{"id":"https://openalex.org/W2952110932","doi":"https://doi.org/10.1007/s10836-019-05809-9","title":"Electromagnetic Parameters Measurement of Sheet Using Separate Microstrip Line","display_name":"Electromagnetic Parameters Measurement of Sheet Using Separate Microstrip Line","publication_year":2019,"publication_date":"2019-06-15","ids":{"openalex":"https://openalex.org/W2952110932","doi":"https://doi.org/10.1007/s10836-019-05809-9","mag":"2952110932"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-019-05809-9","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-019-05809-9","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100457274","display_name":"Yunpeng Zhang","orcid":"https://orcid.org/0000-0002-1451-776X"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yunpeng Zhang","raw_affiliation_strings":["School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China"],"raw_orcid":"https://orcid.org/0000-0002-1451-776X","affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100738932","display_name":"En Li","orcid":"https://orcid.org/0000-0003-0463-9293"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"En Li","raw_affiliation_strings":["School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101802064","display_name":"Hu Zheng","orcid":"https://orcid.org/0000-0001-6055-7239"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hu Zheng","raw_affiliation_strings":["School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5100457274"],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.04638343,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"35","issue":"4","first_page":"567","last_page":"572"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microstrip","display_name":"Microstrip","score":0.7288936376571655},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.5902109742164612},{"id":"https://openalex.org/keywords/fixture","display_name":"Fixture","score":0.5850182771682739},{"id":"https://openalex.org/keywords/transmission-line","display_name":"Transmission line","score":0.5420369505882263},{"id":"https://openalex.org/keywords/ground-plane","display_name":"Ground plane","score":0.5375769734382629},{"id":"https://openalex.org/keywords/conductor","display_name":"Conductor","score":0.518872082233429},{"id":"https://openalex.org/keywords/reflection","display_name":"Reflection (computer programming)","score":0.4842085838317871},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.46351301670074463},{"id":"https://openalex.org/keywords/conformal-map","display_name":"Conformal map","score":0.4451114237308502},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.431199848651886},{"id":"https://openalex.org/keywords/reflectometry","display_name":"Reflectometry","score":0.4301843047142029},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4280265271663666},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3939884901046753},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.365475058555603},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.28127604722976685},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.27256959676742554},{"id":"https://openalex.org/keywords/time-domain","display_name":"Time domain","score":0.2128070890903473},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2094096839427948},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2034338414669037},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.14544978737831116},{"id":"https://openalex.org/keywords/antenna","display_name":"Antenna (radio)","score":0.1387147605419159},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.13043782114982605},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10646337270736694}],"concepts":[{"id":"https://openalex.org/C123657345","wikidata":"https://www.wikidata.org/wiki/Q639055","display_name":"Microstrip","level":2,"score":0.7288936376571655},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.5902109742164612},{"id":"https://openalex.org/C2781122048","wikidata":"https://www.wikidata.org/wiki/Q15983064","display_name":"Fixture","level":2,"score":0.5850182771682739},{"id":"https://openalex.org/C33441834","wikidata":"https://www.wikidata.org/wiki/Q693004","display_name":"Transmission line","level":2,"score":0.5420369505882263},{"id":"https://openalex.org/C88764893","wikidata":"https://www.wikidata.org/wiki/Q1547722","display_name":"Ground plane","level":3,"score":0.5375769734382629},{"id":"https://openalex.org/C34800285","wikidata":"https://www.wikidata.org/wiki/Q5159395","display_name":"Conductor","level":2,"score":0.518872082233429},{"id":"https://openalex.org/C65682993","wikidata":"https://www.wikidata.org/wiki/Q1056451","display_name":"Reflection (computer programming)","level":2,"score":0.4842085838317871},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.46351301670074463},{"id":"https://openalex.org/C98214594","wikidata":"https://www.wikidata.org/wiki/Q850275","display_name":"Conformal map","level":2,"score":0.4451114237308502},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.431199848651886},{"id":"https://openalex.org/C2778925768","wikidata":"https://www.wikidata.org/wiki/Q3454718","display_name":"Reflectometry","level":3,"score":0.4301843047142029},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4280265271663666},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3939884901046753},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.365475058555603},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.28127604722976685},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.27256959676742554},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.2128070890903473},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2094096839427948},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2034338414669037},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.14544978737831116},{"id":"https://openalex.org/C21822782","wikidata":"https://www.wikidata.org/wiki/Q131214","display_name":"Antenna (radio)","level":2,"score":0.1387147605419159},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.13043782114982605},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10646337270736694},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-019-05809-9","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-019-05809-9","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G8028533948","display_name":"\u5206\u5c42\u70ed\u900f\u6ce2\u6750\u6599\u7535\u78c1\u53c2\u6570\u68c0\u6d4b\u65b9\u6cd5\u7814\u7a76","funder_award_id":"61671123","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1995001925","https://openalex.org/W2014093670","https://openalex.org/W2017655177","https://openalex.org/W2039813696","https://openalex.org/W2057878056","https://openalex.org/W2073182742","https://openalex.org/W2075869845","https://openalex.org/W2086936038","https://openalex.org/W2096522024","https://openalex.org/W2111054243","https://openalex.org/W2141103017","https://openalex.org/W2334216571","https://openalex.org/W2540541899","https://openalex.org/W4246631744","https://openalex.org/W4247381894"],"related_works":["https://openalex.org/W2076018311","https://openalex.org/W4385900761","https://openalex.org/W2380777809","https://openalex.org/W2140036717","https://openalex.org/W2091193607","https://openalex.org/W4210432190","https://openalex.org/W4385561830","https://openalex.org/W390748187","https://openalex.org/W2007332363","https://openalex.org/W2056351415"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":2}],"updated_date":"2026-06-06T09:05:17.133730","created_date":"2025-10-10T00:00:00"}