{"id":"https://openalex.org/W3033766610","doi":"https://doi.org/10.1007/s10836-020-05880-7","title":"An Efficient VLSI Test Data Compression Scheme for Circular Scan Architecture Based on Modified Ant Colony Meta-heuristic","display_name":"An Efficient VLSI Test Data Compression Scheme for Circular Scan Architecture Based on Modified Ant Colony Meta-heuristic","publication_year":2020,"publication_date":"2020-06-01","ids":{"openalex":"https://openalex.org/W3033766610","doi":"https://doi.org/10.1007/s10836-020-05880-7","mag":"3033766610"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-020-05880-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-020-05880-7","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110539153","display_name":"Sanjoy Mitra","orcid":null},"institutions":[{"id":"https://openalex.org/I196486160","display_name":"National Institute of Technology Agartala","ror":"https://ror.org/03swyrn62","country_code":"IN","type":"education","lineage":["https://openalex.org/I196486160"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Sanjoy Mitra","raw_affiliation_strings":["Department of Computer Science and Engineering, Tripura Institute of Technology, Agartala, 799015, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, Tripura Institute of Technology, Agartala, 799015, India","institution_ids":["https://openalex.org/I196486160"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033366153","display_name":"Debaprasad Das","orcid":"https://orcid.org/0000-0002-7928-9542"},"institutions":[{"id":"https://openalex.org/I49278261","display_name":"Assam University","ror":"https://ror.org/0535c1v66","country_code":"IN","type":"education","lineage":["https://openalex.org/I49278261"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Debaprasad Das","raw_affiliation_strings":["Department of Electronics and Communication Engineering, TSSOT, Assam University, Silchar, 788011, India"],"raw_orcid":"https://orcid.org/0000-0002-7928-9542","affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, TSSOT, Assam University, Silchar, 788011, India","institution_ids":["https://openalex.org/I49278261"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5033366153"],"corresponding_institution_ids":["https://openalex.org/I49278261"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":1.1786,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.7690681,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"36","issue":"3","first_page":"327","last_page":"342"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ant-colony-optimization-algorithms","display_name":"Ant colony optimization algorithms","score":0.6673060655593872},{"id":"https://openalex.org/keywords/hamming-distance","display_name":"Hamming distance","score":0.6038209795951843},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.5941751003265381},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5546751618385315},{"id":"https://openalex.org/keywords/heuristic","display_name":"Heuristic","score":0.5334741473197937},{"id":"https://openalex.org/keywords/travelling-salesman-problem","display_name":"Travelling salesman problem","score":0.506468653678894},{"id":"https://openalex.org/keywords/hamming-code","display_name":"Hamming code","score":0.48882243037223816},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4575809836387634},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.4235837757587433},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.3364768624305725},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.326046347618103},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.26993319392204285},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19707009196281433},{"id":"https://openalex.org/keywords/block-code","display_name":"Block code","score":0.08602362871170044}],"concepts":[{"id":"https://openalex.org/C40128228","wikidata":"https://www.wikidata.org/wiki/Q460851","display_name":"Ant colony optimization algorithms","level":2,"score":0.6673060655593872},{"id":"https://openalex.org/C193319292","wikidata":"https://www.wikidata.org/wiki/Q272172","display_name":"Hamming distance","level":2,"score":0.6038209795951843},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.5941751003265381},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5546751618385315},{"id":"https://openalex.org/C173801870","wikidata":"https://www.wikidata.org/wiki/Q201413","display_name":"Heuristic","level":2,"score":0.5334741473197937},{"id":"https://openalex.org/C175859090","wikidata":"https://www.wikidata.org/wiki/Q322212","display_name":"Travelling salesman problem","level":2,"score":0.506468653678894},{"id":"https://openalex.org/C73150493","wikidata":"https://www.wikidata.org/wiki/Q853922","display_name":"Hamming code","level":4,"score":0.48882243037223816},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4575809836387634},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.4235837757587433},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.3364768624305725},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.326046347618103},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.26993319392204285},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19707009196281433},{"id":"https://openalex.org/C157125643","wikidata":"https://www.wikidata.org/wiki/Q884707","display_name":"Block code","level":3,"score":0.08602362871170044},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-020-05880-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-020-05880-7","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W1529848865","https://openalex.org/W1561562902","https://openalex.org/W1594478260","https://openalex.org/W1972713260","https://openalex.org/W1999154650","https://openalex.org/W2010813535","https://openalex.org/W2024541713","https://openalex.org/W2046352832","https://openalex.org/W2068649099","https://openalex.org/W2077562862","https://openalex.org/W2083131631","https://openalex.org/W2089196696","https://openalex.org/W2091894011","https://openalex.org/W2104293897","https://openalex.org/W2106303764","https://openalex.org/W2107888116","https://openalex.org/W2124425429","https://openalex.org/W2127691374","https://openalex.org/W2131261851","https://openalex.org/W2131803874","https://openalex.org/W2134411380","https://openalex.org/W2134702967","https://openalex.org/W2136486186","https://openalex.org/W2137427575","https://openalex.org/W2141866079","https://openalex.org/W2143404021","https://openalex.org/W2148373461","https://openalex.org/W2152257764","https://openalex.org/W2160621850","https://openalex.org/W2277803146","https://openalex.org/W2326184283","https://openalex.org/W2334208631","https://openalex.org/W2555496409","https://openalex.org/W2810051107","https://openalex.org/W2888181913","https://openalex.org/W3140139611","https://openalex.org/W4230084852"],"related_works":["https://openalex.org/W2943247777","https://openalex.org/W2740543340","https://openalex.org/W2371167013","https://openalex.org/W1582340598","https://openalex.org/W1541021634","https://openalex.org/W2779867339","https://openalex.org/W2794545997","https://openalex.org/W2584980534","https://openalex.org/W2182731056","https://openalex.org/W1600949677"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}