{"id":"https://openalex.org/W2947565990","doi":"https://doi.org/10.1007/s10836-019-05806-y","title":"Assessing the Reliability of Successive Approximate Computing Algorithms under Fault Injection","display_name":"Assessing the Reliability of Successive Approximate Computing Algorithms under Fault Injection","publication_year":2019,"publication_date":"2019-05-30","ids":{"openalex":"https://openalex.org/W2947565990","doi":"https://doi.org/10.1007/s10836-019-05806-y","mag":"2947565990"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-019-05806-y","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-019-05806-y","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046518002","display_name":"Gennaro S. Rodrigues","orcid":"https://orcid.org/0000-0003-0461-4563"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Gennaro S. Rodrigues","raw_affiliation_strings":["Porto Alegre, Brazil","UFRGS - Universidade Federal do Rio Grande do Sul [Porto Alegre] (Av. Paulo Gama, 110 - Bairro Farroupilha - Porto Alegre - Rio Grande do Sul - Brazil)"],"raw_orcid":"https://orcid.org/0000-0003-0461-4563","affiliations":[{"raw_affiliation_string":"Porto Alegre, Brazil","institution_ids":[]},{"raw_affiliation_string":"UFRGS - Universidade Federal do Rio Grande do Sul [Porto Alegre] (Av. Paulo Gama, 110 - Bairro Farroupilha - Porto Alegre - Rio Grande do Sul - Brazil)","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031924695","display_name":"\u00c1dria Barros de Oliveira","orcid":"https://orcid.org/0000-0003-0368-7920"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"\u00c1dria Barros de Oliveira","raw_affiliation_strings":["UFRGS - Universidade Federal do Rio Grande do Sul [Porto Alegre] (Av. Paulo Gama, 110 - Bairro Farroupilha - Porto Alegre - Rio Grande do Sul - Brazil)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"UFRGS - Universidade Federal do Rio Grande do Sul [Porto Alegre] (Av. Paulo Gama, 110 - Bairro Farroupilha - Porto Alegre - Rio Grande do Sul - Brazil)","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024813896","display_name":"Fernanda Lima Kastensmidt","orcid":"https://orcid.org/0000-0001-5767-8582"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Fernanda Lima Kastensmidt","raw_affiliation_strings":["Porto Alegre, Brazil","PGMICRO - PgMicro - Instituto de Inform\u00e1tica [UFRGS] (Av. Bento Gon\u00e7alves, 9500 - Campus do Vale - Porto Alegre - RS - CP 15064 - CEP 91501-970 - Brazil)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Porto Alegre, Brazil","institution_ids":[]},{"raw_affiliation_string":"PGMICRO - PgMicro - Instituto de Inform\u00e1tica [UFRGS] (Av. Bento Gon\u00e7alves, 9500 - Campus do Vale - Porto Alegre - RS - CP 15064 - CEP 91501-970 - Brazil)","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017023749","display_name":"V. Pouget","orcid":"https://orcid.org/0000-0001-6126-6708"},"institutions":[{"id":"https://openalex.org/I4210134800","display_name":"Institut d'\u00c9lectronique et des Syst\u00e8mes","ror":"https://ror.org/0431hh004","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210095849","https://openalex.org/I4210134800"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Vincent Pouget","raw_affiliation_strings":["Montpellier, France","IES - Institut d\u2019Electronique et des Syst\u00e8mes (860, rue Saint Priest, B\u00e2timent 5 - CC 05001 -34095 Montpellier Cedex 5 - France)","RADIAC - Radiations et composants (France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Montpellier, France","institution_ids":[]},{"raw_affiliation_string":"IES - Institut d\u2019Electronique et des Syst\u00e8mes (860, rue Saint Priest, B\u00e2timent 5 - CC 05001 -34095 Montpellier Cedex 5 - France)","institution_ids":["https://openalex.org/I4210134800"]},{"raw_affiliation_string":"RADIAC - Radiations et composants (France)","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074986688","display_name":"Alberto Bosio","orcid":"https://orcid.org/0000-0001-6116-7339"},"institutions":[{"id":"https://openalex.org/I112936343","display_name":"\u00c9cole Centrale de Lyon","ror":"https://ror.org/05s6rge65","country_code":"FR","type":"education","lineage":["https://openalex.org/I112936343","https://openalex.org/I203339264"]},{"id":"https://openalex.org/I2800958632","display_name":"Institut des Nanotechnologies de Lyon","ror":"https://ror.org/04jsk0b74","country_code":"FR","type":"facility","lineage":["https://openalex.org/I100532134","https://openalex.org/I100532134","https://openalex.org/I112936343","https://openalex.org/I112936343","https://openalex.org/I113428412","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I2800958632","https://openalex.org/I4405259976","https://openalex.org/I4405263940","https://openalex.org/I48430043","https://openalex.org/I48430043","https://openalex.org/I59692284"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Alberto Bosio","raw_affiliation_strings":["Lyon, France","ECL - \u00c9cole Centrale de Lyon (36 avenue Guy de Collongue - 69134 Ecully cedex - France)","INL - CSH - INL - Conception de Syst\u00e8mes H\u00e9t\u00e9rog\u00e8nes (France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Lyon, France","institution_ids":[]},{"raw_affiliation_string":"ECL - \u00c9cole