{"id":"https://openalex.org/W2782269201","doi":"https://doi.org/10.1007/s10836-017-5700-y","title":"A Distortion Shaping Technique to Equalize Intermodulation Distortion Performance of Interpolating Arbitrary Waveform Generators in Automated Test Equipment","display_name":"A Distortion Shaping Technique to Equalize Intermodulation Distortion Performance of Interpolating Arbitrary Waveform Generators in Automated Test Equipment","publication_year":2018,"publication_date":"2018-01-04","ids":{"openalex":"https://openalex.org/W2782269201","doi":"https://doi.org/10.1007/s10836-017-5700-y","mag":"2782269201"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-017-5700-y","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-017-5700-y","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006256979","display_name":"Peter Sarson","orcid":"https://orcid.org/0000-0002-7150-2281"},"institutions":[{"id":"https://openalex.org/I154481106","display_name":"AMS (Austria)","ror":"https://ror.org/03vz6gs79","country_code":"AT","type":"company","lineage":["https://openalex.org/I154481106"]}],"countries":["AT"],"is_corresponding":true,"raw_author_name":"Peter Sarson","raw_affiliation_strings":["Full Service Foundry, ams AG, Tobelbader Strasse, Premstaetten, 8141, Styria, Austria"],"affiliations":[{"raw_affiliation_string":"Full Service Foundry, ams AG, Tobelbader Strasse, Premstaetten, 8141, Styria, Austria","institution_ids":["https://openalex.org/I154481106"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067143434","display_name":"Tomonori Yanagida","orcid":"https://orcid.org/0000-0002-1939-0809"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tomonori Yanagida","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, 376-8515, Japan"],"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, 376-8515, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042902280","display_name":"Shohei Shibuya","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shohei Shibuya","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, 376-8515, Japan"],"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, 376-8515, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013331507","display_name":"Kosuke Machida","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kosuke Machida","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, 376-8515, Japan"],"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, 376-8515, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101691738","display_name":"Haruo Kobayashi","orcid":"https://orcid.org/0000-0002-0990-5522"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Haruo Kobayashi","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, 376-8515, Japan"],"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, 376-8515, Japan","institution_ids":["https://openalex.org/I165735259"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5006256979"],"corresponding_institution_ids":["https://openalex.org/I154481106"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.391,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.61357701,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"34","issue":"3","first_page":"215","last_page":"232"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12371","display_name":"Electrical Contact Performance and Analysis","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/intermodulation","display_name":"Intermodulation","score":0.9356836080551147},{"id":"https://openalex.org/keywords/arbitrary-waveform-generator","display_name":"Arbitrary waveform generator","score":0.7366510033607483},{"id":"https://openalex.org/keywords/distortion","display_name":"Distortion (music)","score":0.6468539834022522},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.6210600137710571},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5911920666694641},{"id":"https://openalex.org/keywords/phase-distortion","display_name":"Phase distortion","score":0.5896185040473938},{"id":"https://openalex.org/keywords/total-harmonic-distortion","display_name":"Total harmonic distortion","score":0.5817241072654724},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.5767121315002441},{"id":"https://openalex.org/keywords/signal-generator","display_name":"Signal generator","score":0.5039812922477722},{"id":"https://openalex.org/keywords/base","display_name":"Base (topology)","score":0.5001139640808105},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.4800509214401245},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.44964492321014404},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4459347724914551},{"id":"https://openalex.org/keywords/realization","display_name":"Realization (probability)","score":0.4252546429634094},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.36537885665893555},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3625100255012512},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.15790051221847534},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.15288445353507996},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.14378872513771057},{"id":"https://openalex.org/keywords/transmission","display_name":"Transmission (telecommunications)","score":0.109731525182724},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.08118674159049988}],"concepts":[{"id":"https://openalex.org/C11773624","wikidata":"https://www.wikidata.org/wiki/Q2142232","display_name":"Intermodulation","level":4,"score":0.9356836080551147},{"id":"https://openalex.org/C108307224","wikidata":"https://www.wikidata.org/wiki/Q629983","display_name":"Arbitrary waveform generator","level":4,"score":0.7366510033607483},{"id":"https://openalex.org/C126780896","wikidata":"https://www.wikidata.org/wiki/Q899871","display_name":"Distortion (music)","level":4,"score":0.6468539834022522},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.6210600137710571},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5911920666694641},{"id":"https://openalex.org/C57747864","wikidata":"https://www.wikidata.org/wiki/Q7180948","display_name":"Phase distortion","level":3,"score":0.5896185040473938},{"id":"https://openalex.org/C42156128","wikidata":"https://www.wikidata.org/wiki/Q162641","display_name":"Total harmonic distortion","level":3,"score":0.5817241072654724},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.5767121315002441},{"id":"https://openalex.org/C207912722","wikidata":"https://www.wikidata.org/wiki/Q1259123","display_name":"Signal generator","level":3,"score":0.5039812922477722},{"id":"https://openalex.org/C42058472","wikidata":"https://www.wikidata.org/wiki/Q810214","display_name":"Base (topology)","level":2,"score":0.5001139640808105},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.4800509214401245},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.44964492321014404},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4459347724914551},{"id":"https://openalex.org/C2781089630","wikidata":"https://www.wikidata.org/wiki/Q21856745","display_name":"Realization (probability)","level":2,"score":0.4252546429634094},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.36537885665893555},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3625100255012512},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.15790051221847534},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.15288445353507996},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14378872513771057},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.109731525182724},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.08118674159049988},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-017-5700-y","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-017-5700-y","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W627390818","https://openalex.org/W1976279711","https://openalex.org/W2053903311","https://openalex.org/W2054118610","https://openalex.org/W2058113638","https://openalex.org/W2058678348","https://openalex.org/W2063678701","https://openalex.org/W2069168463","https://openalex.org/W2074971209","https://openalex.org/W2084668538","https://openalex.org/W2092979714","https://openalex.org/W2147084331","https://openalex.org/W2163723482","https://openalex.org/W2476223481","https://openalex.org/W2497225490","https://openalex.org/W2505835687","https://openalex.org/W2565261459","https://openalex.org/W2596966761","https://openalex.org/W2614691986"],"related_works":["https://openalex.org/W3128433826","https://openalex.org/W2359707571","https://openalex.org/W2096093687","https://openalex.org/W2366450121","https://openalex.org/W2391329216","https://openalex.org/W1894122878","https://openalex.org/W1976279711","https://openalex.org/W2497225490","https://openalex.org/W2782269201","https://openalex.org/W570352894"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}