywords/radiation-hardening","display_name":"Radiation hardening","score":0.5491700768470764},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.5187223553657532},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.48504799604415894},{"id":"https://openalex.org/keywords/radiation-tolerance","display_name":"Radiation tolerance","score":0.45592737197875977},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.43465346097946167},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4189798831939697},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4082905948162079},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3828856945037842},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3824117183685303},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.29977738857269287},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17488741874694824},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.13479259610176086}],"concepts":[{"id":"https://openalex.org/C22029948","wikidata":"https://www.wikidata.org/wiki/Q45089","display_name":"Dice","level":2,"score":0.8845430016517639},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7394168972969055},{"id":"https://openalex.org/C192328126","wikidata":"https://www.wikidata.org/wiki/Q4514647","display_name":"Schematic","level":2,"score":0.6134360432624817},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6064240336418152},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5791867971420288},{"id":"https://openalex.org/C119349744","wikidata":"https://www.wikidata.org/wiki/Q3026015","display_name":"Radiation hardening","level":3,"score":0.5491700768470764},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.5187223553657532},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.48504799604415894},{"id":"https://openalex.org/C2987992536","wikidata":"https://www.wikidata.org/wiki/Q3026015","display_name":"Radiation tolerance","level":3,"score":0.45592737197875977},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.43465346097946167},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4189798831939697},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4082905948162079},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3828856945037842},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3824117183685303},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29977738857269287},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17488741874694824},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.13479259610176086},{"id":"https://openalex.org/C509974204","wikidata":"https://www.wikidata.org/wiki/Q180507","display_name":"Radiation therapy","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-021-05941-5","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-021-05941-5","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.75}],"awards":[],"funders":[{"id":"https://openalex.org/F4320334593","display_name":"Natural Sciences and Engineering Research Council of Canada","ror":"https://ror.org/01h531d29"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1601589299","https://openalex.org/W1965425138","https://openalex.org/W2000351221","https://openalex.org/W2025474944","https://openalex.org/W2040463040","https://openalex.org/W2042640145","https://openalex.org/W2061643944","https://openalex.org/W2081873289","https://openalex.org/W2083876543","https://openalex.org/W2141068710","https://openalex.org/W2148071590","https://openalex.org/W2152652532","https://openalex.org/W2153751624","https://openalex.org/W2169622577","https://openalex.org/W2190904686","https://openalex.org/W2239968853","https://openalex.org/W2289165590","https://openalex.org/W2345052922","https://openalex.org/W2518866599","https://openalex.org/W2587844224","https://openalex.org/W2613938152","https://openalex.org/W2737640031","https://openalex.org/W2741176699","https://openalex.org/W2794137945","https://openalex.org/W2894057114","https://openalex.org/W3123356691"],"related_works":["https://openalex.org/W2126707815","https://openalex.org/W2898049438","https://openalex.org/W2072187849","https://openalex.org/W2113606291","https://openalex.org/W2990061396","https://openalex.org/W2034255211","https://openalex.org/W2286528055","https://openalex.org/W2064710977","https://openalex.org/W2545524858","https://openalex.org/W2995259936"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}