{"id":"https://openalex.org/W3009808216","doi":"https://doi.org/10.1007/s10836-020-05864-7","title":"Soft Error Hardened Asymmetric 10T SRAM Cell for Aerospace Applications","display_name":"Soft Error Hardened Asymmetric 10T SRAM Cell for Aerospace Applications","publication_year":2020,"publication_date":"2020-03-06","ids":{"openalex":"https://openalex.org/W3009808216","doi":"https://doi.org/10.1007/s10836-020-05864-7","mag":"3009808216"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-020-05864-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-020-05864-7","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035985978","display_name":"Ambika Prasad Shah","orcid":"https://orcid.org/0000-0003-0810-814X"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":true,"raw_author_name":"Ambika Prasad Shah","raw_affiliation_strings":["Institute for Microelectronics, Technische Universit\u00e4t Wien, Vienna, 1040, Austria"],"raw_orcid":"https://orcid.org/0000-0003-0810-814X","affiliations":[{"raw_affiliation_string":"Institute for Microelectronics, Technische Universit\u00e4t Wien, Vienna, 1040, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068792760","display_name":"Santosh Kumar Vishvakarma","orcid":"https://orcid.org/0000-0003-4223-0077"},"institutions":[{"id":"https://openalex.org/I64295750","display_name":"Indian Institute of Technology Indore","ror":"https://ror.org/01hhf7w52","country_code":"IN","type":"education","lineage":["https://openalex.org/I64295750"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Santosh Kumar Vishvakarma","raw_affiliation_strings":["Nanoscale Devices VLSI Circuit & System Design Lab Discipline of Electrical Engineering, Indian Institute of Technology Indore, Indore, M.P., 453552, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanoscale Devices VLSI Circuit & System Design Lab Discipline of Electrical Engineering, Indian Institute of Technology Indore, Indore, M.P., 453552, India","institution_ids":["https://openalex.org/I64295750"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108437484","display_name":"Michael H\u00fcbner","orcid":"https://orcid.org/0000-0003-3785-7959"},"institutions":[{"id":"https://openalex.org/I51783024","display_name":"Brandenburg University of Technology Cottbus-Senftenberg","ror":"https://ror.org/02wxx3e24","country_code":"DE","type":"education","lineage":["https://openalex.org/I51783024"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Michael H\u00fcbner","raw_affiliation_strings":["Institute for Informatics, Brandenburg University of Technology, Cottbus-Senftenberg, Cottbus, 03046, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Informatics, Brandenburg University of Technology, Cottbus-Senftenberg, Cottbus, 03046, Germany","institution_ids":["https://openalex.org/I51783024"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5035985978"],"corresponding_institution_ids":["https://openalex.org/I145847075"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":2.6008,"has_fulltext":false,"cited_by_count":38,"citation_normalized_percentile":{"value":0.9004587,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"36","issue":"2","first_page":"255","last_page":"269"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9883000254631042,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.9251917600631714},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6376464366912842},{"id":"https://openalex.org/keywords/booster","display_name":"Booster (rocketry)","score":0.5083243250846863},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4402591586112976},{"id":"https://openalex.org/keywords/hardening","display_name":"Hardening (computing)","score":0.41576170921325684},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3924143612384796},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3673068881034851},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23933619260787964},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.1188746988773346}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.9251917600631714},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6376464366912842},{"id":"https://openalex.org/C203165030","wikidata":"https://www.wikidata.org/wiki/Q741745","display_name":"Booster (rocketry)","level":2,"score":0.5083243250846863},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4402591586112976},{"id":"https://openalex.org/C44255700","wikidata":"https://www.wikidata.org/wiki/Q978423","display_name":"Hardening (computing)","level":3,"score":0.41576170921325684},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3924143612384796},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3673068881034851},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23933619260787964},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.1188746988773346},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-020-05864-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-020-05864-7","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4232950117","display_name":null,"funder_award_id":"3528/(NET-DEC. 2014)","funder_id":"https://openalex.org/F4320320767","funder_display_name":"University Grants Commission"}],"funders":[{"id":"https://openalex.org/F4320320767","display_name":"University Grants Commission","ror":"https://ror.org/04p800546"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1753784006","https://openalex.org/W1988935511","https://openalex.org/W1989243598","https://openalex.org/W2067168777","https://openalex.org/W2124071587","https://openalex.org/W2138815251","https://openalex.org/W2141068710","https://openalex.org/W2151829775","https://openalex.org/W2156124136","https://openalex.org/W2170649610","https://openalex.org/W2344726030","https://openalex.org/W2587844224","https://openalex.org/W2737640031","https://openalex.org/W2764168195","https://openalex.org/W2784101586","https://openalex.org/W2790480006","https://openalex.org/W2793929663","https://openalex.org/W2806005848","https://openalex.org/W2905258051","https://openalex.org/W2974460364","https://openalex.org/W3003314452"],"related_works":["https://openalex.org/W1500230652","https://openalex.org/W4290647047","https://openalex.org/W2363504003","https://openalex.org/W2066033226","https://openalex.org/W2548582980","https://openalex.org/W2620706469","https://openalex.org/W2052914698","https://openalex.org/W2612883256","https://openalex.org/W4386933833","https://openalex.org/W1030007664"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":9},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":3}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}