{"id":"https://openalex.org/W2795241570","doi":"https://doi.org/10.1007/s10836-018-5721-1","title":"Digitally-Controlled Compensation Current Injection to ATE Power Supply for Emulation of Customer Environment","display_name":"Digitally-Controlled Compensation Current Injection to ATE Power Supply for Emulation of Customer Environment","publication_year":2018,"publication_date":"2018-03-28","ids":{"openalex":"https://openalex.org/W2795241570","doi":"https://doi.org/10.1007/s10836-018-5721-1","mag":"2795241570"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-018-5721-1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-018-5721-1","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054222018","display_name":"Naoki Terao","orcid":"https://orcid.org/0000-0001-7793-0423"},"institutions":[{"id":"https://openalex.org/I153327471","display_name":"Bunkyo University","ror":"https://ror.org/053h75930","country_code":"JP","type":"education","lineage":["https://openalex.org/I153327471"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Naoki Terao","raw_affiliation_strings":["The University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo, 113-0032, Japan","The University of Tokyo, Bunkyo-ku, Japan"],"raw_orcid":"https://orcid.org/0000-0001-7793-0423","affiliations":[{"raw_affiliation_string":"The University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo, 113-0032, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"The University of Tokyo, Bunkyo-ku, Japan","institution_ids":["https://openalex.org/I153327471","https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071803491","display_name":"Toru Nakura","orcid":"https://orcid.org/0000-0001-5945-3918"},"institutions":[{"id":"https://openalex.org/I153327471","display_name":"Bunkyo University","ror":"https://ror.org/053h75930","country_code":"JP","type":"education","lineage":["https://openalex.org/I153327471"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toru Nakura","raw_affiliation_strings":["The University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo, 113-0032, Japan","The University of Tokyo, Bunkyo-ku, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo, 113-0032, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"The University of Tokyo, Bunkyo-ku, Japan","institution_ids":["https://openalex.org/I153327471","https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109203606","display_name":"Masahiro Ishida","orcid":"https://orcid.org/0009-0000-7712-4966"},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masahiro Ishida","raw_affiliation_strings":["Advantest Corporation, 336-1, Ohwa, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan","Advantest Corporation, Meiwa-machi, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advantest Corporation, 336-1, Ohwa, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan","institution_ids":["https://openalex.org/I4210103901"]},{"raw_affiliation_string":"Advantest Corporation, Meiwa-machi, Japan","institution_ids":["https://openalex.org/I4210103901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020278873","display_name":"Rimon Ikeno","orcid":"https://orcid.org/0000-0003-0527-4601"},"institutions":[{"id":"https://openalex.org/I153327471","display_name":"Bunkyo University","ror":"https://ror.org/053h75930","country_code":"JP","type":"education","lineage":["https://openalex.org/I153327471"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Rimon Ikeno","raw_affiliation_strings":["The University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo, 113-0032, Japan","The University of Tokyo, Bunkyo-ku, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo, 113-0032, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"The University of Tokyo, Bunkyo-ku, Japan","institution_ids":["https://openalex.org/I153327471","https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012141183","display_name":"Takashi Kusaka","orcid":"https://orcid.org/0000-0002-2963-3245"},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takashi Kusaka","raw_affiliation_strings":["Advantest Corporation, 336-1, Ohwa, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan","Advantest Corporation, Meiwa-machi, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advantest Corporation, 336-1, Ohwa, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan","institution_ids":["https://openalex.org/I4210103901"]},{"raw_affiliation_string":"Advantest Corporation, Meiwa-machi, Japan","institution_ids":["https://openalex.org/I4210103901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007028121","display_name":"Tetsuya Iizuka","orcid":"https://orcid.org/0000-0002-1512-4714"},"institutions":[{"id":"https://openalex.org/I153327471","display_name":"Bunkyo University","ror":"https://ror.org/053h75930","country_code":"JP","type":"education","lineage":["https://openalex.org/I153327471"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tetsuya Iizuka","raw_affiliation_strings":["The University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo, 113-0032, Japan","The University of Tokyo, Bunkyo-ku, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo, 113-0032, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"The University of Tokyo, Bunkyo-ku, Japan","institution_ids":["https://openalex.org/I153327471","https://openalex.org/I74801974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028680447","display_name":"Kunihiro Asada","orcid":"https://orcid.org/0000-0002-1150-0241"},"institutions":[{"id":"https://openalex.org/I153327471","display_name":"Bunkyo University","ror":"https://ror.org/053h75930","country_code":"JP","type":"education","lineage":["https://openalex.org/I153327471"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kunihiro Asada","raw_affiliation_strings":["The University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo, 113-0032, Japan","The University of Tokyo, Bunkyo-ku, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo, 113-0032, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"The University of Tokyo, Bunkyo-ku, Japan","institution_ids":["https://openalex.org/I153327471","https://openalex.org/I74801974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5054222018"],"corresponding_institution_ids":["https://openalex.org/I153327471","https://openalex.org/I74801974"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.03045006,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"34","issue":"2","first_page":"147","last_page":"161"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.6097651720046997},{"id":"https://openalex.org/keywords/emulation","display_name":"Emulation","score":0.6073029637336731},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.574152946472168},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.5417609214782715},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.527809739112854},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5127004384994507},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4812033474445343},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.47117239236831665},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4533492922782898}],"concepts":[{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.6097651720046997},{"id":"https://openalex.org/C149810388","wikidata":"https://www.wikidata.org/wiki/Q5374873","display_name":"Emulation","level":2,"score":0.6073029637336731},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.574152946472168},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.5417609214782715},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.527809739112854},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5127004384994507},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4812033474445343},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.47117239236831665},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4533492922782898},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C50522688","wikidata":"https://www.wikidata.org/wiki/Q189833","display_name":"Economic growth","level":1,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-018-5721-1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-018-5721-1","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7599999904632568}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1505628012","https://openalex.org/W1921561960","https://openalex.org/W1975483134","https://openalex.org/W2002510178","https://openalex.org/W2017903695","https://openalex.org/W2033090586","https://openalex.org/W2071783517","https://openalex.org/W2108472236","https://openalex.org/W2142212721","https://openalex.org/W2162547872","https://openalex.org/W2570030547","https://openalex.org/W3151751772"],"related_works":["https://openalex.org/W2154523322","https://openalex.org/W2083200807","https://openalex.org/W2364195017","https://openalex.org/W2355430452","https://openalex.org/W3111172706","https://openalex.org/W2652100805","https://openalex.org/W4313678637","https://openalex.org/W2954046924","https://openalex.org/W2115378283","https://openalex.org/W3131410704"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}