{"id":"https://openalex.org/W3015312734","doi":"https://doi.org/10.1007/s10836-020-05872-7","title":"Co-Optimization of Test Wrapper Length and TSV for TSV Based 3D SOCs","display_name":"Co-Optimization of Test Wrapper Length and TSV for TSV Based 3D SOCs","publication_year":2020,"publication_date":"2020-04-01","ids":{"openalex":"https://openalex.org/W3015312734","doi":"https://doi.org/10.1007/s10836-020-05872-7","mag":"3015312734"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-020-05872-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-020-05872-7","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004506417","display_name":"Tanusree Kaibartta","orcid":"https://orcid.org/0000-0001-5115-5350"},"institutions":[{"id":"https://openalex.org/I189109744","display_name":"Indian Institute of Technology Dhanbad","ror":"https://ror.org/013v3cc28","country_code":"IN","type":"education","lineage":["https://openalex.org/I189109744"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Tanusree Kaibartta","raw_affiliation_strings":["IIT(ISM) Dhanbad, 826004, Jharkhand, India"],"affiliations":[{"raw_affiliation_string":"IIT(ISM) Dhanbad, 826004, Jharkhand, India","institution_ids":["https://openalex.org/I189109744"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051150754","display_name":"Gautam Biswas","orcid":"https://orcid.org/0000-0002-2752-3878"},"institutions":[{"id":"https://openalex.org/I189109744","display_name":"Indian Institute of Technology Dhanbad","ror":"https://ror.org/013v3cc28","country_code":"IN","type":"education","lineage":["https://openalex.org/I189109744"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"G. P. Biswas","raw_affiliation_strings":["IIT(ISM) Dhanbad, 826004, Jharkhand, India"],"affiliations":[{"raw_affiliation_string":"IIT(ISM) Dhanbad, 826004, Jharkhand, India","institution_ids":["https://openalex.org/I189109744"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059700720","display_name":"Debesh K. Das","orcid":"https://orcid.org/0000-0003-1736-1497"},"institutions":[{"id":"https://openalex.org/I170979836","display_name":"Jadavpur University","ror":"https://ror.org/02af4h012","country_code":"IN","type":"education","lineage":["https://openalex.org/I170979836"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Debesh Kumar Das","raw_affiliation_strings":["Jadavpur University, Kolkata, 700032, West Bengal, India"],"affiliations":[{"raw_affiliation_string":"Jadavpur University, Kolkata, 700032, West Bengal, India","institution_ids":["https://openalex.org/I170979836"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5004506417"],"corresponding_institution_ids":["https://openalex.org/I189109744"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.3111,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.55676696,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"36","issue":"2","first_page":"239","last_page":"253"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.7586828470230103},{"id":"https://openalex.org/keywords/particle-swarm-optimization","display_name":"Particle swarm optimization","score":0.6949267387390137},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6846538782119751},{"id":"https://openalex.org/keywords/heuristic","display_name":"Heuristic","score":0.5605857968330383},{"id":"https://openalex.org/keywords/routing","display_name":"Routing (electronic design automation)","score":0.5045965909957886},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.45343178510665894},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3745748698711395},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3691209554672241},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.33034104108810425},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.0953044593334198},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.06513258814811707}],"concepts":[{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.7586828470230103},{"id":"https://openalex.org/C85617194","wikidata":"https://www.wikidata.org/wiki/Q2072794","display_name":"Particle swarm optimization","level":2,"score":0.6949267387390137},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6846538782119751},{"id":"https://openalex.org/C173801870","wikidata":"https://www.wikidata.org/wiki/Q201413","display_name":"Heuristic","level":2,"score":0.5605857968330383},{"id":"https://openalex.org/C74172769","wikidata":"https://www.wikidata.org/wiki/Q1446839","display_name":"Routing (electronic design automation)","level":2,"score":0.5045965909957886},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.45343178510665894},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3745748698711395},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3691209554672241},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.33034104108810425},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0953044593334198},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.06513258814811707},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-020-05872-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-020-05872-7","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1541120766","https://openalex.org/W1849928240","https://openalex.org/W1974639872","https://openalex.org/W1994257370","https://openalex.org/W2011039300","https://openalex.org/W2016460235","https://openalex.org/W2043004448","https://openalex.org/W2064712157","https://openalex.org/W2074730724","https://openalex.org/W2100516830","https://openalex.org/W2103022917","https://openalex.org/W2110504571","https://openalex.org/W2123159753","https://openalex.org/W2161277442","https://openalex.org/W2165642910","https://openalex.org/W2474451066","https://openalex.org/W2511596983","https://openalex.org/W2587180584","https://openalex.org/W2593197747","https://openalex.org/W2776842225","https://openalex.org/W2806408438","https://openalex.org/W2912134426","https://openalex.org/W2937914537","https://openalex.org/W2946831974","https://openalex.org/W3144072891","https://openalex.org/W3146892808"],"related_works":["https://openalex.org/W2155019192","https://openalex.org/W2014709025","https://openalex.org/W4249035840","https://openalex.org/W2766970861","https://openalex.org/W3125341812","https://openalex.org/W1991674760","https://openalex.org/W1668171714","https://openalex.org/W4380607112","https://openalex.org/W2218294330","https://openalex.org/W1997278405"],"abstract_inverted_index":null,"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}