{"id":"https://openalex.org/W3035567041","doi":"https://doi.org/10.1007/s10836-020-05889-y","title":"Diagnosis of Incipient Faults in Nonlinear Analog Circuits Based on High Order Moment Fractional Transform","display_name":"Diagnosis of Incipient Faults in Nonlinear Analog Circuits Based on High Order Moment Fractional Transform","publication_year":2020,"publication_date":"2020-06-12","ids":{"openalex":"https://openalex.org/W3035567041","doi":"https://doi.org/10.1007/s10836-020-05889-y","mag":"3035567041"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-020-05889-y","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-020-05889-y","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100741985","display_name":"Yong Deng","orcid":"https://orcid.org/0000-0002-4419-8536"},"institutions":[{"id":"https://openalex.org/I165745306","display_name":"Southwest Petroleum University","ror":"https://ror.org/03h17x602","country_code":"CN","type":"education","lineage":["https://openalex.org/I165745306"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yong Deng","raw_affiliation_strings":["School of Mechatronic Engineering, Southwest Petroleum University, Chengdu, 610500, China"],"raw_orcid":"https://orcid.org/0000-0002-4419-8536","affiliations":[{"raw_affiliation_string":"School of Mechatronic Engineering, Southwest Petroleum University, Chengdu, 610500, China","institution_ids":["https://openalex.org/I165745306"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111870272","display_name":"Ting Chen","orcid":"https://orcid.org/0009-0007-4319-1117"},"institutions":[{"id":"https://openalex.org/I165745306","display_name":"Southwest Petroleum University","ror":"https://ror.org/03h17x602","country_code":"CN","type":"education","lineage":["https://openalex.org/I165745306"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ting Chen","raw_affiliation_strings":["School of Mechatronic Engineering, Southwest Petroleum University, Chengdu, 610500, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechatronic Engineering, Southwest Petroleum University, Chengdu, 610500, China","institution_ids":["https://openalex.org/I165745306"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100366380","display_name":"Di Zhang","orcid":"https://orcid.org/0000-0001-9113-7050"},"institutions":[{"id":"https://openalex.org/I165745306","display_name":"Southwest Petroleum University","ror":"https://ror.org/03h17x602","country_code":"CN","type":"education","lineage":["https://openalex.org/I165745306"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Di Zhang","raw_affiliation_strings":["School of Mechatronic Engineering, Southwest Petroleum University, Chengdu, 610500, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechatronic Engineering, Southwest Petroleum University, Chengdu, 610500, China","institution_ids":["https://openalex.org/I165745306"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5100741985"],"corresponding_institution_ids":["https://openalex.org/I165745306"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":0.1628,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.44842742,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"36","issue":"4","first_page":"485","last_page":"498"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6498844027519226},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.6192599534988403},{"id":"https://openalex.org/keywords/moment","display_name":"Moment (physics)","score":0.5473355054855347},{"id":"https://openalex.org/keywords/equivalence","display_name":"Equivalence (formal languages)","score":0.5294850468635559},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5078337788581848},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4737031161785126},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.44418779015541077},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.43208327889442444},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.40816250443458557},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39114201068878174},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.38782981038093567},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.3762528896331787},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3747504949569702},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.36125099658966064},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.22168144583702087},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10072359442710876},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08825644850730896}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6498844027519226},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.6192599534988403},{"id":"https://openalex.org/C179254644","wikidata":"https://www.wikidata.org/wiki/Q13222844","display_name":"Moment (physics)","level":2,"score":0.5473355054855347},{"id":"https://openalex.org/C2780069185","wikidata":"https://www.wikidata.org/wiki/Q7977945","display_name":"Equivalence (formal languages)","level":2,"score":0.5294850468635559},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5078337788581848},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4737031161785126},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.44418779015541077},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.43208327889442444},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.40816250443458557},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39114201068878174},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.38782981038093567},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3762528896331787},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3747504949569702},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.36125099658966064},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.22168144583702087},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10072359442710876},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08825644850730896},{"id":"https://openalex.org/C118615104","wikidata":"https://www.wikidata.org/wiki/Q121416","display_name":"Discrete mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C74650414","wikidata":"https://www.wikidata.org/wiki/Q11397","display_name":"Classical mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-020-05889-y","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-020-05889-y","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":53,"referenced_works":["https://openalex.org/W1964988843","https://openalex.org/W1966553179","https://openalex.org/W1967745406","https://openalex.org/W1968047608","https://openalex.org/W1983968342","https://openalex.org/W1992452233","https://openalex.org/W1997244547","https://openalex.org/W1999470887","https://openalex.org/W2000791053","https://openalex.org/W2006139666","https://openalex.org/W2007221293","https://openalex.org/W2027424673","https://openalex.org/W2032409150","https://openalex.org/W2035788900","https://openalex.org/W2036947671","https://openalex.org/W2041147806","https://openalex.org/W2060188579","https://openalex.org/W2080067489","https://openalex.org/W2081235365","https://openalex.org/W2081435593","https://openalex.org/W2087754676","https://openalex.org/W2109049058","https://openalex.org/W2114827730","https://openalex.org/W2116548067","https://openalex.org/W2118184682","https://openalex.org/W2123146397","https://openalex.org/W2136106070","https://openalex.org/W2139497801","https://openalex.org/W2145576488","https://openalex.org/W2152446064","https://openalex.org/W2153517294","https://openalex.org/W2157093158","https://openalex.org/W2158572650","https://openalex.org/W2162112538","https://openalex.org/W2165422924","https://openalex.org/W2166159664","https://openalex.org/W2170634847","https://openalex.org/W2203022174","https://openalex.org/W2258200298","https://openalex.org/W2296004723","https://openalex.org/W2340527100","https://openalex.org/W2346627838","https://openalex.org/W2525089770","https://openalex.org/W2610863480","https://openalex.org/W2623064590","https://openalex.org/W2760431594","https://openalex.org/W2770728546","https://openalex.org/W2770823747","https://openalex.org/W2789290713","https://openalex.org/W2792945660","https://openalex.org/W2885715656","https://openalex.org/W2900810724","https://openalex.org/W3144373976"],"related_works":["https://openalex.org/W2378757965","https://openalex.org/W4224903346","https://openalex.org/W1593262897","https://openalex.org/W2372869593","https://openalex.org/W2384194537","https://openalex.org/W2031011156","https://openalex.org/W1991935520","https://openalex.org/W2368745429","https://openalex.org/W2067940999","https://openalex.org/W3171126029"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":2}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}