{"id":"https://openalex.org/W3002150461","doi":"https://doi.org/10.1007/s10836-019-05853-5","title":"Reliability Model and Sensitivity Analysis for General Electronic Systems with Failure Types based on Non-identical Correlated Components","display_name":"Reliability Model and Sensitivity Analysis for General Electronic Systems with Failure Types based on Non-identical Correlated Components","publication_year":2020,"publication_date":"2020-01-23","ids":{"openalex":"https://openalex.org/W3002150461","doi":"https://doi.org/10.1007/s10836-019-05853-5","mag":"3002150461"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-019-05853-5","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-019-05853-5","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043304249","display_name":"Seyed Mostafa Banitaba","orcid":"https://orcid.org/0000-0002-1579-2093"},"institutions":[{"id":"https://openalex.org/I9256017","display_name":"Islamic Azad University of Najafabad","ror":"https://ror.org/015j7c446","country_code":"IR","type":"education","lineage":["https://openalex.org/I110525433","https://openalex.org/I9256017"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"Seyed Mostafa Banitaba","raw_affiliation_strings":["Department of Industrial Engineering, Najafabad Branch, Islamic Azad University, Najafabad, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering, Najafabad Branch, Islamic Azad University, Najafabad, Iran","institution_ids":["https://openalex.org/I9256017"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014344314","display_name":"Roya M. Ahari","orcid":"https://orcid.org/0000-0002-8952-8682"},"institutions":[{"id":"https://openalex.org/I9256017","display_name":"Islamic Azad University of Najafabad","ror":"https://ror.org/015j7c446","country_code":"IR","type":"education","lineage":["https://openalex.org/I110525433","https://openalex.org/I9256017"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Roya M. Ahari","raw_affiliation_strings":["Department of Industrial Engineering, Najafabad Branch, Islamic Azad University, Najafabad, Iran"],"raw_orcid":"https://orcid.org/0000-0002-8952-8682","affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering, Najafabad Branch, Islamic Azad University, Najafabad, Iran","institution_ids":["https://openalex.org/I9256017"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034505864","display_name":"Mahdi Karbasian","orcid":"https://orcid.org/0000-0001-9132-5078"},"institutions":[{"id":"https://openalex.org/I9256017","display_name":"Islamic Azad University of Najafabad","ror":"https://ror.org/015j7c446","country_code":"IR","type":"education","lineage":["https://openalex.org/I110525433","https://openalex.org/I9256017"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Mahdi Karbasian","raw_affiliation_strings":["Department of Industrial Engineering, Najafabad Branch, Islamic Azad University, Najafabad, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering, Najafabad Branch, Islamic Azad University, Najafabad, Iran","institution_ids":["https://openalex.org/I9256017"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5043304249"],"corresponding_institution_ids":["https://openalex.org/I9256017"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.016358,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"36","issue":"1","first_page":"9","last_page":"21"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.8413901329040527},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7200876474380493},{"id":"https://openalex.org/keywords/complex-system","display_name":"Complex system","score":0.5114263892173767},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.5019652843475342},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.500744104385376},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.4812448024749756},{"id":"https://openalex.org/keywords/bridge","display_name":"Bridge (graph theory)","score":0.46899178624153137},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.43080365657806396},{"id":"https://openalex.org/keywords/simple","display_name":"Simple (philosophy)","score":0.42951303720474243},{"id":"https://openalex.org/keywords/electronic-systems","display_name":"Electronic systems","score":0.4290560185909271},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.41249942779541016},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3288562595844269},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.22828617691993713},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.1184791624546051},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.07933071255683899}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.8413901329040527},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7200876474380493},{"id":"https://openalex.org/C47822265","wikidata":"https://www.wikidata.org/wiki/Q854457","display_name":"Complex system","level":2,"score":0.5114263892173767},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.5019652843475342},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.500744104385376},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.4812448024749756},{"id":"https://openalex.org/C100776233","wikidata":"https://www.wikidata.org/wiki/Q2532492","display_name":"Bridge (graph theory)","level":2,"score":0.46899178624153137},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.43080365657806396},{"id":"https://openalex.org/C2780586882","wikidata":"https://www.wikidata.org/wiki/Q7520643","display_name":"Simple (philosophy)","level":2,"score":0.42951303720474243},{"id":"https://openalex.org/C2983266536","wikidata":"https://www.wikidata.org/wiki/Q3509543","display_name":"Electronic systems","level":2,"score":0.4290560185909271},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.41249942779541016},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3288562595844269},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.22828617691993713},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.1184791624546051},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07933071255683899},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-019-05853-5","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-019-05853-5","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.5600000023841858,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W603375353","https://openalex.org/W611669203","https://openalex.org/W1594619739","https://openalex.org/W1668227969","https://openalex.org/W1969567850","https://openalex.org/W1981071935","https://openalex.org/W1998273454","https://openalex.org/W2001807772","https://openalex.org/W2006495868","https://openalex.org/W2012508958","https://openalex.org/W2014560923","https://openalex.org/W2018877347","https://openalex.org/W2028837311","https://openalex.org/W2036949103","https://openalex.org/W2076595397","https://openalex.org/W2084198549","https://openalex.org/W2099175767","https://openalex.org/W2125697860","https://openalex.org/W2131069178","https://openalex.org/W2159755081","https://openalex.org/W2300031772","https://openalex.org/W2334028518","https://openalex.org/W2520945318","https://openalex.org/W2560582960","https://openalex.org/W2587926013","https://openalex.org/W2613857414","https://openalex.org/W2739956310","https://openalex.org/W2782329469","https://openalex.org/W4230536953","https://openalex.org/W4237165034"],"related_works":["https://openalex.org/W1501776718","https://openalex.org/W2615136228","https://openalex.org/W657108774","https://openalex.org/W2390192952","https://openalex.org/W2373296418","https://openalex.org/W3213254966","https://openalex.org/W2377265617","https://openalex.org/W2156207377","https://openalex.org/W2094725091","https://openalex.org/W1515761309"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}