Centrale de Lyon (36 avenue Guy de Collongue - 69134 Ecully cedex - France)","institution_ids":["https://openalex.org/I112936343"]},{"raw_affiliation_string":"INL - CSH - INL - Conception de Syst\u00e8mes H\u00e9t\u00e9rog\u00e8nes (France)","institution_ids":["https://openalex.org/I2800958632"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":0.5487,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.63620675,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"35","issue":"3","first_page":"367","last_page":"381"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.7910027503967285},{"id":"https://openalex.org/keywords/dependability","display_name":"Dependability","score":0.7290841341018677},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6956183910369873},{"id":"https://openalex.org/keywords/cache","display_name":"Cache","score":0.6524743437767029},{"id":"https://openalex.org/keywords/emulation","display_name":"Emulation","score":0.5752634406089783},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5678743720054626},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.5489521622657776},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.499680757522583},{"id":"https://openalex.org/keywords/register-file","display_name":"Register file","score":0.4893152415752411},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4641384482383728},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4564526081085205},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.45425134897232056},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.43134909868240356},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.3340565264225006},{"id":"https://openalex.org/keywords/instruction-set","display_name":"Instruction set","score":0.23760998249053955},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.21968749165534973},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10873037576675415}],"concepts":[{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.7910027503967285},{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.7290841341018677},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6956183910369873},{"id":"https://openalex.org/C115537543","wikidata":"https://www.wikidata.org/wiki/Q165596","display_name":"Cache","level":2,"score":0.6524743437767029},{"id":"https://openalex.org/C149810388","wikidata":"https://www.wikidata.org/wiki/Q5374873","display_name":"Emulation","level":2,"score":0.5752634406089783},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5678743720054626},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.5489521622657776},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.499680757522583},{"id":"https://openalex.org/C117280010","wikidata":"https://www.wikidata.org/wiki/Q180944","display_name":"Register file","level":3,"score":0.4893152415752411},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4641384482383728},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4564526081085205},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.45425134897232056},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.43134909868240356},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.3340565264225006},{"id":"https://openalex.org/C202491316","wikidata":"https://www.wikidata.org/wiki/Q272683","display_name":"Instruction set","level":2,"score":0.23760998249053955},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.21968749165534973},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10873037576675415},{"id":"https://openalex.org/C50522688","wikidata":"https://www.wikidata.org/wiki/Q189833","display_name":"Economic growth","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10836-019-05806-y","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-019-05806-y","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-02145492v1","is_oa":false,"landing_page_url":"https://hal.science/hal-02145492","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Electronic Testing: : Theory and Applications, 2019, ⟨10.1007/s10836-019-05806-y⟩","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions","score":0.8199999928474426}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1526163424","https://openalex.org/W2020217519","https://openalex.org/W2030922317","https://openalex.org/W2030986741","https://openalex.org/W2036816792","https://openalex.org/W2093743593","https://openalex.org/W2099569658","https://openalex.org/W2157565504","https://openalex.org/W2167123894","https://openalex.org/W2244005500","https://openalex.org/W2600895721","https://openalex.org/W2608371015","https://openalex.org/W2735635254","https://openalex.org/W2798674222","https://openalex.org/W2807505184","https://openalex.org/W2921844620","https://openalex.org/W3149134903","https://openalex.org/W3149410719","https://openalex.org/W4255320886"],"related_works":["https://openalex.org/W3018727313","https://openalex.org/W2373958571","https://openalex.org/W1526253314","https://openalex.org/W2145233434","https://openalex.org/W1864358311","https://openalex.org/W2163463765","https://openalex.org/W4246700523","https://openalex.org/W2007562802","https://openalex.org/W1994651680","https://openalex.org/W2291587020"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}