{"id":"https://openalex.org/W2947165300","doi":"https://doi.org/10.1007/s10836-019-05796-x","title":"Modeling Soft Error Propagation in Near-Threshold Combinational Circuits Using Neural Networks","display_name":"Modeling Soft Error Propagation in Near-Threshold Combinational Circuits Using Neural Networks","publication_year":2019,"publication_date":"2019-05-29","ids":{"openalex":"https://openalex.org/W2947165300","doi":"https://doi.org/10.1007/s10836-019-05796-x","mag":"2947165300"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-019-05796-x","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-019-05796-x","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103121450","display_name":"Ali Hajian","orcid":"https://orcid.org/0000-0003-3511-4246"},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Ali Hajian","raw_affiliation_strings":["School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Tehran, 14395-515, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Tehran, 14395-515, Iran","institution_ids":["https://openalex.org/I23946033"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5071789164","display_name":"Saeed Safari","orcid":"https://orcid.org/0000-0001-6940-591X"},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"Saeed Safari","raw_affiliation_strings":["School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Tehran, 14395-515, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Tehran, 14395-515, Iran","institution_ids":["https://openalex.org/I23946033"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5071789164"],"corresponding_institution_ids":["https://openalex.org/I23946033"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":0.0914,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.42309121,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"35","issue":"3","first_page":"401","last_page":"412"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.895704448223114},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7330644130706787},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6447606682777405},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.6268815994262695},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.602556586265564},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5693193674087524},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.5649019479751587},{"id":"https://openalex.org/keywords/propagation-delay","display_name":"Propagation delay","score":0.5112118721008301},{"id":"https://openalex.org/keywords/word-error-rate","display_name":"Word error rate","score":0.4899691641330719},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.45849764347076416},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.456329345703125},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4536343514919281},{"id":"https://openalex.org/keywords/propagation-of-uncertainty","display_name":"Propagation of uncertainty","score":0.4534289538860321},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.437996506690979},{"id":"https://openalex.org/keywords/multilayer-perceptron","display_name":"Multilayer perceptron","score":0.4260893166065216},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.4187092185020447},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.41486412286758423},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.41072165966033936},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3803154230117798},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23064973950386047},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.20302817225456238},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19374316930770874},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.17476031184196472},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.16919007897377014}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.895704448223114},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7330644130706787},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6447606682777405},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.6268815994262695},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.602556586265564},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5693193674087524},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.5649019479751587},{"id":"https://openalex.org/C90806461","wikidata":"https://www.wikidata.org/wiki/Q1144416","display_name":"Propagation delay","level":2,"score":0.5112118721008301},{"id":"https://openalex.org/C40969351","wikidata":"https://www.wikidata.org/wiki/Q3516228","display_name":"Word error rate","level":2,"score":0.4899691641330719},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.45849764347076416},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.456329345703125},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4536343514919281},{"id":"https://openalex.org/C123614077","wikidata":"https://www.wikidata.org/wiki/Q1364905","display_name":"Propagation of uncertainty","level":2,"score":0.4534289538860321},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.437996506690979},{"id":"https://openalex.org/C179717631","wikidata":"https://www.wikidata.org/wiki/Q2991667","display_name":"Multilayer perceptron","level":3,"score":0.4260893166065216},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.4187092185020447},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.41486412286758423},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.41072165966033936},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3803154230117798},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23064973950386047},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.20302817225456238},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19374316930770874},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.17476031184196472},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.16919007897377014},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-019-05796-x","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-019-05796-x","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W360515900","https://openalex.org/W1547528813","https://openalex.org/W1554663460","https://openalex.org/W1825077972","https://openalex.org/W1856375578","https://openalex.org/W1936283550","https://openalex.org/W1993206924","https://openalex.org/W1998525920","https://openalex.org/W2004664505","https://openalex.org/W2010966375","https://openalex.org/W2030930204","https://openalex.org/W2061964009","https://openalex.org/W2066664769","https://openalex.org/W2070488840","https://openalex.org/W2078820065","https://openalex.org/W2098864349","https://openalex.org/W2115516668","https://openalex.org/W2127894564","https://openalex.org/W2132676960","https://openalex.org/W2146463513","https://openalex.org/W2149041233","https://openalex.org/W2155979591","https://openalex.org/W2160219580","https://openalex.org/W2162318113","https://openalex.org/W2169213530","https://openalex.org/W2402144811","https://openalex.org/W2406444183","https://openalex.org/W2538842228","https://openalex.org/W2579283874","https://openalex.org/W4205686602","https://openalex.org/W4240313570","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W2531550288","https://openalex.org/W2149041233","https://openalex.org/W2171347834","https://openalex.org/W2066042903","https://openalex.org/W2908608091","https://openalex.org/W3040935927","https://openalex.org/W1993206924","https://openalex.org/W2036412341","https://openalex.org/W2154207847","https://openalex.org/W2168546702"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}