{"id":"https://openalex.org/W2984203517","doi":"https://doi.org/10.1007/s10836-019-05824-w","title":"Identification of Random/Clustered TSV Defects in 3D IC During Pre-Bond Testing","display_name":"Identification of Random/Clustered TSV Defects in 3D IC During Pre-Bond Testing","publication_year":2019,"publication_date":"2019-10-01","ids":{"openalex":"https://openalex.org/W2984203517","doi":"https://doi.org/10.1007/s10836-019-05824-w","mag":"2984203517"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-019-05824-w","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-019-05824-w","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101885382","display_name":"Dilip Kumar Maity","orcid":null},"institutions":[{"id":"https://openalex.org/I4210145126","display_name":"Aditya Birla (India)","ror":"https://ror.org/03pztks36","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210145126"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Dilip Kumar Maity","raw_affiliation_strings":["Department of Computer Science and Engineering, Academy of Technology, Adisaptagram, Hooghly, India"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, Academy of Technology, Adisaptagram, Hooghly, India","institution_ids":["https://openalex.org/I4210145126"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102740051","display_name":"Surajit Kumar Roy","orcid":"https://orcid.org/0000-0003-3458-6874"},"institutions":[{"id":"https://openalex.org/I98365261","display_name":"Indian Institute of Engineering Science and Technology, Shibpur","ror":"https://ror.org/02ytfzr55","country_code":"IN","type":"education","lineage":["https://openalex.org/I98365261"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Surajit Kumar Roy","raw_affiliation_strings":["Department of Information Technology, Indian Institute of Engineering Science and Technology, Shibpur, India"],"affiliations":[{"raw_affiliation_string":"Department of Information Technology, Indian Institute of Engineering Science and Technology, Shibpur, India","institution_ids":["https://openalex.org/I98365261"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033232210","display_name":"Chandan Giri","orcid":"https://orcid.org/0000-0003-3687-6242"},"institutions":[{"id":"https://openalex.org/I98365261","display_name":"Indian Institute of Engineering Science and Technology, Shibpur","ror":"https://ror.org/02ytfzr55","country_code":"IN","type":"education","lineage":["https://openalex.org/I98365261"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Chandan Giri","raw_affiliation_strings":["Department of Information Technology, Indian Institute of Engineering Science and Technology, Shibpur, India"],"affiliations":[{"raw_affiliation_string":"Department of Information Technology, Indian Institute of Engineering Science and Technology, Shibpur, India","institution_ids":["https://openalex.org/I98365261"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5101885382"],"corresponding_institution_ids":["https://openalex.org/I4210145126"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.3619,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.62237448,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"35","issue":"5","first_page":"741","last_page":"759"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.6614392995834351},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4075726270675659},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.35406023263931274},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.35070258378982544},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30152255296707153},{"id":"https://openalex.org/keywords/biology","display_name":"Biology","score":0.05228725075721741}],"concepts":[{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.6614392995834351},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4075726270675659},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.35406023263931274},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.35070258378982544},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30152255296707153},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.05228725075721741},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-019-05824-w","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-019-05824-w","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W89600824","https://openalex.org/W233104390","https://openalex.org/W1522190160","https://openalex.org/W1963973577","https://openalex.org/W1965451131","https://openalex.org/W1967186250","https://openalex.org/W1973239387","https://openalex.org/W1985664729","https://openalex.org/W1986486942","https://openalex.org/W1992796329","https://openalex.org/W1998234398","https://openalex.org/W2013679798","https://openalex.org/W2017359391","https://openalex.org/W2023264348","https://openalex.org/W2029390138","https://openalex.org/W2046045084","https://openalex.org/W2052347136","https://openalex.org/W2056176281","https://openalex.org/W2066194009","https://openalex.org/W2068545846","https://openalex.org/W2070914725","https://openalex.org/W2082046960","https://openalex.org/W2087916367","https://openalex.org/W2095790208","https://openalex.org/W2097634964","https://openalex.org/W2102230032","https://openalex.org/W2102304175","https://openalex.org/W2138951112","https://openalex.org/W2143502515","https://openalex.org/W2150113875","https://openalex.org/W2151755625","https://openalex.org/W2158323053","https://openalex.org/W2159112907","https://openalex.org/W2161555133","https://openalex.org/W2168584827","https://openalex.org/W2539623632","https://openalex.org/W4231431893","https://openalex.org/W4255435342"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W4246450666","https://openalex.org/W4388998267","https://openalex.org/W2898370298","https://openalex.org/W2137437058","https://openalex.org/W4390401159","https://openalex.org/W2744391499","https://openalex.org/W3120461830","https://openalex.org/W2351837897","https://openalex.org/W2384416889"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1}],"updated_date":"2026-03-28T08:17:26.163206","created_date":"2025-10-10T00:00:00"}